EP4282336 - SCANNING IMAGING SYSTEM AND METHOD BASED ON SLIT X-RAYS [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 27.10.2023 Database last updated on 31.08.2024 | |
Former | The international publication has been made Status updated on 29.07.2022 | Most recent event Tooltip | 29.03.2024 | Change: Validation states | published on 01.05.2024 [2024/18] | 29.03.2024 | Change - extension states | published on 01.05.2024 [2024/18] | Applicant(s) | For all designated states Shanghai Taoimage Medical Technology Co., Ltd. Room 405-2, Floor 4, Building 9 No. 1206, Zhangjiang Road China (Shanghai) Pilot Free Trade Zone Pudong New District Shanghai 201210 / CN | [2023/48] | Inventor(s) | 01 /
TSAI, Tsungyuan Shanghai 201204 / CN | 02 /
DAI, Xingwu Shanghai 201204 / CN | 03 /
ZHONG, Jinbing Shanghai 201204 / CN | [2023/48] | Representative(s) | Argyma 14 Boulevard de Strasbourg 31000 Toulouse / FR | [2023/48] | Application number, filing date | 22742016.3 | 05.01.2022 | [2023/48] | WO2022CN70326 | Priority number, date | CN20211093581 | 22.01.2021 Original published format: CN202110093581 | CN202120181258U | 22.01.2021 Original published format: CN 202120181258 U | [2023/48] | Filing language | ZH | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2022156537 | Date: | 28.07.2022 | Language: | ZH | [2022/30] | Type: | A1 Application with search report | No.: | EP4282336 | Date: | 29.11.2023 | Language: | EN | [2023/48] | Search report(s) | International search report - published on: | CN | 28.07.2022 | Classification | IPC: | A61B6/00, G06T3/40 | [2023/48] | CPC: |
A61B6/5241 (EP,US);
A61B6/547 (EP,US);
A61B6/06 (EP,US);
A61B6/5205 (US);
A61B6/54 (EP);
A61B6/582 (US);
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2023/48] | Title | German: | ABTASTENDES ABBILDUNGSSYSTEM UND VERFAHREN AUF DER BASIS VON SPALTRÖNTGENSTRAHLEN | [2023/48] | English: | SCANNING IMAGING SYSTEM AND METHOD BASED ON SLIT X-RAYS | [2023/48] | French: | SYSTÈME ET PROCÉDÉ D'IMAGERIE À BALAYAGE BASÉS SUR DES RAYONS X FENDUS | [2023/48] | Entry into regional phase | 18.08.2023 | Translation filed | 18.08.2023 | National basic fee paid | 18.08.2023 | Search fee paid | 18.08.2023 | Designation fee(s) paid | 18.08.2023 | Examination fee paid | Examination procedure | 18.08.2023 | Examination requested [2023/48] | Fees paid | Renewal fee | 18.08.2023 | Renewal fee patent year 03 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [A]CN1684629 (SIEMENS AG [DE]); | [A]CN2879977Y (YU HONGLIN [CN]); | [A]CN102124320 (SURGIX LTD); | [Y]US2013058459 (DESAUTE PASCAL [FR]); | [Y]CN105405101 (SHANGHAI UNITED IMAGING HEALTHCARE CO LTD); | [A]WO2018096208 (NOKIA TECHNOLOGIES OY [FI]) |