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Extract from the Register of European Patents

EP About this file: EP0146698

EP0146698 - Test and maintenance system for a data processing system [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  14.02.1990
Database last updated on 05.10.2024
Most recent event   Tooltip07.07.2007Change - inventorpublished on 08.08.2007  [2007/32]
Applicant(s)For all designated states
Bull HN Information Systems Inc.
Corporation Trust Center 1209 Orange Street Wilmington
Delaware / US
[N/P]
Former [1989/24]For all designated states
Bull HN Information Systems Inc.
Corporation Trust Center 1209 Orange Street
Wilmington Delaware / US
Former [1985/27]For all designated states
Honeywell Information Systems Inc.
Honeywell Plaza
Minneapolis Minnesota 55408 / US
Inventor(s)01 / Miller, Homer W.
6904 West Corrine Drive
Peoria Arizona 85345 / US
02 / King, James L.
1251 West Rancho Drive
Phoenix Arizona 85013 / US
[1985/27]
Representative(s)Falcetti, Carlo
Bull HN Information Systems Italia S.p.A. Direzione Brevetti
I-20010 Pregnana Milanese (Milano) / IT
[1989/24]
Former [1985/27]Falcetti, Carlo
Servizio Brevetti Honeywell I.S.I.
I-20010 Pregnana Milanese / IT
Application number, filing date84111613.028.09.1984
[1985/27]
Priority number, dateUS1983053935706.10.1983         Original published format: US 539357
[1985/27]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0146698
Date:03.07.1985
Language:EN
[1985/27]
Type: A3 Search report 
No.:EP0146698
Date:13.01.1988
Language:EN
[1988/02]
Search report(s)(Supplementary) European search report - dispatched on:EP23.11.1987
ClassificationIPC:G06F11/26
[1985/27]
CPC:
G06F11/27 (EP,US); G06F11/26 (KR)
Designated contracting statesBE,   CH,   DE,   FR,   GB,   IT,   LI,   NL,   SE [1985/27]
TitleGerman:Prüf- und Wartungssystem für ein Datenverarbeitungssystem[1985/31]
English:Test and maintenance system for a data processing system[1985/27]
French:Système de test et de maintenance pour un système de traitement de données[1985/31]
File destroyed:12.06.1996
Examination procedure07.07.1988Examination requested  [1988/36]
23.10.1989Despatch of a communication from the examining division (Time limit: M04)
29.01.1990Application withdrawn by applicant  [1990/14]
Fees paidRenewal fee
18.06.1986Renewal fee patent year 03
19.06.1987Renewal fee patent year 04
01.07.1988Renewal fee patent year 05
25.08.1989Renewal fee patent year 06
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Documents cited:Search[Y]US4298980  (HAJDU JOHANN, et al)
 [X]  - DIGEST OF PAPERS OF THE 1979 IEEE TEST CONFERENCE, Cherry-Hill, New Jersey, 23rd-25th October 1979, pages 29-36, IEEE, New York, US; L.A. STOLTE et al.: "Design for testability of the IBM system/38"
 [Y]  - PROCEEDINGS OF THE NATIONAL ELECTRONICS CONFERENCE, vol. 36, 1982, pages 346-350, Oak Brook, Illinois, US; S. AL-HARIRI et al.: "An easily testable structure for LSI and VLSI circuits"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.