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Extract from the Register of European Patents

EP About this file: EP4027373

EP4027373 - SOURCE/DRAIN ELECTRODE FOR ORGANIC SEMICONDUCTOR DEVICE, ORGANIC SEMICONDUCTOR DEVICE USING SAME, AND PRODUCTION METHOD FOR SOURCE/DRAIN ELECTRODE AND SEMICONDUCTOR DEVICE [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  10.06.2022
Database last updated on 24.08.2024
FormerThe international publication has been made
Status updated on  12.03.2021
Most recent event   Tooltip02.04.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
The University of Tokyo
3-1 Hongo 7-chome
Bunkyo-ku
Tokyo 113-8654 / JP
[2022/28]
Inventor(s)01 / TAKEYA, Junichi
c/o The University of Tokyo, 3-1, Hongo 7-chome
Bunkyo-ku
Tokyo 113-8654 / JP
02 / WATANABE, Shunichiro
c/o The University of Tokyo, 3-1, Hongo 7-chome
Bunkyo-ku
Tokyo 113-8654 / JP
03 / MAKITA, Tatsuyuki
c/o The University of Tokyo, 3-1, Hongo 7-chome
Bunkyo-ku
Tokyo 113-8654 / JP
 [2022/28]
Representative(s)Mewburn Ellis LLP
Aurora Building
Counterslip
Bristol BS1 6BX / GB
[2022/28]
Application number, filing date20861639.118.06.2020
[2022/28]
WO2020JP23900
Priority number, dateJP2019016073203.09.2019         Original published format: JP 2019160732
[2022/28]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021044705
Date:11.03.2021
Language:JA
[2021/10]
Type: A1 Application with search report 
No.:EP4027373
Date:13.07.2022
Language:EN
[2022/28]
Search report(s)International search report - published on:JP11.03.2021
(Supplementary) European search report - dispatched on:EP31.08.2023
ClassificationIPC:H01L21/28, H10K71/60, H10K71/80, H10K19/10, H10K10/46, // H10K85/60
[2023/40]
CPC:
H10K19/10 (EP); H10K10/82 (EP,CN,KR); H10K10/466 (CN,US);
H10K10/84 (CN,US); H10K10/471 (US); H10K10/476 (CN);
H10K10/88 (EP,US); H10K71/60 (EP,KR,US); H10K71/611 (US);
H10K71/80 (EP,US); H10K85/141 (US); H10K85/6576 (EP,US);
H10K10/464 (US); H10K10/474 (EP) (-)
Former IPC [2022/28]H01L21/336, H01L29/786, H01L21/28, H01L51/05, H01L51/30
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/28]
TitleGerman:SOURCE-DRAIN-ELEKTRODE FÜR ORGANISCHES HALBLEITERBAUELEMENT, ORGANISCHES HALBLEITERBAUELEMENT DAMIT UND HERSTELLUNGSVERFAHREN FÜR SOURCE-DRAIN-ELEKTRODE UND HALBLEITERBAUELEMENT[2022/28]
English:SOURCE/DRAIN ELECTRODE FOR ORGANIC SEMICONDUCTOR DEVICE, ORGANIC SEMICONDUCTOR DEVICE USING SAME, AND PRODUCTION METHOD FOR SOURCE/DRAIN ELECTRODE AND SEMICONDUCTOR DEVICE[2022/28]
French:ÉLECTRODE DE SOURCE/DRAIN POUR DISPOSITIF À SEMI-CONDUCTEUR ORGANIQUE, DISPOSITIF À SEMI-CONDUCTEUR ORGANIQUE L'UTILISANT, ET PROCÉDÉ DE PRODUCTION POUR ÉLECTRODE DE SOURCE/DRAIN ET DISPOSITIF À SEMI-CONDUCTEUR[2022/28]
Entry into regional phase14.03.2022Translation filed 
14.03.2022National basic fee paid 
14.03.2022Search fee paid 
14.03.2022Designation fee(s) paid 
14.03.2022Examination fee paid 
Examination procedure14.03.2022Examination requested  [2022/28]
24.03.2024Date on which the examining division has become responsible
27.03.2024Amendment by applicant (claims and/or description)
Fees paidRenewal fee
14.03.2022Renewal fee patent year 03
31.03.2023Renewal fee patent year 04
31.03.2024Renewal fee patent year 05
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Documents cited:Search[Y]US2005186699  (KAWASE TAKEO [JP], et al);
 [Y]JP2009130327  (SEIKO EPSON CORP);
 [Y]US2017047558  (LEE HYUNKOO [KR], et al);
International search[A]JP2006073794  (VICTOR COMPANY OF JAPAN);
 [A]JP2007115805  (SONY CORP);
 [A]JP2007115944  (VICTOR COMPANY OF JAPAN);
 [XYA]US2011117695  (CHENG JUNG-WEI JOHN [TW], et al);
 [Y]JP2014502047  ;
 [Y]JP2014216477  (DENSO CORP);
 [Y]WO2015163207  (SUMITOMO CHEMICAL CO [JP]);
 [XYA]WO2016031762  (NIKON CORP [JP]);
 [A]JP2016051758  (UNIV TOKYO, et al);
 [Y]JP2017157752  (DENSO CORP);
 [A]JP2018037486  (DAINIPPON INK & CHEMICALS)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.