blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0273715

EP0273715 - Method for forming metal layer for a semiconductor device [Right-click to bookmark this link]
Former [1988/27]Method for forming metal layer and semiconductor device formed thereby
[1994/28]
StatusNo opposition filed within time limit
Status updated on  18.05.1995
Database last updated on 21.09.2024
Most recent event   Tooltip18.05.1995No opposition filed within time limitpublished on 05.07.1995 [1995/27]
Applicant(s)For all designated states
FUJITSU LIMITED
1015, Kamikodanaka, Nakahara-ku Kawasaki-shi
Kanagawa 211 / JP
For all designated states
FUJITSU VLSI LIMITED
1844-2, Kozoji-cho 2-chome Kasugai-shi
Aichi 487 / JP
[N/P]
Former [1988/27]For all designated states
FUJITSU LIMITED
1015, Kamikodanaka, Nakahara-ku
Kawasaki-shi, Kanagawa 211 / JP
For all designated states
FUJITSU VLSI LIMITED
1844-2, Kozoji-cho 2-chome
Kasugai-shi Aichi 487 / JP
Inventor(s)01 / Inoue, Minoru Hainesu Mizonokuchi 213
418-1, Hisamoto Takatsu-ku
Kawasaki-shi Kanagawa 213 / JP
02 / Hashizume, Kouzi Fujitsu Dai 11 Nakahara Ryo
923, Shimokodanaka Nakahara-ku
Kawasaki-shi Kanagawa 211 / JP
[1988/27]
Representative(s)Rackham, Stephen Neil, et al
Gill Jennings & Every LLP Broadgate House 7 Eldon Street
London EC2M 7LH / GB
[N/P]
Former [1988/27]Rackham, Stephen Neil, et al
GILL JENNINGS & EVERY, Broadgate House, 7 Eldon Street
London EC2M 7LH / GB
Application number, filing date87311389.823.12.1987
[1988/27]
Priority number, dateJP1986030797925.12.1986         Original published format: JP 30797986
[1988/27]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0273715
Date:06.07.1988
Language:EN
[1988/27]
Type: A3 Search report 
No.:EP0273715
Date:08.02.1989
Language:EN
[1989/06]
Type: B1 Patent specification 
No.:EP0273715
Date:13.07.1994
Language:EN
[1994/28]
Search report(s)(Supplementary) European search report - dispatched on:EP22.12.1988
ClassificationIPC:H01L21/31
[1988/27]
CPC:
H01L21/32051 (EP,US); H01L21/283 (KR)
Designated contracting statesDE,   FR,   GB [1988/27]
TitleGerman:Verfahren zur Herstellung eines Halbleiterbauelementes durch Auftragen einer Metallschicht[1994/28]
English:Method for forming metal layer for a semiconductor device[1994/28]
French:Procédé de fabrication d'un dispositif semi-conducteur par déposition d'une couche métallique[1994/28]
Former [1988/27]Halbleiterbauelement und Verfahren zu seiner Herstellung beim Auftragen einer Metallschicht
Former [1988/27]Method for forming metal layer and semiconductor device formed thereby
Former [1988/27]Dispositif semi-conducteur et son procédé de fabrication par déposition d'une couche métallique
Examination procedure26.07.1989Examination requested  [1989/38]
30.08.1991Despatch of a communication from the examining division (Time limit: M04)
12.12.1991Reply to a communication from the examining division
30.04.1992Despatch of a communication from the examining division (Time limit: M06)
05.11.1992Reply to a communication from the examining division
09.08.1993Despatch of communication of intention to grant (Approval: Yes)
21.12.1993Communication of intention to grant the patent
15.03.1994Fee for grant paid
15.03.1994Fee for publishing/printing paid
Opposition(s)14.04.1995No opposition filed within time limit [1995/27]
Fees paidRenewal fee
18.12.1989Renewal fee patent year 03
11.12.1990Renewal fee patent year 04
09.12.1991Renewal fee patent year 05
11.12.1992Renewal fee patent year 06
13.12.1993Renewal fee patent year 07
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipDE14.10.1994
[1995/15]
Documents cited:Search[A]US3620837  (LEFF JERRY, et al)
 [A]  - SOLID STATE TECHNOLOGY, vol. 22, no. 12, December 1979, pages 66-72, Washington, US; L.D.HARTSOUGH et al.: "Aluminum and aluminum alloy sputter deposition for VLSI"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.