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Extract from the Register of European Patents

EP About this file: EP4275606

EP4275606 - SIGNAL ANALYSIS DEVICE, SIGNAL ANALYSIS METHOD, AND PROGRAM [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  13.10.2023
Database last updated on 18.11.2024
FormerThe international publication has been made
Status updated on  15.07.2022
Most recent event   Tooltip21.09.2024Supplementary search reportpublished on 23.10.2024  [2024/43]
Applicant(s)For all designated states
Nippon Telegraph And Telephone Corporation
5-1, Otemachi 1-chome
Chiyoda-ku
Tokyo 100-8116 / JP
[2023/46]
Inventor(s)01 / TSUKADA, Shingo
Musashino-shi, Tokyo 180-8585 / JP
 [2023/46]
Representative(s)Brevalex
Tour Trinity
1 B Place de la Défense
92400 Courbevoie / FR
[2023/46]
Application number, filing date21917443.006.01.2021
[2023/46]
WO2021JP00209
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2022149215
Date:14.07.2022
Language:JA
[2022/28]
Type: A1 Application with search report 
No.:EP4275606
Date:15.11.2023
Language:EN
[2023/46]
Search report(s)International search report - published on:JP14.07.2022
(Supplementary) European search report - dispatched on:EP20.09.2024
ClassificationIPC:A61B5/346, A61B5/35
[2024/43]
CPC:
A61B5/35 (EP); A61B5/346 (US); A61B5/02028 (US);
A61B5/0245 (US); A61B5/7275 (EP); G16H50/30 (US)
Former IPC [2023/46]A61B5/346
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/46]
TitleGerman:SIGNALANALYSEVORRICHTUNG, SIGNALANALYSEVERFAHREN UND PROGRAMM[2023/46]
English:SIGNAL ANALYSIS DEVICE, SIGNAL ANALYSIS METHOD, AND PROGRAM[2023/46]
French:DISPOSITIF D'ANALYSE DE SIGNAL, PROCÉDÉ D'ANALYSE DE SIGNAL ET PROGRAMME[2023/46]
Entry into regional phase14.06.2023Translation filed 
14.06.2023National basic fee paid 
14.06.2023Search fee paid 
14.06.2023Designation fee(s) paid 
14.06.2023Examination fee paid 
Examination procedure14.06.2023Examination requested  [2023/46]
Fees paidRenewal fee
14.06.2023Renewal fee patent year 03
26.01.2024Renewal fee patent year 04
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Cited inInternational search[Y]JP2018504199  ;
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