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Extract from the Register of European Patents

EP About this file: EP4148681

EP4148681 - SCATTER DIAGRAM DISPLAY DEVICE, SCATTER DIAGRAM DISPLAY METHOD, AND ANALYZER [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  08.09.2023
Database last updated on 18.11.2024
FormerThe application has been published
Status updated on  10.02.2023
Most recent event   Tooltip28.08.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Jeol Ltd.
3-1-2 Musashino
Akishima, Tokyo 196-8558 / JP
[2023/11]
Inventor(s)01 / KATO, Naoki
Tokyo, 196-8558 / JP
02 / KIMURA, Takashi
Tokyo, 196-8558 / JP
03 / TSUKAMOTO, Kazunori
Tokyo, 196-8558 / JP
 [2023/11]
Representative(s)Boult Wade Tennant LLP
Salisbury Square House
8 Salisbury Square
London EC4Y 8AP / GB
[2023/11]
Application number, filing date22192172.925.08.2022
[2023/11]
Priority number, dateJP2021014753810.09.2021         Original published format: JP 2021147538
[2023/11]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP4148681
Date:15.03.2023
Language:EN
[2023/11]
Search report(s)(Supplementary) European search report - dispatched on:EP07.02.2023
ClassificationIPC:G06T11/20, G06F3/0484
[2023/11]
CPC:
G06T11/206 (EP); G01N23/2252 (US); G06F3/0482 (EP);
G06F3/0484 (EP); G01N2223/402 (US); G01N2223/605 (US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/41]
Former [2023/11]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:STREUDIAGRAMMANZEIGEVORRICHTUNG, STREUDIAGRAMMANZEIGEVERFAHREN UND ANALYSATOR[2023/11]
English:SCATTER DIAGRAM DISPLAY DEVICE, SCATTER DIAGRAM DISPLAY METHOD, AND ANALYZER[2023/11]
French:DISPOSITIF D'AFFICHAGE DE DIAGRAMME DE DISPERSION, PROCÉDÉ D'AFFICHAGE DE DIAGRAMME DE DISPERSION, ET ANALYSEUR[2023/11]
Examination procedure07.09.2023Amendment by applicant (claims and/or description)
07.09.2023Examination requested  [2023/41]
07.09.2023Date on which the examining division has become responsible
Fees paidRenewal fee
27.08.2024Renewal fee patent year 03
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Documents cited:Search[Y]JP2011153858  (SHIMADZU CORP) [Y] 6 * paragraph [0001] - paragraph [0028] * * figures 1-4,10 *;
 [AD]US2016110896  (MORI NORIHISA [JP], et al) [AD] 1-11* the whole document *;
 [XYI]  - XIN YAN ET AL, "A Work-Centered Visual Analytics Model to Support Engineering Design with Interactive Visualization and Data-Mining", SYSTEM SCIENCE (HICSS), 2012 45TH HAWAII INTERNATIONAL CONFERENCE ON, IEEE, (20120104), doi:10.1109/HICSS.2012.87, ISBN 978-1-4577-1925-7, pages 1845 - 1854, XP032113969 [X] 1-3,7-11 * abstract * * sections 4, 5 * * figures 2, 3 * [Y] 6 [I] 4,5

DOI:   http://dx.doi.org/10.1109/HICSS.2012.87
by applicantJP2016080575
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.