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EP4111237
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EP About this file: EP4111237
| EP4111237 - SEMICONDUCTOR RADIATION DETECTOR [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 19.01.2024 Database last updated on 31.08.2024 | |
| Former | Request for examination was made Status updated on 02.12.2022 | ||
| Former | The international publication has been made Status updated on 03.09.2021 | Most recent event Tooltip | 19.01.2024 | Withdrawal of application | published on 21.02.2024 [2024/08] | Applicant(s) | For all designated states Shenzhen Xpectvision Technology Co., Ltd. B507, Block A and B Nanshan Medical Device Industrial Park Nanhai Avenue 1019 Nanshan District Shenzhen, Guangdong 518000 / CN | [2023/01] | Inventor(s) | 01 /
CAO, Peiyan Suite 201, Building B52, Tanglang Industrial Area No. 13 At No. Five Xinyi Road, Tanglang Community Taoyuan Str., Nanshan District Shenzhen, Guangdong 518071 / CN | 02 /
LIU, Yurun Suite 201, Building B52, Tanglang Industrial Area No. 13 At No. Five Xinyi Road, Tanglang Community Taoyuan Str., Nanshan District Shenzhen, Guangdong 518071 / CN | [2023/01] | Representative(s) | Beck Greener LLP Fulwood House 12 Fulwood Place London WC1V 6HR / GB | [2023/01] | Application number, filing date | 20921127.5 | 26.02.2020 | [2023/01] | WO2020CN76776 | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2021168685 | Date: | 02.09.2021 | Language: | EN | [2021/35] | Type: | A1 Application with search report | No.: | EP4111237 | Date: | 04.01.2023 | Language: | EN | The application published by WIPO in one of the EPO official languages on 02.09.2021 takes the place of the publication of the European patent application. | [2023/01] | Search report(s) | International search report - published on: | CN | 02.09.2021 | (Supplementary) European search report - dispatched on: | EP | 29.09.2023 | Classification | IPC: | G01T1/24 | [2023/01] | CPC: |
G01T1/241 (EP,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2023/01] | Title | German: | HALBLEITERSTRAHLUNGSDETEKTOR | [2023/01] | English: | SEMICONDUCTOR RADIATION DETECTOR | [2023/01] | French: | DÉTECTEUR DE RAYONNEMENT À SEMI-CONDUCTEURS | [2023/01] | Entry into regional phase | 31.08.2022 | National basic fee paid | 31.08.2022 | Search fee paid | 31.08.2022 | Designation fee(s) paid | 31.08.2022 | Examination fee paid | Examination procedure | 31.08.2022 | Examination requested [2023/01] | 15.04.2023 | Amendment by applicant (claims and/or description) | 17.01.2024 | Application withdrawn by applicant [2024/08] | Fees paid | Renewal fee | 31.08.2022 | Renewal fee patent year 03 | 26.01.2023 | Renewal fee patent year 04 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US2012313196 (LI ZHENG [US]) [A] 1-15 * abstract ** paragraph [0192] *; | [A] - KOYBASI O ET AL, "Electrical Characterization and Preliminary Beam Test Results of 3D Silicon CMS Pixel Detectors", IEEE TRANSACTIONS ON NUCLEAR SCIENCE, IEEE, USA, (20110601), vol. 58, no. 3, doi:10.1109/TNS.2011.2117439, ISSN 0018-9499, pages 1315 - 1323, XP011477466 [A] 1-15 * abstract * * page 1315, column r, paragraph I. * * page 1316, column l, paragraph II. * DOI: http://dx.doi.org/10.1109/TNS.2011.2117439 | International search | [A]US5723866 (HAMILTON JR WILLIAM J [US]) [A] 1-39 * the whole document *; | [A]US2006186343 (LIU JAMES Z [US], et al) [A] 1-39 * the whole document *; | [A]CN107533146 (SHENZHEN XPECTVISION TECH CO LTD) [A] 1-39 * description, paragraphs [0060]-[0074], figures 1-4 *; | [A]WO2019084702 (SHENZHEN GENORIVISION TECH CO LTD [CN]) [A] 1-39 * the whole document *; | [A]WO2020003603 (UNIV KYOTO [JP], et al) [A] 1-39 * the whole document *; | [A]US2020052148 (CAO PEIYAN [CN], et al) [A] 1-39* the whole document * |