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Extract from the Register of European Patents

EP About this file: EP0239142

EP0239142 - Arrangement for the measurement of the strain double refraction of an optical sensor [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  04.06.1991
Database last updated on 12.11.2024
Most recent event   Tooltip07.07.2007Change - inventorpublished on 08.08.2007  [2007/32]
Applicant(s)For:DE 
Philips Corporate Intellectual Property GmbH
Habsburgerallee 11
52064 Aachen / DE
For:FR  GB 
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
[N/P]
Former [1987/40]For:DE 
Philips Patentverwaltung GmbH
Röntgenstrasse 24
D-22335 Hamburg / DE
For:FR  GB 
Philips Electronics N.V.
Groenewoudseweg 1
NL-5621 BA Eindhoven / NL
Inventor(s)01 / Martens, Gerhard, Dr.
Breslauer Strasse 40
D-2359 Henstedt-Ulzburg / DE
[1987/40]
Representative(s)Koch, Ingo, et al
Philips Patentverwaltung GmbH, Wendenstrasse 35c
D-20097 Hamburg / DE
[N/P]
Former [1987/40]Koch, Ingo, Dr.-Ing., et al
Philips Patentverwaltung GmbH, Wendenstrasse 35c
D-20097 Hamburg / DE
Application number, filing date87200314.025.02.1987
[1987/40]
Priority number, dateDE1986360746207.03.1986         Original published format: DE 3607462
[1987/40]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP0239142
Date:30.09.1987
Language:DE
[1987/40]
Type: A3 Search report 
No.:EP0239142
Date:23.05.1990
Language:DE
[1990/21]
Search report(s)(Supplementary) European search report - dispatched on:EP03.04.1990
ClassificationIPC:G01D5/34, G01L1/24, G01L11/00
[1990/23]
CPC:
G01D5/344 (EP,US)
Former IPC [1987/40]G01L1/24, G01L11/00
Designated contracting statesDE,   FR,   GB [1987/40]
TitleGerman:Anordung zur Messung der Spannungsdoppelbrechung eines optischen Sensors[1987/40]
English:Arrangement for the measurement of the strain double refraction of an optical sensor[1987/40]
French:Arrangement pour la mesure de la biréfringence par compression d'un détecteur optique[1987/40]
File destroyed:02.03.1998
Examination procedure21.11.1990Examination requested  [1991/03]
02.05.1991Application withdrawn by applicant  [1991/30]
Fees paidRenewal fee
24.02.1989Renewal fee patent year 03
22.02.1990Renewal fee patent year 04
25.02.1991Renewal fee patent year 05
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Documents cited:Search[A]US3401590  (MASSEY GAIL A);
 [AD]DE3138061  (UNITED TECHNOLOGIES CORP [US]);
 [A]DE3421004  (PHILIPS PATENTVERWALTUNG [DE])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.