| Cited in | International search | Type: | Non-patent literature | Publication information: | [XYI] CATT: "Discussion on RRM relaxations for RRC_CONNECTED", vol. RAN WG2, no. electronic; 20210816 - 20210827, 6 August 2021 (2021-08-06), XP052035035, Retrieved from the Internet [retrieved on 20210806] [X] 1-4,11-15 *Chapter 2 Discussion*[Y] 6,8 [I] 5,7,9,10 | Type: | Non-patent literature | Publication information: | [YA] QUALCOMM INCORPORATED: "RRM measurement relaxation for stationary UEs", vol. RAN WG2, no. Online; 20210412 - 20210416, 2 April 2021 (2021-04-02), XP052174310, Retrieved from the Internet [retrieved on 20210402] [Y] 6 *Chapter 2 Discussion*[A] 1,10-15 | Type: | Non-patent literature | Publication information: | [YA] HUAWEI ET AL: "RRM measurement relaxation for REDCAP UE", vol. RAN WG2, no. electronic; 20200817 - 20200828, 7 August 2020 (2020-08-07), XP051912115, Retrieved from the Internet [retrieved on 20200807] [Y] 8 *Chapter 2.2 Discussion on RRM relaxation*[A] 1,11-15 | Type: | Non-patent literature | Publication information: | [I] KDDI CORPORATION: "RRM relaxation for Redcap UE", vol. RAN WG2, no. Online; 20210816 - 20210827, 10 August 2021 (2021-08-10), XP052042877, Retrieved from the Internet [retrieved on 20210810] [I] 1-3,11-15 *Chapter 2 Discussion* | Type: | Non-patent literature | Publication information: | [I] LG ELECTRONICS INC: "Remaining issues in RRM relaxation in RRC_CONNECTED", vol. RAN WG2, no. Online; 20210816 - 20210827, 6 August 2021 (2021-08-06), XP052034459, Retrieved from the Internet [retrieved on 20210806] [I] 1,11-15 *Chapter 2 Discussion* | Type: | Non-patent literature | Publication information: | [I] NOKIA ET AL: "On RRM relaxations in CONNECTED", vol. RAN WG2, no. Electronic; 20210816 - 20210827, 5 August 2021 (2021-08-05), XP052032512, Retrieved from the Internet [retrieved on 20210805] [I] 1,11-15 *Chapter 2 Discussion* |
