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Extract from the Register of European Patents

EP About this file: EP4075116

EP4075116 - FLOW ANALYSIS DEVICE AND FLOW ANALYSIS METHOD [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  22.02.2024
Database last updated on 13.11.2024
FormerRequest for examination was made
Status updated on  16.09.2022
FormerThe international publication has been made
Status updated on  16.10.2021
Most recent event   Tooltip09.08.2024New entry: Despatch of examination report + time limit 
Applicant(s)For all designated states
BL Tec K.K.
Edoboriyatani Building 2F, 1-25-7
Edobori, Nishi-ku
Osaka-shi, Osaka, 550-0002 / JP
[2022/42]
Inventor(s)01 / NISHIMURA, Takashi
c/o BL TEC K.K., Matsumoto Building 4F, 14-15,
Nihonbashi-Odenmacho, Chuo-ku
Tokyo 103-0011 / JP
02 / MASAKI, Kazuo
c/o BL TEC K.K., Matsumoto Building 4F, 14-15,
Nihonbashi-Odenmacho, Chuo-ku
Tokyo 103-0011 / JP
 [2022/42]
Representative(s)Bittner, Thomas L.
Boehmert & Boehmert
Anwaltspartnerschaft mbB
Pettenkoferstrasse 22
80336 München / DE
[2022/42]
Application number, filing date21784735.931.03.2021
[2022/42]
WO2021JP13789
Priority number, dateJP2020007002408.04.2020         Original published format: JP 2020070024
[2022/42]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021205953
Date:14.10.2021
Language:JA
[2021/41]
Type: A1 Application with search report 
No.:EP4075116
Date:19.10.2022
Language:EN
[2022/42]
Search report(s)International search report - published on:JP14.10.2021
(Supplementary) European search report - dispatched on:EP09.05.2023
ClassificationIPC:G01N1/00, G01N1/10, G01N21/31, G01N21/73, G01N27/62, G01N33/18, G01N35/08
[2023/23]
CPC:
G01N21/73 (EP,KR); G01N1/10 (KR); G01N1/38 (KR,US);
G01N1/30 (KR); G01N1/4022 (KR); G01N15/06 (US);
G01N15/0656 (US); G01N21/31 (KR); G01N21/3103 (EP);
G01N27/623 (KR); G01N33/1813 (EP); G01N33/1893 (EP);
G01N33/20 (KR); G01N35/08 (EP); G01N15/075 (US);
G01N2015/0053 (US); G01N2015/0681 (US); G01N2015/0687 (US) (-)
Former IPC [2022/42]G01N1/00, G01N1/10, G01N21/31, G01N21/73, G01N27/62
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/42]
TitleGerman:VORRICHTUNG UND VERFAHREN ZUR DURCHFLUSSANALYSE[2022/42]
English:FLOW ANALYSIS DEVICE AND FLOW ANALYSIS METHOD[2022/42]
French:DISPOSITIF D'ANALYSE DE FLUX ET PROCÉDÉ D'ANALYSE DE FLUX[2022/42]
Entry into regional phase15.06.2022Translation filed 
15.06.2022National basic fee paid 
15.06.2022Search fee paid 
15.06.2022Designation fee(s) paid 
15.06.2022Examination fee paid 
Examination procedure15.06.2022Examination requested  [2022/42]
23.11.2023Amendment by applicant (claims and/or description)
23.11.2023Date on which the examining division has become responsible
21.02.2024Despatch of a communication from the examining division (Time limit: M03)
16.05.2024Reply to a communication from the examining division
08.08.2024Despatch of a communication from the examining division (Time limit: M04)
Fees paidRenewal fee
14.02.2023Renewal fee patent year 03
15.02.2024Renewal fee patent year 04
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XI]US4804519  (SAINZ MARIO A [US], et al);
 [A]CA2160235  (ARECO CANADA INC [CA]);
 [A]US2006104827  (SHAW PHILIP N [GB], et al);
 [A]US7897032  (VILTCHINSKAIA ELENA [US], et al)
International search[A]JPS59501994  (SHAW, Stewart, P, D) [A] 1-14 * , entire text, all drawings, in particular, p. 3, upper right column, line 5 to lower left column, line 4 *;
 [A]JPH06222005  (SEIKO INSTR INC) [A] 1-14 * , entire text, all drawings *;
 [A]JPH06249783  (SHIMADZU CORP) [A] 1-14 * , entire text, all drawings *;
 [A]US5407832  (HAYASHIBE YUTAKA [JP], et al) [A] 1-14 * , entire text, all drawings *;
 [A]JP2004526952  [A] 1-14 * , entire text, all drawings *;
 [A]JP2009288228  (BL TEC KK) [A] 1-14 * , entire text, all drawings *;
 [A]JP2012530903  (THE REGENTS OF THE UNIVERSITY OF MICHIGAN) [A] 1-14 * , entire text, all drawings *;
 [A]US2016172178  (APFFEL JAMES ALEXANDER [US], et al) [A] 1-14 * , paragraphs [0041]-[0094], fig. 1-4, in particular, paragraphs [0041], [0045], [0049], [0059], [0081], [0086], fig. 1, 2 *;
 [A]JP2019113357  (EGS KK, et al) [A] 1-14 * , paragraphs [0056]-[0059], fig. 1 *;
 [PA]JP2020134519  (BL TEC KK) [PA] 1-14* , entire text, all drawings *
by applicant   - MIYAZAKI AKIRAFUJIMORI EIJITANAKA ATSUSHIYOSHINAGA JUN, Purazuma bun-koho niyoru kankyoshiryo no bunseki - ICP, DCP, MIP bunseki no kiso to jitsurei - (analysis of environmental sample by plasma spectrometry - basics and practical examples of ICP, DCP, MIP analyses, AGNE Gijutsu Center Inc., (20200220), pages 64 - 74
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.