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EP4343340
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EP About this file: EP4343340
| EP4343340 - SYSTEMS, METHODS, AND APPARATUSES FOR NON-CONTACT VOLTAGE DETECTION [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 23.02.2024 Database last updated on 02.08.2024 | Most recent event Tooltip | 08.05.2024 | The date on which the examining division becomes responsible, has been established | 08.05.2024 | Amendment by applicant | Applicant(s) | For all designated states Honeywell International Inc. 855 S. Mint Street Charlotte, NC 28202 / US | [2024/13] | Inventor(s) | 01 /
KOTHARI, Sanjay Charlotte, 28202 / US | [2024/13] | Representative(s) | Haseltine Lake Kempner LLP Cheapside House 138 Cheapside London EC2V 6BJ / GB | [2024/13] | Application number, filing date | 23192589.2 | 22.08.2023 | [2024/13] | Priority number, date | IN202211055081 | 26.09.2022 Original published format: IN202211055081 | [2024/13] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP4343340 | Date: | 27.03.2024 | Language: | EN | [2024/13] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 02.02.2024 | Classification | IPC: | G01R15/16 | [2024/13] | CPC: |
G01R15/16 (EP,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, ME, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2024/13] | Extension states | BA | Not yet paid | Validation states | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | SYSTEME, VERFAHREN UND VORRICHTUNGEN ZUR KONTAKTLOSEN SPANNUNGSDETEKTION | [2024/13] | English: | SYSTEMS, METHODS, AND APPARATUSES FOR NON-CONTACT VOLTAGE DETECTION | [2024/13] | French: | SYSTÈMES, PROCÉDÉS ET APPAREILS DE DÉTECTION DE TENSION SANS CONTACT | [2024/13] | Examination procedure | 22.08.2023 | Examination requested [2024/13] | 07.05.2024 | Amendment by applicant (claims and/or description) | 07.05.2024 | Date on which the examining division has become responsible |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US2016109486 (YANAGISAWA KOICHI [JP]) [A] 1-15 * the whole document *; | [A]US2017082664 (YAMADA HIROSHI [JP]) [A] 1-15 * the whole document *; | [A]WO2017168608 (HITACHI SYSTEMS LTD [JP]) [A] 1-15* the whole document *; | [Y]EP3567380 (FLUKE CORP [US]) [Y] 1-15 * paragraph [0025] - paragraph [0043]; figures 2-3 *; | [A]US2022050129 (MORRIS DARRELL [AU], et al) [A] 1-15 * the whole document *; | [Y] - TEYMOORI M. M. ET AL, "A Tunable Capacitor Based on MEMS Technology for RF Applications", TECHNOLOGY & APPLIED SCIENCE RESEARCH, vol. 6, no. 3, doi:10.48084/etasr.679, ISSN 2241-4487, (20160601), pages 982 - 986, URL: https://www.researchgate.net/publication/346747632_A_Tunable_Capacitor_Based_on_MEMS_Technology_for_RF_Applications/fulltext/604277684585154e8c789e5d/A-Tunable-Capacitor-Based-on-MEMS-Technology-for-RF-Applications.pdf, XP093120624 [Y] 1-15 * the whole document * DOI: http://dx.doi.org/10.48084/etasr.679 |