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Extract from the Register of European Patents

EP About this file: EP4185947

EP4185947 - CHAOTIC PHYSICAL TRUE RANDOM NUMBER GENERATOR AND ASSOCIATED METHOD [Right-click to bookmark this link]
StatusGrant of patent is intended
Status updated on  19.01.2026
Database last updated on 21.03.2026
FormerRequest for examination was made
Status updated on  28.04.2023
FormerThe international publication has been made
Status updated on  28.01.2022
Formerunknown
Status updated on  06.08.2021
Most recent event   Tooltip19.01.2026New entry: Communication of intention to grant a patent 
Applicant(s)For all designated states
Université Grenoble Alpes
621 avenue Centrale
38400 Saint-Martin-d'Hères / FR
For all designated states
Centre National de la Recherche Scientifique
3, Rue Michel Ange
75016 Paris / FR
For all designated states
Institut Polytechnique de Grenoble
46 Avenue Félix Viallet
38000 Grenoble / FR
[2023/22]
Inventor(s)01 / DEFOORT, Martial, Joseph
38000 Grenoble / FR
02 / BASROUR, Skandar
38000 Grenoble / FR
03 / FESQUET, Laurent, René
38360 Sassenage / FR
 [2023/22]
Representative(s)Hautier IP
20, rue de la Liberté
06000 Nice / FR
[2023/22]
Application number, filing date21746735.620.07.2021
[2023/22]
WO2021EP70299
Priority number, dateFR2020000776623.07.2020         Original published format: FR 2007766
[2023/22]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report
No.:WO2022018099
Date:27.01.2022
Language:FR
[2022/04]
Type: A1 Application with search report 
No.:EP4185947
Date:31.05.2023
Language:FR
The application published by WIPO in one of the EPO official languages on 27.01.2022 takes the place of the publication of the European patent application.
[2023/22]
Search report(s)International search report - published on:EP27.01.2022
ClassificationIPC:G06F7/58
[2023/22]
CPC:
G06F7/588 (EP,US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/22]
TitleGerman:CHAOTISCHER PHYSIKALISCHER ECHTER ZUFALLSZAHLENGENERATOR UND ZUGEHÖRIGES VERFAHREN[2023/22]
English:CHAOTIC PHYSICAL TRUE RANDOM NUMBER GENERATOR AND ASSOCIATED METHOD[2023/22]
French:GÉNÉRATEUR PHYSIQUE CHAOTIQUE DE NOMBRES ALÉATOIRES VRAIS ET PROCÉDÉ ASSOCIÉ[2023/22]
Entry into regional phase16.01.2023National basic fee paid 
16.01.2023Designation fee(s) paid 
16.01.2023Examination fee paid 
Examination procedure16.01.2023Examination requested  [2023/22]
16.01.2023Date on which the examining division has become responsible
20.09.2023Amendment by applicant (claims and/or description)
19.01.2026Communication of intention to grant the patent
Fees paidRenewal fee
05.07.2023Renewal fee patent year 03
11.06.2024Renewal fee patent year 04
25.06.2025Renewal fee patent year 05
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[A]   CHEN QINGFEI: "Nonlinear dynamics, control and shock mitigation in microelectromechanical and nanoelectromechanical resonant devices", 1 May 2010 (2010-05-01), pages 1 - 24, XP055785956, ISBN: 978-1-124-03153-8, Retrieved from the Internet [retrieved on 20210315]
 [A]   GHOSH DIA ET AL: "Generation & control of chaos in a single loop optoelectronic oscillator", OPTIK., vol. 165, 1 July 2018 (2018-07-01), DE, pages 275 - 287, XP055785930, ISSN: 0030-4026, DOI: 10.1016/j.ijleo.2018.02.010

DOI:   http://dx.doi.org/10.1016/j.ijleo.2018.02.010
 [A]   CHEN QINGFEI: "Nonlinear dynamics, control and shock mitigation in microelectromechanical and nanoelectromechanical resonant devices", 1 May 2010 (2010-05-01), pages 56 - 71, XP055785998, ISBN: 978-1-124-03153-8, Retrieved from the Internet [retrieved on 20210315]
by applicant  S. K. MATHEW ET AL.: "2.4 Gbps, 7 mW All-Digital PVT-Variation Tolerant True Random Number Generator for 45 nm CMOS High-Performance Microprocessors", IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 47, no. 11, November 2012 (2012-11-01), pages 2807 - 2821, XP011470534, DOI: 10.1109/JSSC.2012.2217631

DOI:   http://dx.doi.org/10.1109/JSSC.2012.2217631
   FISCHER V. ET AL.: "Cryptographie Hardware and Embedded Systems - CHES 2002. Lecture Notes in Computer Science", vol. 2523, 2002, SPRINGER, article "True Random Number Generator Embedded in Reconfigurable Hardware"
   UCHIDA, A.AMANO, K.INOUE, M.HIRANO, K.NAITO, S.SOMEYA, H.YOSHIMURA, K.: "Fast physical random bit gnration with chaotic semiconductor lasers", NATURE PHOTONICS, vol. 2, no. 12, 2008, pages 728, XP055685261, DOI: 10.1038/nphoton.2008.227

DOI:   http://dx.doi.org/10.1038/nphoton.2008.227
   TANAKA, M.: "An industrial and applied review of new MEMS devices features", MICROELECTRONIC ENGINEERING, vol. 84, no. 5-8, 2007, pages 1341 - 1344, XP022062012, DOI: 10.1016/j.mee.2007.01.232

DOI:   http://dx.doi.org/10.1016/j.mee.2007.01.232
   T. B. GABRIELSON ET AL.: "Mechanical-thermal noise in micromachined acoustic and vibration sensors", IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 40, no. 5, May 1993 (1993-05-01), pages 903 - 909, XP055081372, DOI: 10.1109/16.210197

DOI:   http://dx.doi.org/10.1109/16.210197
   M. SANSA ET AL.: "Frequency fluctuations in silicon nanoresonators", NAT. NANOTECHNOL., vol. 11, 2016, pages 552 - 558
   Y. C. WANG ET AL.: "Chaos in MEMS, parameter estimation and its potential application", IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I: FUNDAMENTAL THEORY AND APPLICATIONS, vol. 45, no. 10, October 1998 (1998-10-01), pages 1013 - 1020, XP000860751, DOI: 10.1109/81.728856

DOI:   http://dx.doi.org/10.1109/81.728856
   M. E. YALCIN ET AL.: "True random bit gnration from a double-scroll attractor", IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I: REGULAR PAPERS, vol. 51, no. 7, July 2004 (2004-07-01), pages 1395 - 1404, XP011115106, DOI: 10.1109/TCSI.2004.830683

DOI:   http://dx.doi.org/10.1109/TCSI.2004.830683
   GHOSH DIA ET AL.: "Generation & control of chaos in a single loop optoelectronic oscillator", OPTIK
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.