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Extract from the Register of European Patents

EP About this file: EP0251809

EP0251809 - Error detection carried out by the use of unused modulo-m code [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  21.09.1995
Database last updated on 11.09.2024
Most recent event   Tooltip21.09.1995No opposition filed within time limitpublished on 08.11.1995 [1995/45]
Applicant(s)For all designated states
NEC Corporation
7-1, Shiba 5-chome Minato-ku
Tokyo 108-8001 / JP
[N/P]
Former [1988/01]For all designated states
NEC CORPORATION
7-1, Shiba 5-chome Minato-ku
Tokyo / JP
Inventor(s)01 / Ishizuka, Akira c/o NEC Corporation
33-1, Shiba 5-chome
Minato-ku Tokyo / JP
[1988/01]
Representative(s)Goodman, Simon John Nye, et al
Reddie & Grose LLP The White Chapel Building
10 Whitechapel High Street
London E1 8QS / GB
[N/P]
Former [1994/46]Goodman, Simon John Nye, et al
Reddie & Grose, 16 Theobalds Road
London WC1X 8PL / GB
Former [1988/01]Pears, David Ashley
REDDIE & GROSE 16 Theobalds Road
London WC1X 8PL / GB
Application number, filing date87305899.403.07.1987
[1988/01]
Priority number, dateJP1986015500103.07.1986         Original published format: JP 15500186
JP1986015500203.07.1986         Original published format: JP 15500286
JP1986015500303.07.1986         Original published format: JP 15500386
JP1986015500403.07.1986         Original published format: JP 15500486
JP1986015500503.07.1986         Original published format: JP 15500586
JP1986015500603.07.1986         Original published format: JP 15500686
JP1986015500703.07.1986         Original published format: JP 15500786
JP1986015500803.07.1986         Original published format: JP 15500886
JP1986015500903.07.1986         Original published format: JP 15500986
[1988/01]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0251809
Date:07.01.1988
Language:EN
[1988/01]
Type: A3 Search report 
No.:EP0251809
Date:29.08.1990
Language:EN
[1990/35]
Type: B1 Patent specification 
No.:EP0251809
Date:17.11.1994
Language:EN
[1994/46]
Search report(s)(Supplementary) European search report - dispatched on:EP11.07.1990
ClassificationIPC:G06F11/10
[1988/01]
CPC:
G06F11/104 (EP,US)
Designated contracting statesBE,   DE,   FR,   GB,   IT,   NL,   SE [1988/01]
TitleGerman:Ausführung von Fehlererkennung unter Verwendung eines ungebrauchten Modulo-m-Kodes[1988/01]
English:Error detection carried out by the use of unused modulo-m code[1988/01]
French:Réalisation de détection d'erreur par l'utilisation d'un code modulo-m non utilisé[1988/01]
Examination procedure13.07.1987Examination requested  [1988/01]
22.12.1992Despatch of a communication from the examining division (Time limit: M06)
05.05.1993Reply to a communication from the examining division
07.12.1993Despatch of communication of intention to grant (Approval: Yes)
15.04.1994Communication of intention to grant the patent
13.07.1994Fee for grant paid
13.07.1994Fee for publishing/printing paid
Opposition(s)18.08.1995No opposition filed within time limit [1995/45]
Fees paidRenewal fee
27.07.1989Renewal fee patent year 03
23.07.1990Renewal fee patent year 04
22.07.1991Renewal fee patent year 05
21.07.1992Renewal fee patent year 06
23.07.1993Renewal fee patent year 07
28.07.1994Renewal fee patent year 08
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]JP61021534  ;
 [A]US3816728  (CHEN T, et al)
 [A]  - IEE PROCEEDINGS: SOLID STATE AND ELECTRON DEVICES, vol. 133, Part I, no. 3, June 1986, pages 129-139, Stevenage, Herts, GB; I.L. SAYERS et al.: "Design of a reliable and self-testing VLSI datapath using residue coding techniques"
 [A]  - PATENT ABSTRACTS OF JAPAN, vol. 10, no. 169 (P-468)[2225], 14th June 1986; & JP-A-61 021 534 (FUJITSU K.K.) 30-01-1986, & JP61021534 A 00000000
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.