EP4104206 - A PRESSURE REGULATED SEMICONDUCTOR WAFER COOLING APPARATUS AND METHOD AND A PRESSURE REGULATING APPARATUS [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 07.02.2025 Database last updated on 26.04.2025 | |
Former | The patent has been granted Status updated on 01.03.2024 | ||
Former | Grant of patent is intended Status updated on 02.11.2023 | ||
Former | Request for examination was made Status updated on 18.11.2022 | ||
Former | The international publication has been made Status updated on 20.08.2021 | ||
Former | unknown Status updated on 25.02.2021 | Most recent event Tooltip | 25.04.2025 | Lapse of the patent in a contracting state New state(s): SI | published on 28.05.2025 [2025/22] | Applicant(s) | For all designated states Edwards Vacuum LLC 6416, Inducon Drive West Sanborn, NY 14132 / US | [2022/51] | Inventor(s) | 01 /
KALE, Kaustubh Edwards Vacuum LLC 11 Elizabeth Drive Chelmsford, Massachusetts MA 01801 / US | [2022/51] | Representative(s) | Norton, Ian Andrew Edwards Limited Innovation Drive Burgess Hill, West Sussex RH15 9TW / GB | [2024/14] |
Former [2022/51] | Norton, Ian Andrew Edwards Limited Innovation Drive Burgess Hill West Sussex RH15 9TW / GB | Application number, filing date | 21705614.2 | 10.02.2021 | [2022/51] | WO2021IB51067 | Priority number, date | GB20200001894 | 12.02.2020 Original published format: GB 202001894 | [2022/51] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2021161181 | Date: | 19.08.2021 | Language: | EN | [2021/33] | Type: | A1 Application with search report | No.: | EP4104206 | Date: | 21.12.2022 | Language: | EN | The application published by WIPO in one of the EPO official languages on 19.08.2021 takes the place of the publication of the European patent application. | [2022/51] | Type: | B1 Patent specification | No.: | EP4104206 | Date: | 03.04.2024 | Language: | EN | [2024/14] | Search report(s) | International search report - published on: | EP | 19.08.2021 | Classification | IPC: | H01L21/67 | [2022/51] | CPC: |
H01L21/67103 (EP,IL,KR,US);
H01L21/67109 (EP,IL,KR);
C23C16/463 (GB);
F25B49/02 (US);
C23C14/541 (GB);
F25B41/20 (US);
F25B41/40 (US);
H01J37/32724 (GB);
H01L21/6715 (EP,IL,KR);
H01L21/67248 (EP,IL,KR);
H01L21/68714 (GB,US);
F25B2500/07 (US);
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2022/51] | Extension states | BA | Not yet paid | ME | Not yet paid | Validation states | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | VORRICHTUNG UND VERFAHREN ZUR DRUCKGEREGELTEN HALBLEITERWAFERKÜHLUNG UND DRUCKREGELVORRICHTUNG | [2022/51] | English: | A PRESSURE REGULATED SEMICONDUCTOR WAFER COOLING APPARATUS AND METHOD AND A PRESSURE REGULATING APPARATUS | [2022/51] | French: | APPAREIL ET PROCÉDÉ DE REFROIDISSEMENT DE TRANCHE SEMI-CONDUCTRICE À PRESSION RÉGULÉE ET APPAREIL DE RÉGULATION DE PRESSION | [2022/51] | Entry into regional phase | 23.08.2022 | National basic fee paid | 23.08.2022 | Designation