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Extract from the Register of European Patents

EP About this file: EP4260368

EP4260368 - 3D PACKAGING WITH SILICON DIE AS THERMAL SINK FOR HIGH-POWER LOW THERMAL CONDUCTIVITY DIES [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  15.09.2023
Database last updated on 02.11.2024
FormerThe international publication has been made
Status updated on  17.06.2022
Formerunknown
Status updated on  18.02.2022
Most recent event   Tooltip16.02.2024Change: Validation statespublished on 20.03.2024  [2024/12]
16.02.2024Change - extension statespublished on 20.03.2024  [2024/12]
Applicant(s)For all designated states
Qorvo US, Inc.
7628 Thorndike Road
Greensboro, NC 27409 / US
[2023/42]
Inventor(s)01 / MAXIM, George
San Jose, California 95134 / US
02 / COSTA, Julio C.
Greensboro, North Carolina 27409 / US
03 / LEIPOLD, Dirk Robert Walter
San Jose, California 95134 / US
04 / SCOTT, Baker
San Jose, California 95134 / US
 [2023/42]
Representative(s)D Young & Co LLP
3 Noble Street
London EC2V 7BQ / GB
[N/P]
Former [2023/42]D Young & Co LLP
120 Holborn
London EC1N 2DY / GB
Application number, filing date21854899.813.12.2021
[2023/42]
WO2021US63095
Priority number, dateUS202063124450P11.12.2020         Original published format: US 202063124450 P
[2023/42]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2022126017
Date:16.06.2022
Language:EN
[2022/24]
Type: A2 Application without search report 
No.:EP4260368
Date:18.10.2023
Language:EN
The application published by WIPO in one of the EPO official languages on 16.06.2022 takes the place of the publication of the European patent application.
[2023/42]
Search report(s)International search report - published on:EP29.09.2022
ClassificationIPC:H01L25/065, H01L25/03, H01L23/66, H01L23/367, H01Q1/22, H01L23/373, H01L23/31
[2023/42]
CPC:
H01L25/0657 (EP,KR); H01L23/3675 (US); H01L23/3121 (EP,KR);
H01L23/3128 (EP,KR); H01L23/3672 (US); H01L23/3677 (EP,KR);
H01L23/3736 (EP,KR); H01L23/3738 (EP,KR); H01L23/49816 (US);
H01L23/49822 (US); H01L23/66 (EP,KR,US); H01L24/16 (US);
H01L24/32 (US); H01L25/0652 (EP,KR); H01L25/0655 (US);
H01Q1/2283 (EP,KR); H01Q21/065 (EP,KR); H01L2223/6616 (US);
H01L2223/6644 (EP,KR); H01L2223/6677 (EP,KR,US); H01L2224/16146 (US);
H01L2224/16225 (US); H01L2224/32146 (US); H01L2224/32225 (US);
H01L2225/06513 (EP,KR); H01L2225/06517 (EP,KR); H01L2225/06527 (EP,KR);
H01L2225/06541 (EP,KR); H01L2225/06568 (EP,KR); H01L2225/06589 (EP,KR);
H01L25/03 (EP); H01L2924/01031 (US); H01L2924/13051 (US);
H01L2924/13064 (US); H01L2924/15311 (US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/42]
TitleGerman:3D-VERPACKUNG MIT SILICIUMCHIP ALS KÜHLKÖRPER FÜR CHIPS MIT HOHER LEISTUNG UND NIEDRIGER WÄRMELEITFÄHIGKEIT[2023/42]
English:3D PACKAGING WITH SILICON DIE AS THERMAL SINK FOR HIGH-POWER LOW THERMAL CONDUCTIVITY DIES[2023/42]
French:ENCAPSULATION 3D AVEC PUCE EN SILICIUM EN TANT QUE DISSIPATEUR THERMIQUE DE PUCES HAUTE PUISSANCE À FAIBLE CONDUCTIVITÉ THERMIQUE[2023/42]
Entry into regional phase01.06.2023National basic fee paid 
01.06.2023Designation fee(s) paid 
01.06.2023Examination fee paid 
Examination procedure01.06.2023Examination requested  [2023/42]
01.06.2023Date on which the examining division has become responsible
12.01.2024Amendment by applicant (claims and/or description)
Fees paidRenewal fee
19.12.2023Renewal fee patent year 03
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Cited inInternational search[I]US2011186990  (MAWATARI KAZUAKI [JP], et al) [I] 1-7,10,11,19,22 * paragraphs [0010] , [ 0020] , [ 0022] , [ 0026] , [ 0029]; figures 2,3,4 *;
 [Y]US2018061726  (ANDERSON KEVIN J [US], et al) [Y] 16-18* paragraph [0036]; figure 2 *;
 [XYI]US2019067157  (LIN TSUNG-SHU [TW], et al) [X] 1,3-7,11,19,22 * paragraph [0019] - paragraph [0056]; figures 8B,12,14 * [Y] 12-18 [I] 8,9;
 [Y]US2019088634  (TSUKIYAMA SATOSHI [JP], et al) [Y] 12-18 * figure 2 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.