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Extract from the Register of European Patents

EP About this file: EP0024222

EP0024222 - Process of manufacturing a field-effect transistor with self-aligned SCHOTTKY-Gate [Right-click to bookmark this link]
Former [1981/08]Field effect transistor with a self-aligned Schottky gate and process for its manufacture
[1983/46]
StatusNo opposition filed within time limit
Status updated on  20.09.1984
Database last updated on 14.09.2024
Most recent event   Tooltip20.09.1984No opposition filed within time limitpublished on 21.11.1984 [1984/47]
Applicant(s)For all designated states
THOMSON-CSF
173, Boulevard Haussmann
F-75008 Paris / FR
[1982/21]
Former [1981/08]For all designated states
THOMSON-CSF
173, Boulevard Haussmann
F-75008 Paris / FR
Inventor(s)01 / Tonnel, Eugène
"THOMSON - CSF"- SCPI 173, Bld Haussmann
F-75360 Paris Cedex 08 / FR
[1981/08]
Representative(s)de Beaumont, Michel, et al
Thomson-CSF Propriété Intellectuelle
92045 Paris La Défense Cédex 67 / FR
[N/P]
Former [1981/08]de Beaumont, Michel, et al
THOMSON-CSF SCPI
F-92045 PARIS LA DEFENSE CEDEX 67 / FR
Application number, filing date80401084.122.07.1980
[1981/08]
Priority number, dateFR1979001942427.07.1979         Original published format: FR 7919424
[1981/08]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report 
No.:EP0024222
Date:25.02.1981
Language:FR
[1981/08]
Type: B1 Patent specification 
No.:EP0024222
Date:16.11.1983
Language:FR
[1983/46]
Search report(s)(Supplementary) European search report - dispatched on:EP10.12.1980
ClassificationIPC:H01L21/28, H01L21/00, H01L29/80, H01L27/18
[1981/08]
CPC:
H01L21/033 (EP); H01L27/095 (EP); H01L29/66848 (EP);
H01L29/812 (EP)
Designated contracting statesDE,   FR,   GB [1983/35]
Former [1981/08]DE,  FR,  GB,  IT,  NL 
TitleGerman:Verfahren zur Herstellung eines Feldeffekttransistors mit selbstjustiertem SCHOTTKY-Gate[1983/46]
English:Process of manufacturing a field-effect transistor with self-aligned SCHOTTKY-Gate[1983/46]
French:Procédé de fabrication d'un transistor à effet de champ à grille SCHOTTKY autoalignée[1983/46]
Former [1981/08]Feldeffekttransistor mit selbstaligniertem Schottky-Gate und Verfahren zu seiner Herstellung
Former [1981/08]Field effect transistor with a self-aligned Schottky gate and process for its manufacture
Former [1981/08]Transistor à effet de champ à grille Schottky autoalignée et son procédé de fabrication
Examination procedure06.03.1981Examination requested  [1981/20]
26.03.1982Despatch of a communication from the examining division (Time limit: M04)
11.05.1982Reply to a communication from the examining division
09.07.1982Reply to a communication from the examining division
14.07.1982Despatch of a communication from the examining division (Time limit: M02)
07.02.1983Despatch of communication of intention to grant (Approval: )
04.05.1983Communication of intention to grant the patent
23.07.1983Fee for grant paid
23.07.1983Fee for publishing/printing paid
Opposition(s)17.08.1984No opposition filed within time limit [1984/47]
Fees paidRenewal fee
26.06.1982Renewal fee patent year 03
28.06.1983Renewal fee patent year 04
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Documents cited:SearchEP0011477  [ ];
 EP0013342  [ ];
 EP0005351  [ ];
 FR2094036  [ ]
    [ ] - IEEE JOURNAL OF SOLID-STATE CIRCUITS, Vol. SC-12, No. 5, Octobre 1977 New York US T.J. RODGERS et al.: "iota-MOS-Memory Technology", pages 515-524 * Figure 1 *
    [ ] - IBM TECHNICAL DISCLOSURE BULLETIN Vol. 22, No. 8B, Janvier 1980 New York US V.L. RIDEOUT: "Fabrication method for high performance mesfet", pages 3861-3863 * Figures 1,2 *
ExaminationUS4029522
 JPS52128077
    - "Patent Abstracts of Japan", vol. 2, no 11, 26-01-1978
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.