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Extract from the Register of European Patents

EP About this file: EP0047409

EP0047409 - Offset compensation for switched capacitor integrators [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  14.01.1987
Database last updated on 21.08.2024
Most recent event   Tooltip14.01.1987No opposition filed within time limitpublished on 04.03.1987 [1987/10]
Applicant(s)For all designated states
AMERICAN MICROSYSTEMS, INCORPORATED
3800 Homestead Road
Santa Clara, CA 95051 / US
[1982/11]
Inventor(s)01 / Haque, Yusuf A.
2052 Laddie Way
San Jose, California 95121 / CA
[1982/11]
Representative(s)Schmidt-Evers, Jürgen, et al
Mitscherlich PartmbB
Patent- und Rechtsanwälte
Postfach 33 06 09
80066 München / DE
[N/P]
Former [1982/11]Schmidt-Evers, Jürgen, Dipl.-Ing., et al
Patentanwälte Mitscherlich & Partner Postfach 33 06 09
D-80066 München / DE
Application number, filing date81106407.018.08.1981
[1982/11]
Priority number, dateUS1980018535608.09.1980         Original published format: US 185356
[1982/11]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0047409
Date:17.03.1982
Language:EN
[1982/11]
Type: A3 Search report 
No.:EP0047409
Date:19.05.1982
Language:EN
[1982/20]
Type: B1 Patent specification 
No.:EP0047409
Date:12.03.1986
Language:EN
[1986/11]
Search report(s)(Supplementary) European search report - dispatched on:EP18.03.1982
ClassificationIPC:G06G7/186
[1982/11]
CPC:
G06G7/1865 (EP,US); H03F3/005 (EP,US)
Designated contracting statesDE,   FR,   GB,   NL,   SE [1982/11]
TitleGerman:Offsetausgleich für geschaltete Kapazitätsintegratoren[1982/11]
English:Offset compensation for switched capacitor integrators[1982/11]
French:Compensation de tension de décalage pour intégrateurs à capacité commutée[1982/11]
Examination procedure05.11.1982Examination requested  [1983/03]
26.07.1983Despatch of a communication from the examining division (Time limit: M04)
24.11.1983Reply to a communication from the examining division
24.01.1984Despatch of a communication from the examining division (Time limit: M04)
24.05.1984Reply to a communication from the examining division
24.07.1984Despatch of a communication from the examining division (Time limit: M04)
26.11.1984Reply to a communication from the examining division
21.05.1985Despatch of communication of intention to grant (Approval: )
03.09.1985Communication of intention to grant the patent
03.12.1985Fee for grant paid
03.12.1985Fee for publishing/printing paid
Opposition(s)13.12.1986No opposition filed within time limit [1987/10]
Fees paidRenewal fee
31.08.1983Renewal fee patent year 03
30.08.1984Renewal fee patent year 04
27.08.1985Renewal fee patent year 05
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Documents cited:Search[Y]US4163947  (WEEDON HANS J [US]);
 [Y]GB1421768  (GEC MEDICAL EQUIPMENT LTD);
 [Y]US3879668  (EDWARDS ALLEN PONSFORD);
 [Y]FR2093486  (IWATSU ELECTRIC CO LTD)
 [Y]  - IEEE JOURNAL OF SOLID-STATE CIRCUITS, volume SC-12, no. 6, December 1977, New York (US) B.J. HOSTICKA et al.: "MOS Sampled Data Recursive Filters using Switched Capacitor Integrators", pages 600-608
Examination   - U. Tielze, Ch. Schenk, Halbleiter-Schaltungstechnik, 3rd edition, 1974, Springer Verlag, Berlin, pages 68-71
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.