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Extract from the Register of European Patents

EP About this file: EP4403362

EP4403362 - FABRICATION SYSTEM [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  20.06.2024
Database last updated on 11.04.2026
FormerThe international publication has been made
Status updated on  25.03.2023
Most recent event   Tooltip21.01.2026The date on which the examining division becomes responsible, has been established 
21.01.2026Amendment by applicant 
Applicant(s)For all designated states
NIKON CORPORATION
15-3, Konan 2-chome
Minato-ku
Tokyo 108-6290 / JP
[2024/30]
Inventor(s)01 / FUNATSU, Takayuki
Tokyo 108-6290 / JP
02 / TANAKA, Koji
Tokyo 108-6290 / JP
03 / UENO, Kazuki
Tokyo 108-6290 / JP
 [2024/30]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastraße 30
81925 München / DE
[2024/30]
Application number, filing date21957522.216.09.2021
[2024/30]
WO2021JP34121
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2023042341
Date:23.03.2023
Language:JA
[2023/12]
Type: A1 Application with search report 
No.:EP4403362
Date:24.07.2024
Language:EN
[2024/30]
Search report(s)International search report - published on:JP23.03.2023
(Supplementary) European search report - dispatched on:EP16.07.2025
ClassificationIPC:B22F10/25, B33Y10/00, B33Y30/00, B33Y50/02, B29C64/277, B22F10/38, B22F12/45, B22F12/49, B22F10/366, B22F10/368, B23K26/082, B23K26/342, B29C64/268, B29C64/393, B29C64/135, B29C64/153, // B22F12/43, B22F12/53
[2025/33]
CPC:
B33Y10/00 (EP); B23K26/342 (EP,US); B22F10/25 (EP);
B22F10/366 (EP); B22F10/368 (EP); B22F12/45 (EP);
B22F12/49 (EP); B23K26/0643 (US); B23K26/082 (EP);
B29C64/135 (EP); B29C64/153 (EP); B29C64/268 (EP);
B29C64/277 (EP); B29C64/393 (EP); B33Y30/00 (EP);
B33Y50/02 (EP); B22F12/43 (EP); B22F12/53 (EP) (-)
Former IPC [2024/30]B33Y10/00, B33Y30/00, B29C64/277, B22F10/25, B22F10/38, B22F12/45, B22F12/49
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2024/30]
TitleGerman:HERSTELLUNGSSYSTEM[2024/30]
English:FABRICATION SYSTEM[2024/30]
French:SYSTÈME DE FABRICATION[2024/30]
Entry into regional phase10.04.2024Translation filed 
10.04.2024National basic fee paid 
10.04.2024Search fee paid 
10.04.2024Designation fee(s) paid 
10.04.2024Examination fee paid 
Examination procedure10.04.2024Examination requested  [2024/30]
19.01.2026Amendment by applicant (claims and/or description)
19.01.2026Date on which the examining division has become responsible
Fees paidRenewal fee
10.04.2024Renewal fee patent year 03
13.08.2024Renewal fee patent year 04
13.08.2025Renewal fee patent year 05
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XYIA] EP3725453  (NIKON CORP et al.) [X] 1-4,6-8,25 * paragraph [0037] * * paragraph [0092] * * paragraph [0148] - paragraph [0151] * * paragraph [0196] - paragraph [0200] * * paragraph [0208] - paragraph [0212] * * paragraph [0223] * * paragraph [0225] * * claims 1,11,14,46,48,52 * * figures 1,53,55 *[Y] 5 [I] 15-18 [A] 9,19-24
 [Y] WO2021150691  (IPG PHOTONICS CORP et al.) [Y] 5 * claim 1 * * figures 1,4 *
 [A] US2018333807  (HASEGAWA KAZUO et al.) [A] 1-15 * paragraph [0080] * * paragraph [0088] * * claims 1,8 * * figure 6 *
International search[YX] JP2020531321  (ゼネラル・エレクトリック・カンパニイ) [Y] 43-68, 113 [X] 1-42, 69-97, 109-112, 114
 [YX] JP2019507236  (ヴェロ・スリー・ディー・インコーポレイテッド) [Y] 43-68, 113 [X] 1-42, 69-97, 109-112, 114
 [YX] JP2020084195  (JTEKT CORP et al.) [Y] 43-68, 98-108, 113 [X] 89-97
 [Y] JP2019143224  (JTEKT CORP et al.) [Y] 43-68, 98-108, 113 * paragraph [0018] *
 [Y] JP2021066930  (UNIV TOKYO et al.) [Y] 43-68, 98-108, 113 * paragraph [0027] *
by applicantUS2019168499
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.