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Extract from the Register of European Patents

EP About this file: EP4254499

EP4254499 - DOUBLE IO PAD CELL INCLUDING ELECTROSTATIC DISCHARGE PROTECTION SCHEME WITH REDUCED LATCH-UP RISK [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  12.04.2024
Database last updated on 14.09.2024
FormerThe application has been published
Status updated on  01.09.2023
Most recent event   Tooltip12.04.2024The date on which the examining division becomes responsible, has been established 
12.04.2024Request for examination filedpublished on 15.05.2024  [2024/20]
12.04.2024Change - designated statespublished on 15.05.2024  [2024/20]
Applicant(s)For all designated states
NXP B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
[2023/40]
Inventor(s)01 / Stockinger, Michael A.
5656AG Eindhoven / NL
02 / Moosa, Mohamed Suleman
5656AG Eindhoven / NL
 [2023/40]
Representative(s)Miles, John Richard
NXP SEMICONDUCTORS
Intellectual Property Group
Abbey House
25 Clarendon Road
Redhill, Surrey RH1 1QZ / GB
[2023/40]
Application number, filing date23163111.021.03.2023
[2023/40]
Priority number, dateUS20221770258823.03.2022         Original published format: US202217702588
[2023/40]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP4254499
Date:04.10.2023
Language:EN
[2023/40]
Search report(s)(Supplementary) European search report - dispatched on:EP31.08.2023
ClassificationIPC:H01L27/02
[2023/40]
CPC:
H01L27/0255 (EP,US); H01L27/0292 (EP,US); H01L27/0296 (EP,US);
H02H9/046 (US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   ME,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2024/20]
Former [2023/40]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  ME,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:DOPPEL-IO-PAD-ZELLE MIT SCHUTZSCHEMA GEGEN ELEKTROSTATISCHE ENTLADUNG MIT REDUZIERTEM LATCH-UP-RISIKO[2023/40]
English:DOUBLE IO PAD CELL INCLUDING ELECTROSTATIC DISCHARGE PROTECTION SCHEME WITH REDUCED LATCH-UP RISK[2023/40]
French:CELLULE À DOUBLE TAMPON IO COMPRENANT UN SCHÉMA DE PROTECTION CONTRE LES DÉCHARGES ÉLECTROSTATIQUES À RISQUE DE VERROUILLAGE RÉDUIT[2023/40]
Examination procedure31.10.2023Amendment by applicant (claims and/or description)
04.04.2024Examination requested  [2024/20]
04.04.2024Date on which the examining division has become responsible
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Documents cited:Search[A]US2002130390  (KER MING-DOU [TW], et al);
 [I]US7579632  (SALIH ALI [US], et al);
 [A]US9607976  (NAKAISO TOSHIYUKI [JP], et al);
 [I]US11276688  (SHUKLA VRASHANK GURUDATTA [US], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.