EP4105964 - MASS SPECTRUM PROCESSING DEVICE AND MASS SPECTRUM PROCESSING METHOD [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 12.05.2023 Database last updated on 22.08.2024 | |
Former | The application has been published Status updated on 18.11.2022 | Most recent event Tooltip | 02.04.2024 | New entry: Renewal fee paid | Applicant(s) | For all designated states Jeol Ltd. 3-1-2 Musashino Akishima-shi, Tokyo 196-8558 / JP | [2022/51] | Inventor(s) | 01 /
SATOH, Takaya Tokyo, 196-8558 / JP | [2022/51] | Representative(s) | Boult Wade Tennant LLP Salisbury Square House 8 Salisbury Square London EC4Y 8AP / GB | [2022/51] | Application number, filing date | 22178480.4 | 10.06.2022 | [2022/51] | Priority number, date | JP20210101754 | 18.06.2021 Original published format: JP 2021101754 | [2022/51] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP4105964 | Date: | 21.12.2022 | Language: | EN | [2022/51] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 31.10.2022 | Classification | IPC: | H01J49/00 | [2022/51] | CPC: |
H01J49/0036 (EP,US);
H01J49/0009 (US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2023/24] |
Former [2022/51] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Extension states | BA | Not yet paid | ME | Not yet paid | Validation states | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | MASSENSPEKTRUM-VERARBEITUNGSVORRICHTUNG UND MASSENSPEKTRUM-VERARBEITUNGSVERFAHREN | [2022/51] | English: | MASS SPECTRUM PROCESSING DEVICE AND MASS SPECTRUM PROCESSING METHOD | [2022/51] | French: | DISPOSITIF DE TRAITEMENT DU SPECTRE DE MASSE ET PROCÉDÉ DE TRAITEMENT DU SPECTRE DE MASSE | [2022/51] | Examination procedure | 10.05.2023 | Amendment by applicant (claims and/or description) | 10.05.2023 | Examination requested [2023/24] | 10.05.2023 | Date on which the examining division has become responsible | Fees paid | Renewal fee | 31.03.2024 | Renewal fee patent year 03 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [AD]JP2020008314 (JEOL LTD) [AD] 1-13* figure 6 *; | [I] - FOUQUET THIERRY ET AL, "First Gut Instincts Are Always Right: The Resolution Required for a Mass Defect Analysis of Polymer Ions Can Be as Low as Oligomeric", ANALYTICAL CHEMISTRY, US, vol. 90, no. 4, doi:10.1021/acs.analchem.7b04518, ISSN 0003-2700, (20180130), pages 2404 - 2408, URL: https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.7b04518, XP055972544 [I] 1-13 * page 2404, column left, line 19 * * page 2405, column left * * page 2406, column right * * figures 1, 2 * * equations (1)-(4) * DOI: http://dx.doi.org/10.1021/acs.analchem.7b04518 | [I] - ISHITSUKA KEI ET AL, "An arsenal of tools based on Kendrick mass defects to process congested electrospray ionization high-resolution mass spectra of polymers with multiple charging", RAPID COMMUNICATIONS IN MASS SPECTROMETRY, GB, vol. 34, no. S2, doi:10.1002/rcm.8584, ISSN 0951-4198, (20190913), URL: https://onlinelibrary.wiley.com/doi/full-xml/10.1002/rcm.8584, XP055972505 [I] 1-13 * paragraph [02.3] * * figures 4, 5 * * page 7, column right, lines 8-11 * DOI: http://dx.doi.org/10.1002/rcm.8584 | [A] - FOUQUET THIERRY N.J., "The Kendrick analysis for polymer mass spectrometry", JOURNAL OF MASS SPECTROMETRY, GB, vol. 54, no. 12, doi:10.1002/jms.4480, ISSN 1076-5174, (20191201), pages 933 - 947, URL: https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fjms.4480, XP055972560 [A] 1-13 * page 936, column right, paragraph last * * the whole document * DOI: http://dx.doi.org/10.1002/jms.4480 | [A] - FOUQUET THIERRY N ET AL, "On the Kendrick Mass Defect Plots of Multiply Charged Polymer Ions: Splits, Misalignments, and How to Correct Them", JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, ELSEVIER SCIENCE INC, US, vol. 29, no. 8, doi:10.1007/S13361-018-1972-4, ISSN 1044-0305, (20180511), pages 1611 - 1626, (20180511), XP036779491 [A] 1-13 * the whole document * DOI: http://dx.doi.org/10.1007/s13361-018-1972-4 | by applicant | JP2017090228 | JP2019128188 | JP2020008314 |