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EP0023574
European procedure
Extract from the Register of European Patents
EP About this file: EP0023574
| EP0023574 - Opto-electronic system for automatically testing the quality of printed-circuit boards, their intermediate products and printing tools [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 07.08.1985 Database last updated on 27.07.2024 | Most recent event Tooltip | 07.08.1985 | No opposition filed within time limit | published on 09.10.1985 [1985/41] | Applicant(s) | For all designated states SIEMENS AKTIENGESELLSCHAFT Werner-von-Siemens-Str. 1 DE-80333 München / DE | [N/P] |
| Former [1981/06] | For all designated states SIEMENS AKTIENGESELLSCHAFT Wittelsbacherplatz 2 D-80333 München / DE | Inventor(s) | 01 /
Doemens, Günter, Dr. Föchingerstrasse 4 D-8150 Holzkirchen / DE | 02 /
Hendricks, Ulrich, Dipl.-Ing. Josef-Doll-Strasse 18 D-8021 Neuried / DE | 03 /
Schneider, Richard, Dr. Leonhardiweg 21 D-8024 Oberhaching / DE | 04 /
Wild, Karl, Dipl.-Ing. Inninger Strasse 27 D-8900 Augsburg / DE | [1981/06] | Application number, filing date | 80103746.6 | 01.07.1980 | [1981/06] | Priority number, date | DE19792929846 | 23.07.1979 Original published format: DE 2929846 | [1981/06] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | EP0023574 | Date: | 11.02.1981 | Language: | DE | [1981/06] | Type: | B1 Patent specification | No.: | EP0023574 | Date: | 10.10.1984 | Language: | DE | [1984/41] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 28.11.1980 | Classification | IPC: | G01R31/28, G01B9/02, G06K9/00, G06K9/46, H01L21/66 | [1981/06] | CPC: |
G01R31/309 (EP,US);
G01R31/2806 (EP,US);
G06T7/001 (EP,US);
G06T2207/30141 (EP,US)
| Designated contracting states | AT, BE, CH, GB, LI, SE [1981/06] | Title | German: | Opto-elektronisches Prüfsystem zur automatischen Beschaffenheitsprüfung von Leiterplatten, deren Zwischenprodukte und Druckwerkzeuge | [1981/06] | English: | Opto-electronic system for automatically testing the quality of printed-circuit boards, their intermediate products and printing tools | [1981/06] | French: | Dispositif opto-électronique d'essai pour l'inspection automatique de la qualité de plaquettes à circuit imprimé, de leurs produits intermédiaires et des outils à imprimer | [1981/06] | File destroyed: | 15.01.2000 | Examination procedure | 13.07.1981 | Examination requested [1981/38] | 17.05.1982 | Despatch of a communication from the examining division (Time limit: M04) | 17.09.1982 | Reply to a communication from the examining division | 09.02.1983 | Despatch of a communication from the examining division (Time limit: M02) | 21.02.1983 | Reply to a communication from the examining division | 28.06.1983 | Despatch of a communication from the examining division (Time limit: M02) | 15.07.1983 | Reply to a communication from the examining division | 14.10.1983 | Despatch of communication of intention to grant (Approval: ) | 05.01.1984 | Communication of intention to grant the patent | 27.01.1984 | Fee for grant paid | 27.01.1984 | Fee for publishing/printing paid | Opposition(s) | 11.07.1985 | No opposition filed within time limit [1985/41] | Fees paid | Renewal fee | 27.07.1982 | Renewal fee patent year 03 | 29.06.1983 | Renewal fee patent year 04 | 26.07.1984 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | DE2629097 [ ] (IBM); | DE2805754 [ ] (DANIELSSON PER ERIK PROF) | [ ] - PROCEEDINGS OF THE FOURTH INTERNATIONAL JOINT CONFERENCE ON PATTERN RECOGNITION, 7-10 November 1978 Kyoto, Japan N. GOTO et al. "An Automatic Inspection System for Mask Patterns" Seiten 970 bis 974. |