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Extract from the Register of European Patents

EP About this file: EP4043862

EP4043862 - METHOD FOR ADJUSTING POSITION, MICROPARTICLE ANALYSIS DEVICE, AND PROGRAM [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  09.05.2024
Database last updated on 03.10.2024
FormerRequest for examination was made
Status updated on  15.07.2022
FormerThe international publication has been made
Status updated on  14.05.2021
Most recent event   Tooltip19.09.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Sony Group Corporation
1-7-1, Konan
Minato-ku
Tokyo 108-0075 / JP
[2022/33]
Inventor(s)01 / KAI, Shinichi
c/o Sony Imaging Products & Solutions Inc., 1-7-1
Konan, Minato-ku
Tokyo 108-0075 / JP
02 / KAJIHARA, Junji
c/o Sony Imaging Products & Solutions Inc., 1-7-1
Konan, Minato-ku
Tokyo 108-0075 / JP
03 / KITA, Koji
c/o Sony Imaging Products & Solutions Inc., 1-7-1
Konan, Minato-ku
Tokyo 108-0075 / JP
04 / SAKAMOTO, Naohisa
c/o Sony Imaging Products & Solutions Inc., 1-7-1
Konan, Minato-ku
Tokyo 108-0075 / JP
05 / TAKAHASHI, Kazuya
c/o Sony Imaging Products & Solutions Inc., 1-7-1
Konan, Minato-ku
Tokyo 108-0075 / JP
 [2022/33]
Representative(s)D Young & Co LLP
3 Noble Street
London EC2V 7BQ / GB
[N/P]
Former [2022/33]D Young & Co LLP
120 Holborn
London EC1N 2DY / GB
Application number, filing date20884203.911.09.2020
[2022/33]
WO2020JP34432
Priority number, dateJP2019020157706.11.2019         Original published format: JP 2019201577
[2022/33]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021090574
Date:14.05.2021
Language:JA
[2021/19]
Type: A1 Application with search report 
No.:EP4043862
Date:17.08.2022
Language:EN
[2022/33]
Search report(s)International search report - published on:JP14.05.2021
(Supplementary) European search report - dispatched on:EP07.11.2022
ClassificationIPC:G01N15/14, G01N37/00, G01N35/08
[2022/33]
CPC:
G01N15/1459 (EP); G01N15/1434 (EP,US); G01N15/0227 (EP);
G01N15/1404 (US); G01N15/1433 (EP); G01N15/1484 (EP);
G01N15/149 (EP); G01N2015/0238 (EP); G01N2015/0288 (EP);
G01N2015/0294 (EP); G01N2015/1006 (EP); G01N2015/1027 (EP);
G01N2015/1422 (US); G01N2015/144 (US); G01N2015/1452 (EP);
G01N2015/1493 (EP); G01N2015/1497 (EP) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/33]
TitleGerman:VERFAHREN ZUM EINSTELLEN DER POSITION, MIKROTEILCHEN-ANALYSE-VORRICHTUNG UND PROGRAMM[2022/33]
English:METHOD FOR ADJUSTING POSITION, MICROPARTICLE ANALYSIS DEVICE, AND PROGRAM[2022/33]
French:PROCÉDÉ DE RÉGLAGE DE POSITION, DISPOSITIF D'ANALYSE DE MICROPARTICULES ET PROGRAMME[2022/33]
Entry into regional phase20.04.2022Translation filed 
20.04.2022National basic fee paid 
20.04.2022Search fee paid 
20.04.2022Designation fee(s) paid 
20.04.2022Examination fee paid 
Examination procedure20.04.2022Examination requested  [2022/33]
13.12.2022Amendment by applicant (claims and/or description)
13.12.2022Date on which the examining division has become responsible
08.05.2024Despatch of a communication from the examining division (Time limit: M04)
10.07.2024Reply to a communication from the examining division
Fees paidRenewal fee
21.09.2022Renewal fee patent year 03
20.09.2023Renewal fee patent year 04
19.09.2024Renewal fee patent year 05
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Documents cited:Search[A]JPS62112034  (CANON KK) [A] 3-5 * figures 1-4 * * page 197, paragraph last *;
 [A]US2015057787  (MURAKI YOSUKE [JP], et al) [A] 1-15 * paragraph [0082] - paragraph [0083] * * paragraph [0142] * * paragraph [0176] ** figures 1, 5-13 *;
 [XI]WO2018175411  (NANOCELLECT BIOMEDICAL INC [US]) [X] 1,2,6-15 * figures Fig. 24A-D * * paragraph [0166] - paragraph [0170] * * paragraph [0003] * [I] 3-5;
 [A]US2019020825  (MASUDA SHIGEKI [JP], et al) [A] 1-15 * figure 2 * * paragraph [0007] * * paragraph [0027] - paragraph [0036] * * paragraph [0044] - paragraph [0046] *
International search[X]JPH0481640  (TOA MEDICAL ELECTRONICS) [X] 1-20 * , claims, p. 2, lower right column, line 7 to p. 3, lower left column, line 4 *;
 [A]JPH04188042  (TOA MEDICAL ELECTRONICS) [A] 1-20;
 [A]JPH0513454B  (CANON INC.) [A] 1-20 * , claims *;
 [A]JP2013210308  (SONY CORP) [A] 1-20 * , paragraph [0040] *;
 [A]JP5727629B  (CONSTITUTION MEDICAL INC.) [A] 5 * , paragraph [0030] *;
 [A]WO2018067770  (IRIS INT INC [US])[A] 1-20;
 [A]  - Santos A., Ortiz De Solórzano C., Vaquero J. J., Peña J. M., Malpica N., Del Pozo F., "Evaluation of autofocus functions in molecular cytogenetic analysis", Journal of Microscopy, (19971200), vol. 188, no. 3, pages 264 - 272, XP055823557 [A] 5 * , item 2 *

DOI:   http://dx.doi.org/10.1046/j.1365-2818.1997.2630819.x
by applicantJP2012127922
 JP2016191715
    - A. SANTOS et al., "Evaluation of autofocus functions in molecular cytogenetic analysis", Journal of Microscopy, (19970000), vol. 188, doi:10.1046/j.1365-2818.1997.2630819.x, XP055823557

DOI:   http://dx.doi.org/10.1046/j.1365-2818.1997.2630819.x
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