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Extract from the Register of European Patents

EP About this file: EP0120569

EP0120569 - Digital signal sampling system with two unrelated sampling timebases [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.08.1987
Database last updated on 02.11.2024
Most recent event   Tooltip01.08.1987No opposition filed within time limitpublished on 16.09.1987 [1987/38]
Applicant(s)For all designated states
TEKTRONIX, INC.
Tektronix Industrial Park D/S Y3-121 4900 S.W. Griffith Drive P.O. Box 500 Beaverton
Oregon 97077 / US
[N/P]
Former [1984/40]For all designated states
TEKTRONIX, INC.
Tektronix Industrial Park D/S Y3-121 4900 S.W. Griffith Drive P.O. Box 500
Beaverton Oregon 97077 / US
Inventor(s)01 / Denbeste, Steven Charles
11595 S.W. Center Apt. 6
Beaverton Oregon 97005 / US
02 / Boyce, Douglas G.
6805 S.W. Madrid Drive
Aloha Oregon 97007 / US
03 / Blattner, John David
3870 N.W. 122nd Place
Beaverton Oregon 97006 / US
04 / Hillen, Kenneth K.
18445 S.W. Lapaz Ct.
Aloha Oregon 97007 / US
[1984/40]
Representative(s)Wombwell, Francis, et al
Forresters
15, Hamilton Square
Birkenhead
Merseyside CH41 6BR / GB
[N/P]
Former [1984/40]Wombwell, Francis, et al
Potts, Kerr & Co. 15, Hamilton Square
Birkenhead Merseyside L41 6BR / GB
Application number, filing date84300749.307.02.1984
[1984/40]
Priority number, dateUS1983047860823.03.1983         Original published format: US 478608
[1984/40]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0120569
Date:03.10.1984
Language:EN
[1984/40]
Type: B1 Patent specification 
No.:EP0120569
Date:08.10.1986
Language:EN
[1986/41]
Search report(s)(Supplementary) European search report - dispatched on:EP14.08.1984
ClassificationIPC:G01R13/22
[1984/40]
CPC:
G01R13/22 (EP,US); G01R31/3177 (EP,US); G06F11/25 (EP,US)
Designated contracting statesDE,   FR,   GB,   NL [1984/40]
TitleGerman:Abtastsystem für digitale Signale mit zwei unabhängigen Abtastzeitbasen[1984/40]
English:Digital signal sampling system with two unrelated sampling timebases[1984/40]
French:Système d'échantillonnage de signaux numériques à deux bases de temps d'échantillonnage indépendantes[1984/40]
File destroyed:15.01.2000
Examination procedure18.09.1984Examination requested  [1984/48]
21.06.1985Despatch of a communication from the examining division (Time limit: M04)
14.10.1985Reply to a communication from the examining division
16.12.1985Despatch of communication of intention to grant (Approval: )
02.04.1986Communication of intention to grant the patent
04.06.1986Fee for grant paid
04.06.1986Fee for publishing/printing paid
Opposition(s)09.07.1987No opposition filed within time limit [1987/38]
Fees paidRenewal fee
16.01.1986Renewal fee patent year 03
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Documents cited:Search[A]GB2100011  (TEKTRONIX INC [US]);
 [A]US4364036  (SHIMIZU KAZUNARI)
 [A]  - NEW ELECTRONICS, vol. 16, no. 4, February 1983, pages 21-23, London, GB; S. DEN BESTE et al.: "Dual timebase acquisition simplifies design integration tasks"
 [A]  - NEW ELECTRONICS, vol. 15, no. 22, November 1982, pages 42-44, London, GB; M. CONNAH: "Trace control in logic analysers"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.