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EP0024679
European procedure
Extract from the Register of European Patents
EP About this file: EP0024679
| EP0024679 - Selective gas sensor with great sensitivity and stability for determining and measuring the degree of air pollution on the basis of metal oxide semiconductors [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 01.04.1984 Database last updated on 03.09.2024 | Most recent event Tooltip | 01.04.1984 | No opposition filed within time limit | published on 06.06.1984 [1984/23] | Applicant(s) | For all designated states SIEMENS AKTIENGESELLSCHAFT Werner-von-Siemens-Str. 1 DE-80333 München / DE | [N/P] |
| Former [1981/10] | For all designated states SIEMENS AKTIENGESELLSCHAFT Wittelsbacherplatz 2 D-80333 München / DE | Inventor(s) | 01 /
Treitinger, Ludwig, Dr. Kolbensteiner Strasse 25 D-8000 München 90 / DE | [1981/10] | Application number, filing date | 80104928.9 | 19.08.1980 | [1981/10] | Priority number, date | DE19792933971 | 22.08.1979 Original published format: DE 2933971 | [1981/10] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | EP0024679 | Date: | 11.03.1981 | Language: | DE | [1981/10] | Type: | B1 Patent specification | No.: | EP0024679 | Date: | 18.05.1983 | Language: | DE | [1983/20] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 14.11.1980 | Classification | IPC: | G01N27/12 | [1981/10] | CPC: |
G01N27/125 (EP)
| Designated contracting states | AT, BE, CH, FR, GB, IT, LI, NL, SE [1981/10] | Title | German: | Selektiver Gassensor hoher Empfindlichkeit und Stabilität zum Nachweis und zur Messung des Verunreinigungsgehaltes von Luft auf der Basis von Metalloxidhalbleitern | [1981/10] | English: | Selective gas sensor with great sensitivity and stability for determining and measuring the degree of air pollution on the basis of metal oxide semiconductors | [1981/10] | French: | Détecteur de gaz sélectif à haute sensibilité et stabilité pour identifier et mesurer le contenu en impuretés de l'air en se basant sur les oxydes métalliques semi-conducteurs | [1981/10] | Examination procedure | 24.11.1980 | Examination requested [1981/10] | 03.09.1981 | Despatch of a communication from the examining division (Time limit: M04) | 11.11.1981 | Reply to a communication from the examining division | 09.02.1982 | Despatch of a communication from the examining division (Time limit: M04) | 07.05.1982 | Reply to a communication from the examining division | 23.08.1982 | Despatch of communication of intention to grant (Approval: ) | 16.11.1982 | Communication of intention to grant the patent | 22.11.1982 | Fee for grant paid | 22.11.1982 | Fee for publishing/printing paid | Opposition(s) | 21.02.1984 | No opposition filed within time limit [1984/22] | Fees paid | Renewal fee | 26.08.1982 | Renewal fee patent year 03 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | US3695848 [ ] (TAGUCHI NAOYOSHI); | DE2254977 [ ] (OMRON TATEISI ELECTRONICS CO); | US4045764 [ ] (ICHINOSE NOBORU, et al); | US4045178 [ ] (OKINAKA HIDEYUKI, et al); | GB1500320 [ ] (HITACHI HEATING APPL); | DE2735222 [ ] (SIEMENS AG); | GB2003273 [ ] (FUJI ELECTRIC CO LTD) |