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Extract from the Register of European Patents

EP About this file: EP0244259

EP0244259 - Method of detecting the presence or absence of defect of transparent circuit board having fine transparent electric conductive circuit [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  09.08.1990
Database last updated on 05.10.2024
Most recent event   Tooltip09.08.1990No opposition filed within time limitpublished on 26.09.1990 [1990/39]
Applicant(s)For all designated states
SHINTO PAINT CO., LTD.
10-73, Minami-Tsukaguchicho 6-chome
Amagasaki / JP
[1987/45]
Inventor(s)01 / Tameyuki, Suzuki
1-7 Yamanone 3-chome
Zushi Kanagawa-ken / JP
02 / Junichi, Yasukawa
13-13, Higashikaigan Minami, 2-chome
Chigasaki Kanagawa-ken / JP
03 / Toyokazu, Nomura
1-1 Higashi Narashino 5-chome
Narashino Chiba-ken / JP
[1987/45]
Representative(s)Pennant, Pyers, et al
Stevens, Hewlett & Perkins Halton House 20/23 Holborn
London EC1N 2JD / GB
[N/P]
Former [1987/45]Pennant, Pyers, et al
Stevens, Hewlett & Perkins 1 Serjeants' Inn Fleet Street
London EC4Y 1LL / GB
Application number, filing date87303908.530.04.1987
[1987/45]
Priority number, dateJP1986010171401.05.1986         Original published format: JP 10171486
[1987/45]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0244259
Date:04.11.1987
Language:EN
[1987/45]
Type: B1 Patent specification 
No.:EP0244259
Date:18.10.1989
Language:EN
[1989/42]
Search report(s)(Supplementary) European search report - dispatched on:EP10.08.1987
ClassificationIPC:G01M11/00, C25D13/12, G02F1/133
[1989/42]
CPC:
G01N21/91 (EP); H05K1/0269 (EP); G01N2021/95638 (EP);
H05K2201/0108 (EP); H05K2201/0326 (EP); H05K2203/135 (EP);
H05K2203/161 (EP) (-)
Former IPC [1987/45]G01M11/00, C25D13/12
Designated contracting statesDE,   FR,   GB,   IT,   NL [1987/45]
TitleGerman:Verfahren zur Ermittlung der An- oder Abwesenheit von Fehlern an transparenten Leiterplatten, welche einen dünnen transparenten Schaltkreis besitzen[1987/45]
English:Method of detecting the presence or absence of defect of transparent circuit board having fine transparent electric conductive circuit[1987/45]
French:Méthode pour détecter l'existence ou l'absence de défauts de cartes imprimées transparentes ayant un circuit électriquement conducteur transparent de faible épaisseur[1987/45]
Examination procedure19.12.1987Examination requested  [1988/08]
28.02.1989Despatch of communication of intention to grant (Approval: Yes)
20.04.1989Communication of intention to grant the patent
29.05.1989Fee for grant paid
29.05.1989Fee for publishing/printing paid
Opposition(s)19.07.1990No opposition filed within time limit [1990/39]
Fees paidRenewal fee
08.04.1989Renewal fee patent year 03
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Documents cited:SearchEP0071872  [ ]
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