fee(s) paid | 23.08.2022 | Examination fee paid | Examination procedure | 23.08.2022 | Examination requested [2022/51] | 23.08.2022 | Date on which the examining division has become responsible | 10.03.2023 | Amendment by applicant (claims and/or description) | 03.11.2023 | Communication of intention to grant the patent | 25.01.2024 | Fee for grant paid | 25.01.2024 | Fee for publishing/printing paid | 25.01.2024 | Receipt of the translation of the claim(s) | Opposition(s) | 06.01.2025 | No opposition filed within time limit [2025/11] | Fees paid | Renewal fee | 27.02.2023 | Renewal fee patent year 03 | 27.02.2024 | Renewal fee patent year 04 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | AT | 03.04.2024 | BG | 03.04.2024 | CZ | 03.04.2024 | DK | 03.04.2024 | EE | 03.04.2024 | ES | 03.04.2024 | FI | 03.04.2024 | HR | 03.04.2024 | LV | 03.04.2024 | PL | 03.04.2024 | RO | 03.04.2024 | SI | 03.04.2024 | SK | 03.04.2024 | SM | 03.04.2024 | NO | 03.07.2024 | RS | 03.07.2024 | GR | 04.07.2024 | IS | 03.08.2024 | PT | 05.08.2024 | [2025/22] |
Former [2025/11] | AT | 03.04.2024 | |
BG | 03.04.2024 | ||
CZ | 03.04.2024 | ||
DK | 03.04.2024 | ||
EE | 03.04.2024 | ||
ES | 03.04.2024 | ||
FI | 03.04.2024 | ||
HR | 03.04.2024 | ||
LV | 03.04.2024 | ||
PL | 03.04.2024 | ||
RO | 03.04.2024 | ||
SK | 03.04.2024 | ||
SM | 03.04.2024 | ||
NO | 03.07.2024 | ||
RS | 03.07.2024 | ||
GR | 04.07.2024 | ||
IS | 03.08.2024 | ||
PT | 05.08.2024 | ||
Former [2025/09] | AT | 03.04.2024 | |
BG | 03.04.2024 | ||
CZ | 03.04.2024 | ||
DK | 03.04.2024 | ||
EE | 03.04.2024 | ||
ES | 03.04.2024 | ||
FI | 03.04.2024 | ||
HR | 03.04.2024 | ||
LV | 03.04.2024 | ||
PL | 03.04.2024 | ||
NO | 03.07.2024 | ||
RS | 03.07.2024 | ||
GR | 04.07.2024 | ||
IS | 03.08.2024 | ||
PT | 05.08.2024 | ||
Former [2025/08] | AT | 03.04.2024 | |
BG | 03.04.2024 | ||
CZ | 03.04.2024 | ||
DK | 03.04.2024 | ||
ES | 03.04.2024 | ||
FI | 03.04.2024 | ||
HR | 03.04.2024 | ||
LV | 03.04.2024 | ||
PL | 03.04.2024 | ||
NO | 03.07.2024 | ||
RS | 03.07.2024 | ||
GR | 04.07.2024 | ||
IS | 03.08.2024 | ||
PT | 05.08.2024 | ||
Former [2024/50] | AT | 03.04.2024 | |
BG | 03.04.2024 | ||
CZ | 03.04.2024 | ||
ES | 03.04.2024 | ||
FI | 03.04.2024 | ||
HR | 03.04.2024 | ||
LV | 03.04.2024 | ||
PL | 03.04.2024 | ||
NO | 03.07.2024 | ||
RS | 03.07.2024 | ||
GR | 04.07.2024 | ||
IS | 03.08.2024 | ||
PT | 05.08.2024 | ||
Former [2024/48] | AT | 03.04.2024 | |
BG | 03.04.2024 | ||
CZ | 03.04.2024 | ||
ES | 03.04.2024 | ||
FI | 03.04.2024 | ||
HR | 03.04.2024 | ||
NO | 03.07.2024 | ||
GR | 04.07.2024 | ||
IS | 03.08.2024 | ||
PT | 05.08.2024 | ||
Former [2024/47] | BG | 03.04.2024 | |
FI | 03.04.2024 | ||
HR | 03.04.2024 | ||
NO | 03.07.2024 | ||
GR | 04.07.2024 | ||
IS | 03.08.2024 | ||
PT | 05.08.2024 | Cited in | International search | [A]US2001016427 (UEDA ISSEI [JP]); | [A]US2009250202 (EIBL MARKUS [DE]); | [A]US2018067395 (ZHOU WEN-ZHAN [TW], et al) |