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Extract from the Register of European Patents

EP About this file: EP0110469

EP0110469 - X-ray analysis apparatus comprising a four-crystal monochromator [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  30.11.1989
Database last updated on 03.10.2024
Most recent event   Tooltip30.11.1989No opposition filed within time limitpublished on 17.01.1990 [1990/03]
Applicant(s)For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
[N/P]
Former [1984/24]For all designated states
Philips Electronics N.V.
Groenewoudseweg 1
NL-5621 BA Eindhoven / NL
Inventor(s)01 / Bartels, Willem Jan
c/o INT. OCTROOIBUREAU B.V. Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
[1984/24]
Representative(s)Scheele, Edial François, et al
INTERNATIONAAL OCTROOIBUREAU B.V. Prof. Holstlaan 6
5656 AA Eindhoven / NL
[N/P]
Former [1984/24]Scheele, Edial François, et al
INTERNATIONAAL OCTROOIBUREAU B.V. Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
Application number, filing date83201641.417.11.1983
[1984/24]
Priority number, dateNL1982000458425.11.1982         Original published format: NL 8204584
[1984/24]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0110469
Date:13.06.1984
Language:EN
[1984/24]
Type: A3 Search report 
No.:EP0110469
Date:10.04.1985
Language:EN
[1985/15]
Type: B1 Patent specification 
No.:EP0110469
Date:01.02.1989
Language:EN
[1989/05]
Search report(s)(Supplementary) European search report - dispatched on:EP07.02.1985
ClassificationIPC:G01N23/207, G21K1/06
[1984/24]
CPC:
G01N23/2076 (EP,US)
Designated contracting statesDE,   FR,   GB,   NL [1984/24]
TitleGerman:Apparat zur Röntgenstrahlenanalyse, mit einem Vierkristallmonochromator[1984/24]
English:X-ray analysis apparatus comprising a four-crystal monochromator[1984/24]
French:Appareil pour l'analyse par rayons X comportant un monochromateur à quatre cristaux[1984/24]
Examination procedure07.10.1985Examination requested  [1985/51]
17.12.1986Despatch of a communication from the examining division (Time limit: M04)
24.03.1987Reply to a communication from the examining division
29.06.1987Despatch of a communication from the examining division (Time limit: M04)
27.10.1987Reply to a communication from the examining division
11.03.1988Despatch of communication of intention to grant (Approval: Yes)
22.07.1988Communication of intention to grant the patent
17.10.1988Fee for grant paid
17.10.1988Fee for publishing/printing paid
Opposition(s)03.11.1989No opposition filed within time limit [1990/03]
Fees paidRenewal fee
02.11.1985Renewal fee patent year 03
20.11.1986Renewal fee patent year 04
13.11.1987Renewal fee patent year 05
28.11.1988Renewal fee patent year 06
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Lapses during opposition  TooltipNL01.02.1989
[1990/01]
Documents cited:Search[Y]  - JOURNAL OF APPLIED CRYST., vol. 7, 1974, pages 254-259, DK; T. MATSUSHITA: "A method of obtaining a highly parallel and monochromatic X-ray beam by successive diffraction"
 [Y]  - PHYSICAL REVIEW, vol. 52, October 15, 1937, pages 872-879, New York, US; J.W.M. DUMOND: "Theory of the use of more than two successive X-ray crystal reflections to obtain increased resolving power"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.