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Extract from the Register of European Patents

EP About this file: EP0273725

EP0273725 - Encapsulated semiconductor device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.04.1994
Database last updated on 31.08.2024
Most recent event   Tooltip01.04.1994No opposition filed within time limitpublished on 25.05.1994 [1994/21]
Applicant(s)For all designated states
Kabushiki Kaisha Toshiba
72, Horikawa-cho, Saiwai-ku Kawasaki-shi
Kanagawa-ken 210-8572 / JP
[N/P]
Former [1988/27]For all designated states
KABUSHIKI KAISHA TOSHIBA
72, Horikawa-cho, Saiwai-ku
Kawasaki-shi, Kanagawa-ken 210, Tokyo / JP
Inventor(s)01 / Yamaji, Yasuhiro c/o Patent Division
Toshiba Corporation Principal Office
1-1, Shibaura 1-chome Minato-ku Tokyo / JP
02 / Takahashi, Kenji c/o Patent Division
Toshiba Corporation Principal Office
1-1, Shibaura 1-chome Minato-ku Tokyo / JP
03 / Hirata, Seiichi c/o Patent Division
Toshiba Corporation Principal Office
1-1, Shibaura 1-chome Minato-ku Tokyo / JP
04 / Sakurai, Toshiharu c/o Patent Division
Toshiba Corporation Principal Office
1-1, Shibaura 1-chome Minato-ku Tokyo / JP
[1988/27]
Representative(s)Freed, Arthur Woolf, et al
Marks & Clerk Incorporating Edward Evans Barker 90 Long Acre
London WC2E 9RA / GB
[N/P]
Former [1992/01]Freed, Arthur Woolf, et al
MARKS & CLERK, 57-60 Lincoln's Inn Fields
London WC2A 3LS / GB
Former [1988/27]Sturt, Clifford Mark
MARKS & CLERK 57-60 Lincoln's Inn Fields
London WC2A 3LS / GB
Application number, filing date87311419.323.12.1987
[1988/27]
Priority number, dateJP1986031375426.12.1986         Original published format: JP 31375486
[1988/27]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0273725
Date:06.07.1988
Language:EN
[1988/27]
Type: A3 Search report 
No.:EP0273725
Date:31.08.1988
Language:EN
[1988/35]
Type: B1 Patent specification 
No.:EP0273725
Date:02.06.1993
Language:EN
[1993/22]
Search report(s)(Supplementary) European search report - dispatched on:EP13.07.1988
ClassificationIPC:H01L23/31, H01L23/495
[1993/22]
CPC:
H01L23/3107 (EP,US); H01L23/49541 (EP,US); H01L2224/48091 (EP,US);
H01L2224/48247 (EP,US); H01L24/48 (EP,US); H01L2924/00014 (EP,US);
H01L2924/181 (EP,US); H01L2924/1815 (EP,US) (-)
C-Set:
H01L2224/48091, H01L2924/00014 (EP,US);
H01L2924/00014, H01L2224/05599 (US,EP);
H01L2924/00014, H01L2224/45099 (US,EP);
H01L2924/181, H01L2924/00012 (US,EP)
Former IPC [1988/27]H01L23/30, H01L23/48
Designated contracting statesDE,   FR,   GB [1988/27]
TitleGerman:Umhüllte Halbleiteranordnung[1988/27]
English:Encapsulated semiconductor device[1988/27]
French:Dispositif semi-conducteur encapsulé[1988/27]
Examination procedure06.01.1988Examination requested  [1988/27]
11.05.1992Despatch of communication of intention to grant (Approval: Yes)
02.10.1992Communication of intention to grant the patent
07.01.1993Fee for grant paid
07.01.1993Fee for publishing/printing paid
Opposition(s)03.03.1994No opposition filed within time limit [1994/21]
Fees paidRenewal fee
18.12.1989Renewal fee patent year 03
11.12.1990Renewal fee patent year 04
09.12.1991Renewal fee patent year 05
09.10.1992Renewal fee patent year 06
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Documents cited:Search[A]JP61184855  ;
 [A]JP61166052  ;
 [A]JP61191055
 [A]  - 23RD ANNUAL PROCEEDINGS OF RELIABILITY PHYSICS 1985, Orlando, Florida, 26th-28th March 1985, pages 192-197, IEEE, New York, US, I. FUKUZAWA et al.: "Moisture resistance degradation of plastic LSIs by reflow soldering"
 [A]  - PATENT ABSTRACTS OF JAPAN, vol. 11, no. 7 (E-469)[2454], 9th January 1987; & JP-A-61 184 855 (OKI ELECTRIC CO. LTD) 18-08-1986, & JP61184855 A 00000000
 [A]  - PATENT ABSTRACTS OF JAPAN, vol. 10, no. 370 (E-463)[2427], 10th December 1986; & JP-A-61 166 052 (HITACHI LTD) 26-07-1986, & JP61166052 A 00000000
 [A]  - PATENT ABSTRACTS OF JAPAN, vol. 11, no. 20 (E-472)[2467], 20th January 1987; & JP-A-61 191 055 (TOSHIBA CORP.) 25-08-1986, & JP61191055 A 00000000
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.