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EP0234111

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Extract from the Register of European Patents

EP About this file: EP0234111

EP0234111 - Six-port reflectometer test arrangement [Right-click to bookmark this link]
Status	No opposition filed within time limit Status updated on 28.12.1991 Database last updated on 13.07.2024
Most recent event Tooltip	28.11.2003	Lapse of the patent in a contracting state New state(s): ES	published on 14.01.2004 [2004/03]
Applicant(s)	For all designated states Marconi Instruments Limited Longacres Hatfield Road St. Albans Hertfordshire, AL4 0JN / GB
	[N/P]
Former [1987/36]	For all designated states MARCONI INSTRUMENTS LIMITED Longacres Hatfield Road St. Albans Hertfordshire, AL4 0JN / GB
Inventor(s)	01 / Potter, Christopher Malcolm 199 Telford Avenue Stevenage Hertfordshire SG2 0AR / GB
	02 / Hjipieris, George 21 Wilton Road Hitchin Hertfordshire SG1 1SS / GB
	[1987/36]
Representative(s)	Hyden, Martin Douglas, et al Etudes et Productions Schlumberger Intellectual Property Department 1 rue Henri Becquerel B.P. 202 92142 Clamart Cedex / FR
	[N/P]
Former [1990/14]	Hyden, Martin Douglas, et al GEC Patent Department GEC-Marconi Research Centre West Hanningfield Road Great Baddow Essex CM2 8HN / GB
Former [1987/36]	Hoste, Colin Francis The General Electric Company p.l.c. GEC Patent Department Waterhouse Lane Chelmsford, Essex CM1 2QX / GB
Application number, filing date	86309748.1	15.12.1986
	[1987/36]
Priority number, date	GB19860001108	17.01.1986 Original published format: GB 8601108
	[1987/36]
Filing language	EN
Procedural language	EN
Publication	Type:	A1 Application with search report
	No.:	EP0234111
	Date:	02.09.1987
	Language:	EN
	[1987/36]
	Type:	B1 Patent specification
	No.:	EP0234111
	Date:	27.02.1991
	Language:	EN
	[1991/09]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	30.06.1987
Classification	IPC:	G01R27/06	[1987/36]
	CPC:	G01R27/06 (EP,US)
Designated contracting states	AT, BE, CH, DE, ES, FR, GR, IT, LI, LU, NL, SE [1987/36]
Title	German:	Sechstorreflektometer-Prüfanordnung	[1987/36]
	English:	Six-port reflectometer test arrangement	[1987/36]
	French:	Dispositif de test utilisant un réflectomètre à six portes	[1987/36]
Examination procedure	28.09.1987	Examination requested [1987/48]
	18.01.1990	Despatch of a communication from the examining division (Time limit: M04)
	06.02.1990	Reply to a communication from the examining division
	27.03.1990	Despatch of a communication from the examining division (Time limit: M04)
	28.03.1990	Reply to a communication from the examining division
	18.04.1990	Despatch of communication of intention to grant (Approval: Yes)
	10.08.1990	Communication of intention to grant the patent
	06.09.1990	Fee for grant paid
	06.09.1990	Fee for publishing/printing paid
Opposition(s)	28.11.1991	No opposition filed within time limit [1992/08]
Fees paid	Renewal fee
	06.12.1988	Renewal fee patent year 03
	13.12.1989	Renewal fee patent year 04
	17.11.1990	Renewal fee patent year 05
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition Tooltip	AT	27.02.1991
	BE	27.02.1991
	CH	27.02.1991
	GR	27.02.1991
	LI	27.02.1991
	NL	27.02.1991
	SE	27.02.1991
	ES	07.06.1991
	[2004/03]
Former [2000/04]	AT	27.02.1991
	BE	27.02.1991
	CH	27.02.1991
	GR	27.02.1991
	LI	27.02.1991
	NL	27.02.1991
	SE	27.02.1991
Former [1992/10]	AT	27.02.1991
	BE	27.02.1991
	CH	27.02.1991
	LI	27.02.1991
	NL	27.02.1991
	SE	27.02.1991
Former [1992/01]	AT	27.02.1991
	CH	27.02.1991
	LI	27.02.1991
	NL	27.02.1991
	SE	27.02.1991
Former [1991/49]	AT	27.02.1991
	NL	27.02.1991
	SE	27.02.1991
Former [1991/39]	SE	27.02.1991
Documents cited:	Search	[AD] - IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. MTT-26, no. 12, December 1978, pages 951-957, New York, US; G.F. ENGEN: "Calibrating the six-port reflectometer by means of sliding terminations"
		[AD] - IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. MTT-25, no. 12, December 1977, pages 1080-1083, New York, US; G.F. ENGEN: "An improved circuit for implementing the six-port technique of microwave measurements"
		[A] - IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. MTT-27, no. 12, December 1979, pages 987-992, New York, US; G.F. ENGEN et al: "Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer"
		[A] - IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. MTT-25, no. 12, December 1977, pages 1070-1074, New York, US; C.A. HOER: "A network analyzer incorporating two six-port reflectometers"
		[A] - IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. MTT-32, no. 12, December 1984, pages 1683-1686, New York, US; N.S. CHUNG et al.: "A dual six-port automatic network analyzer and its performance"

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