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Extract from the Register of European Patents

EP About this file: EP4040200

EP4040200 - MICRO-LENS BASED MODULE COMPRISING NANOSTRUCTURED LAYER [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  10.05.2024
Database last updated on 07.10.2024
FormerRequest for examination was made
Status updated on  10.02.2023
FormerThe application has been published
Status updated on  08.07.2022
Most recent event   Tooltip30.08.2024New entry: Reply to examination report 
Applicant(s)For all designated states
Focuslight Switzerland SA
Rouges-Terres 61
2068 Hauterive / CH
[2024/14]
Former [2022/32]For all designated states
SUSS MicroOptics SA
Rouges-Terres 61
2068 Hauterive / CH
Inventor(s)01 / Quaranta, Giorgio
2000 Neuchâtel / CH
02 / Noell, Wilfried
2000 Neuchâtel / CH
03 / Bremer, Christopher
2000 Neuchâtel / CH
 [2022/32]
Representative(s)P&TS SA (AG, Ltd.)
Avenue J.-J. Rousseau 4
P.O. Box 2848
2001 Neuchâtel / CH
[2022/32]
Application number, filing date21155756.608.02.2021
[2022/32]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP4040200
Date:10.08.2022
Language:EN
[2022/32]
Search report(s)(Supplementary) European search report - dispatched on:EP16.07.2021
ClassificationIPC:G02B5/18, G01B11/25, G02B27/20, G03B21/00
[2022/32]
CPC:
G02B5/1842 (EP,KR); G02B3/0056 (EP,KR,US); G02B27/20 (EP,KR);
G02B27/425 (EP,KR); G02B5/008 (EP,KR); G02B5/1809 (US);
G02B5/1814 (EP,KR); G02B5/201 (EP,KR); G02B5/28 (EP,KR);
G03B21/001 (EP,KR); G02B27/4261 (EP) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/11]
Former [2022/32]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MA09.02.2023
MDNot yet paid
TN09.02.2023
TitleGerman:MIKROLINSENBASIERTES MODUL MIT NANOSTRUKTURIERTER SCHICHT[2022/32]
English:MICRO-LENS BASED MODULE COMPRISING NANOSTRUCTURED LAYER[2022/32]
French:MODULE À MICROLENTILLES COMPRENANT UNE COUCHE NANOSTRUCTURÉE[2022/32]
Examination procedure09.02.2023Amendment by applicant (claims and/or description)
09.02.2023Examination requested  [2023/11]
09.02.2023Date on which the examining division has become responsible
14.05.2024Despatch of a communication from the examining division (Time limit: M04)
29.08.2024Reply to a communication from the examining division
Fees paidRenewal fee
28.02.2023Renewal fee patent year 03
26.02.2024Renewal fee patent year 04
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XYI]US6381072  (BURGER ROBERT J [US]) [X] 1,2,5 * abstract; figures 2,2a,7c,20 * * column 2, line 43 - line 50 * * column 3, line 7 - line 20 * * column 15, line 59 - column 16, line 9 * * column 20, line 57 - column 21, line 21 * * column 21, line 50 - line 62 * * column 25, line 34 - column 26, line 57 * * column 29, line 6 - line 34 * [Y] 3,4,6-8,16 [I] 9,10;
 [XY]US2012092623  (HUEBNER KENNETH J [US]) [X] 1,2,5,14-16 * paragraphs [0114] , [0169]; figures 15-18,61a-61c,63 * * paragraphs [0110] - [0116] - [0169] - [0173] - [0329] * [Y] 6-8,11-13,16;
 [XY]US2019041736  (GRUNNET-JEPSEN ANDERS [US], et al) [X] 1,2,5 * abstract; figure 6d * * paragraphs [0039] , [0048] , [0060] , [0061] * [Y] 3,6-8;
 [XYI]US2019270403  (SOBECKI JUSTIN E [US], et al) [X] 1,2,5,14,15 * abstract; figures 2,13 * * paragraphs [0039] - [0042] - [0046] , [0047] , [0060] , [0069]; claim 3 * [Y] 3,6-8,12,13,16 [I] 16;
 [Y]US2020050094  (HAN SEUNGHOON [KR], et al) [Y] 3,4,6-8,11-13 * abstract; figures 1-5,12,13 ** paragraphs [0065] - [0082] - [0094] , [0102] , [0110] , [0124] *
by applicantUS2011228231
 WO2019223859
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.