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Extract from the Register of European Patents

EP About this file: EP0016177

EP0016177 - HYBRID SIGNATURE TEST METHOD AND APPARATUS [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  11.11.1980
Database last updated on 11.09.2024
Most recent event   Tooltip07.07.2007Change - inventorpublished on 08.08.2007  [2007/32]
Applicant(s)For all designated states
FLUKE TRENDAR CORPORATION
630 Clyde Avenue
Mountain View, CA 94043 / US
[1980/20]
Inventor(s)01 / LAM, Tim Yee
970 Erica Drive
Sunnyvale, Ca 94086 / US
02 / Saper, Barry Morton
25733 Vinedo Lane
Los Altos Hills, CA 94022 / US
[1980/20]
Application number, filing date79900948.530.07.1979
[1980/20]
WO1979US00556
Priority number, dateUS1978093301911.08.1978         Original published format: US 933019
[1980/20]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO8000375
Date:03.04.1980
[1980/07]
Type: A1 Application with search report 
No.:EP0016177
Date:01.10.1980
Language:EN
The application published by WIPO in one of the EPO official languages on 03.04.1980 takes the place of the publication of the European patent application.
[1980/20]
ClassificationIPC:G01R31/26, G06F11/00
[1980/20]
CPC:
G01R31/318385 (EP,US); G01R31/3193 (EP,US); G06F11/277 (EP,US);
G06F2201/83 (EP,US)
Designated contracting statesDE,   FR,   GB,   SE [1980/20]
TitleGerman:VERFAHREN UND VORRICHTUNG FÜR EINEN HYBRIDEN SIGNALZEICHENTEST[1980/20]
English:HYBRID SIGNATURE TEST METHOD AND APPARATUS[1980/20]
French:METHODE ET APPAREIL D'ESSAI A SIGNATURE HYBRIDE[1980/20]
File destroyed:12.02.1989
Examination procedure04.08.1980Despatch of communication that the application is deemed to be withdrawn, reason: filing fee / search fee not paid in time  [1981/02]
16.10.1980Application deemed to be withdrawn, date of legal effect  [1981/02]
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[A]US3924181  (ALDERSON GARY E);
 [A]US3976864  (GORDON GARY B, et al);
 [A]US4059749  (FEILCHENFELD MICHAL M);
 [AT]US4139147  (FRANKE ROBERT H)
 [A]  - IEEE Transactions on Computers, issued January 1978, JOHN P. HAYES, Generation of Optimal Transition Count Testssee pages 36 to 41.
 [A]  - Electronics, issued 3 March 1977, Gordon and Nadig, Hexadecimal Signatures Identify Troublespots in Microprocessor Systemssee pages 89 to 96.
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.