EP4158684 - IC DEVICE WITH CHIP TO PACKAGE INTERCONNECTS FROM A COPPER METAL INTERCONNECT LEVEL [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 03.03.2023 Database last updated on 18.11.2024 | |
Former | The international publication has been made Status updated on 10.12.2021 | Most recent event Tooltip | 17.07.2024 | The date on which the examining division becomes responsible, has been established | 17.07.2024 | Amendment by applicant | Applicant(s) | For all designated states Texas Instruments Incorporated P.O. Box 655474 Mail Station 3999 Dallas, TX 75265 / US | [2023/14] | Inventor(s) | 01 /
JAIN, Manoj Kumar Plano, TX 75025 / US | [2023/14] | Representative(s) | Zeller, Andreas Texas Instruments Deutschland GmbH EMEA Patent Department Haggertystraße 1 85356 Freising / DE | [2023/14] | Application number, filing date | 21818641.9 | 02.06.2021 | [2023/14] | WO2021US35341 | Priority number, date | US202063033247P | 02.06.2020 Original published format: US 202063033247 P | US202117331921 | 27.05.2021 Original published format: US202117331921 | [2023/14] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2021247633 | Date: | 09.12.2021 | Language: | EN | [2021/49] | Type: | A1 Application with search report | No.: | EP4158684 | Date: | 05.04.2023 | Language: | EN | The application published by WIPO in one of the EPO official languages on 09.12.2021 takes the place of the publication of the European patent application. | [2023/14] | Search report(s) | International search report - published on: | RU | 09.12.2021 | (Supplementary) European search report - dispatched on: | EP | 08.01.2024 | Classification | IPC: | H01L21/768, H01L21/66, H01L23/31, H01L23/00 | [2024/06] | CPC: |
H01L24/05 (EP);
H01L23/5226 (KR);
H01L24/20 (US);
H01L21/4821 (KR);
H01L21/565 (KR,US);
H01L21/76877 (KR,US);
H01L21/78 (KR);
H01L22/32 (EP,KR);
H01L23/291 (KR);
H01L23/3171 (KR);
H01L23/49575 (KR);
H01L23/5283 (KR);
H01L23/53228 (US);
H01L23/53266 (KR);
H01L24/02 (EP);
H01L24/04 (KR);
H01L24/11 (EP,KR,US);
H01L24/12 (KR);
H01L24/13 (EP,US);
H01L24/19 (US);
H01L24/82 (US);
H01L24/94 (US);
H01L2224/02331 (EP);
H01L2224/0239 (EP);
H01L2224/03616 (EP);
H01L2224/0401 (EP,KR);
H01L2224/04042 (EP);
H01L2224/05016 (EP);
H01L2224/05023 (EP);
H01L2224/05026 (EP);
H01L2224/0508 (EP);
H01L2224/05083 (EP);
H01L2224/05084 (EP);
H01L2224/05094 (EP);
H01L2224/05096 (EP);
H01L2224/05147 (EP);
H01L2224/05155 (EP);
H01L2224/05164 (EP);
H01L2224/05166 (EP);
H01L2224/05181 (EP);
H01L2224/05186 (EP);
H01L2224/05548 (EP);
H01L2224/05558 (EP);
H01L2224/05568 (EP);
H01L2224/05569 (EP);
H01L2224/05644 (EP);
H01L2224/05666 (EP);
H01L2224/11462 (EP);
H01L2224/1147 (EP);
H01L2224/13022 (EP);
H01L2224/13024 (EP);
H01L2224/13026 (KR);
H01L2224/131 (EP);
H01L2224/13147 (EP,KR,US);
H01L2224/13655 (US);
H01L2224/13664 (US);
H01L2224/14505 (US);
H01L2224/16145 (EP);
H01L2224/2101 (US);
H01L2224/215 (US);
H01L2224/45099 (EP);
H01L23/3107 (EP);
H01L23/3192 (EP);
| C-Set: |
H01L2224/0239, H01L2924/01022, H01L2924/01074 (EP);
H01L2224/0239, H01L2924/01047, H01L2924/00014 (EP);
H01L2224/05016, H01L2924/00012 (EP);
H01L2224/05147, H01L2924/00014 (EP);
H01L2224/05155, H01L2924/00014 (EP);
H01L2224/05164, H01L2924/00014 (EP);
H01L2224/05166, H01L2924/01074 (EP);
H01L2224/05181, H01L2924/00014 (EP);
H01L2224/05186, H01L2924/04941 (EP);
H01L2224/05186, H01L2924/04953 (EP);
H01L2224/05558, H01L2924/00014 (EP);
H01L2224/05644, H01L2924/00014 (EP);
H01L2224/05666, H01L2924/01074 (EP);
H01L2224/11462, H01L2924/00014 (EP);
H01L2224/1147, H01L2924/00014 (EP);
H01L2224/13147, H01L2924/00014 (EP); |
Former IPC [2023/14] | H01L21/768 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2023/14] | Title | German: | IC-VORRICHTUNG MIT CHIP-ZU-PAKET-VERBINDUNGEN VON EINER KUPFERMETALL-VERBINDUNGSEBENE | [2023/14] | English: | IC DEVICE WITH CHIP TO PACKAGE INTERCONNECTS FROM A COPPER METAL INTERCONNECT LEVEL | [2023/14] | French: | DISPOSITIF DE CIRCUIT INTÉGRÉ À INTERCONNEXIONS PUCE À BOÎTIER À PARTIR D'UN NIVEAU D'INTERCONNEXION MÉTALLIQUE EN CUIVRE | [2023/14] | Entry into regional phase | 02.01.2023 | National basic fee paid | 02.01.2023 | Search fee paid | 02.01.2023 | Designation fee(s) paid | 02.01.2023 | Examination fee paid | Examination procedure | 02.01.2023 | Examination requested [2023/14] | 16.07.2024 | Amendment by applicant (claims and/or description) | 16.07.2024 | Date on which the examining division has become responsible | Fees paid | Renewal fee | 30.06.2023 | Renewal fee patent year 03 | 01.07.2024 | Renewal fee patent year 04 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]DE10311368 (INFINEON TECHNOLOGIES AG [DE]); | [Y]US2003232496 (KOO KYUNG-BUM [KR]); | [A]US2005260842 (KALTALIOGLU ERDEM [US], et al); | [YA]US2006014320 (YAMANO TAKAHARU [JP], et al); | [YA]US2009115058 (YU HSIU-MEI [TW], et al); | [Y]TW201017848 (INTEL CORP [US]); | [A]CN102420107B (SHANGHAI HUALI MICROELECT CORP); | [Y]US2015001712 (DAUBENSPECK TIMOTHY H [US], et al); | [A]US9196529 (CHEN JIE [TW], et al); | [A]US9716066 (LEE KEVIN J [US], et al) | International search | [A]US2006076678 (KIM SARAH E [US], et al); | [A]US7439170 (DAUBENSPECK TIMOTHY HARRISON [US], et al); | [A]US2011204510 (LIN MOU-SHIUNG [TW], et al); | [A]US2015262866 (MEYER THORSTEN [DE], et al) | by applicant | TW201017848 | US9196529 |