| Cited in | Search | Type: | Non-patent literature | Publication information: | ELECTRONIC DESIGN, Vol. 26, No. 11, May 1978, page 37 Rochelle Park, U.S.A. "Alpha particles may be cause of soft errors in memory" * Paragraph 6 * | Type: | Non-patent literature | Publication information: | ELECTRONICS, Vol. 51, No. 12, June 1978, pages 42, 43 New York, U.S.A. "Dynamic memories racked by radiation" * Page 42, column 3, lines 12-21 * | Type: | Non-patent literature | Publication information: | 17th ANNUAL PROCEEDINGS RELIABILITY PHYSICS 1979, 24th-26th April 1979, pages 13-22 San Francisco, California E.S.M. MEIERAN et al.: "Measurement of alpha particle radioactivity in IC device packages" * Page 20: "Discussion" * |
