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EP0133120
European procedure
Extract from the Register of European Patents
EP About this file: EP0133120
| EP0133120 - Device for measuring the edge to edge dimension of an object by optical means [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 26.01.1989 Database last updated on 02.11.2024 | Most recent event Tooltip | 26.01.1989 | No opposition filed within time limit | published on 15.03.1989 [1989/11] | Applicant(s) | For all designated states Guillaume, Michel Les Blétières - Les Adrets F-38190 Brignoud / FR | For all designated states Noailly, Nicole 61, Boulevard Joseph Vallier F-38100 Grenoble / FR | [1985/07] | Inventor(s) | 01 /
see applicant ... | [1985/07] | Representative(s) | Mongrédien, André, et al c/o BREVATOME 25, rue de Ponthieu F-75008 Paris / FR | [1985/07] | Application number, filing date | 84401542.0 | 20.07.1984 | [1985/07] | Priority number, date | FR19830012328 | 26.07.1983 Original published format: FR 8312328 | [1985/07] | Filing language | FR | Procedural language | FR | Publication | Type: | A2 Application without search report | No.: | EP0133120 | Date: | 13.02.1985 | Language: | FR | [1985/07] | Type: | A3 Search report | No.: | EP0133120 | Date: | 13.03.1985 | Language: | FR | [1985/11] | Type: | B1 Patent specification | No.: | EP0133120 | Date: | 30.03.1988 | Language: | FR | [1988/13] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 08.01.1985 | Classification | IPC: | G01B11/02 | [1985/07] | CPC: |
G01B11/024 (EP,US)
| Designated contracting states | DE, GB [1985/07] | Title | German: | Messvorrichtung für die Dimension zwischen zwei Kanten eines Objekts mit optischen Mitteln | [1985/07] | English: | Device for measuring the edge to edge dimension of an object by optical means | [1985/07] | French: | Dispositif de mesure de la dimension bord à bord d'un objet par voie optique | [1985/07] | Examination procedure | 24.08.1985 | Examination requested [1985/45] | 18.12.1986 | Despatch of a communication from the examining division (Time limit: M04) | 18.04.1987 | Reply to a communication from the examining division | 16.06.1987 | Despatch of communication of intention to grant (Approval: ) | 28.09.1987 | Communication of intention to grant the patent | 03.12.1987 | Fee for grant paid | 03.12.1987 | Fee for publishing/printing paid | Opposition(s) | 31.12.1988 | No opposition filed within time limit [1989/11] | Fees paid | Renewal fee | 15.07.1986 | Renewal fee patent year 03 | 18.07.1987 | Renewal fee patent year 04 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]US3937580 (KASDAN HARVEY LEE) | [X] - IBM TECHNICAL DISCLOSURE BULLETIN, vol. 20, no. 1, juin 1977, pages 206-214, New York, USA; R.S. CHARSKY et al.: "Advanced diffraction pattern analysis algorithm" |