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EP0126475
European procedure
Extract from the Register of European Patents
EP About this file: EP0126475
| EP0126475 - Process and device for the contactless measuring of the position in situ and/or of the profiles of rough surfaces [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 11.01.1990 Database last updated on 31.08.2024 | Most recent event Tooltip | 11.01.1990 | No opposition filed within time limit | published on 28.02.1990 [1990/09] | Applicant(s) | For:CH
DE
FR
IT
LI
SE
Firma Carl Zeiss D-7920 Heidenheim (Brenz) / DE | For:GB
CARL-ZEISS-STIFTUNG trading as CARL ZEISS D-7920 Heidenheim (Brenz) / DE | [1984/48] | Inventor(s) | 01 /
Fercher, Adolf Friedrich, Prof. Dr. Huffmannstrasse 66 D-4300 Essen 16 / DE | 02 /
Zhang Hu, Hong Studentenheim Uni-Essen Universitätsstrasse D-4300 Essen 1 / DE | [1984/48] | Application number, filing date | 84105763.1 | 19.05.1984 | [1984/48] | Priority number, date | DE19833318678 | 21.05.1983 Original published format: DE 3318678 | [1984/48] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | EP0126475 | Date: | 28.11.1984 | Language: | DE | [1984/48] | Type: | B1 Patent specification | No.: | EP0126475 | Date: | 15.03.1989 | Language: | DE | [1989/11] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 04.10.1984 | Classification | IPC: | G01B11/30, G01B9/021 | [1984/48] | CPC: |
G01B9/02007 (EP,US);
G01B11/303 (EP,US);
G01B9/02002 (EP,US)
| Designated contracting states | CH, DE, FR, GB, IT, LI, SE [1984/48] | Title | German: | Verfahren und Vorrichtung zum berührungsfreien Messen der Ist-Position und/oder des Profils rauher Oberflächen | [1984/48] | English: | Process and device for the contactless measuring of the position in situ and/or of the profiles of rough surfaces | [1984/48] | French: | Procédé et dispositif pour la mesure sans contact de la position instantanée et/ou de la rugosité de surfaces | [1984/48] | Examination procedure | 18.05.1985 | Examination requested [1985/30] | 01.09.1986 | Despatch of a communication from the examining division (Time limit: M04) | 24.12.1986 | Reply to a communication from the examining division | 11.03.1987 | Despatch of a communication from the examining division (Time limit: M06) | 14.08.1987 | Reply to a communication from the examining division | 10.09.1987 | Despatch of a communication from the examining division (Time limit: M06) | 10.03.1988 | Reply to a communication from the examining division | 04.05.1988 | Despatch of communication of intention to grant (Approval: Yes) | 12.09.1988 | Communication of intention to grant the patent | 29.11.1988 | Fee for grant paid | 29.11.1988 | Fee for publishing/printing paid | Opposition(s) | 16.12.1989 | No opposition filed within time limit [1990/09] | Fees paid | Renewal fee | 26.05.1986 | Renewal fee patent year 03 | 15.04.1987 | Renewal fee patent year 04 | 06.05.1988 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]FR2247699 (ANVAR [FR]); | [A]DE3020044 (FRAUNHOFER GES FORSCHUNG [DE]) | [AT] - APPLIED OPTICS, Band 13, Nr. 5, Mai 1974, Seiten 1085-1088, New York, US; W.B. RIBBENS: "Surface roughness measurement by two wavelength holographic interferometry" | Examination | - R. Jones und J.N. Butters: "Some observations on the direct comparison of the geometry of two objects using speckle pattern interferometric contouring" Journal of Physics E: Scientific Instruments, 1975, Band 8, S. 231-234. | - M. Giglio, S. Musazzi und U. Perini: "Surface roughness measurements by means of speckle wavelength decorrelation", Optics Communications, Band 28, Nr. 2, 1979, S. 166-170 |