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Extract from the Register of European Patents

EP About this file: EP4282336

EP4282336 - SCANNING IMAGING SYSTEM AND METHOD BASED ON SLIT X-RAYS [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  27.10.2023
Database last updated on 31.08.2024
FormerThe international publication has been made
Status updated on  29.07.2022
Most recent event   Tooltip29.03.2024Change: Validation statespublished on 01.05.2024  [2024/18]
29.03.2024Change - extension statespublished on 01.05.2024  [2024/18]
Applicant(s)For all designated states
Shanghai Taoimage Medical Technology Co., Ltd.
Room 405-2, Floor 4, Building 9
No. 1206, Zhangjiang Road
China (Shanghai) Pilot Free Trade Zone
Pudong New District
Shanghai 201210 / CN
[2023/48]
Inventor(s)01 / TSAI, Tsungyuan
Shanghai 201204 / CN
02 / DAI, Xingwu
Shanghai 201204 / CN
03 / ZHONG, Jinbing
Shanghai 201204 / CN
 [2023/48]
Representative(s)Argyma
14 Boulevard de Strasbourg
31000 Toulouse / FR
[2023/48]
Application number, filing date22742016.305.01.2022
[2023/48]
WO2022CN70326
Priority number, dateCN2021109358122.01.2021         Original published format: CN202110093581
CN202120181258U22.01.2021         Original published format: CN 202120181258 U
[2023/48]
Filing languageZH
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2022156537
Date:28.07.2022
Language:ZH
[2022/30]
Type: A1 Application with search report 
No.:EP4282336
Date:29.11.2023
Language:EN
[2023/48]
Search report(s)International search report - published on:CN28.07.2022
ClassificationIPC:A61B6/00, G06T3/40
[2023/48]
CPC:
A61B6/5241 (EP,US); A61B6/547 (EP,US); A61B6/06 (EP,US);
A61B6/5205 (US); A61B6/54 (EP); A61B6/582 (US);
A61B6/505 (EP); A61B6/587 (EP) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/48]
TitleGerman:ABTASTENDES ABBILDUNGSSYSTEM UND VERFAHREN AUF DER BASIS VON SPALTRÖNTGENSTRAHLEN[2023/48]
English:SCANNING IMAGING SYSTEM AND METHOD BASED ON SLIT X-RAYS[2023/48]
French:SYSTÈME ET PROCÉDÉ D'IMAGERIE À BALAYAGE BASÉS SUR DES RAYONS X FENDUS[2023/48]
Entry into regional phase18.08.2023Translation filed 
18.08.2023National basic fee paid 
18.08.2023Search fee paid 
18.08.2023Designation fee(s) paid 
18.08.2023Examination fee paid 
Examination procedure18.08.2023Examination requested  [2023/48]
Fees paidRenewal fee
18.08.2023Renewal fee patent year 03
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Cited inInternational search[A]CN1684629  (SIEMENS AG [DE]);
 [A]CN2879977Y  (YU HONGLIN [CN]);
 [A]CN102124320  (SURGIX LTD);
 [Y]US2013058459  (DESAUTE PASCAL [FR]);
 [Y]CN105405101  (SHANGHAI UNITED IMAGING HEALTHCARE CO LTD);
 [A]WO2018096208  (NOKIA TECHNOLOGIES OY [FI])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.