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Extract from the Register of European Patents

EP About this file: EP0302165

EP0302165 - Process for the encapsulation of both microelectronic semiconductor and thick or thin film circuits [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  27.08.1992
Database last updated on 11.09.2024
Most recent event   Tooltip23.11.2007Lapse of the patent in a contracting statepublished on 26.12.2007  [2007/52]
Applicant(s)For all designated states
Messerschmitt-Bölkow-Blohm Gesellschaft mit beschränkter Haftung
81663 München / DE
[N/P]
Former [1989/06]For all designated states
Messerschmitt-Bölkow-Blohm Gesellschaft mit beschränkter Haftung
D-81663 München / DE
Inventor(s)01 / Möller, Werner, Dr.
Ravensburger Strasse 77
D-7900 Ulm / DE
02 / Ulmann, Andreas
Grimmstrasse 1
D-7318 Lenningen / DE
[1989/06]
Application number, filing date88103232.003.03.1988
[1989/06]
Priority number, dateDE1987372526930.07.1987         Original published format: DE 3725269
[1989/06]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0302165
Date:08.02.1989
Language:DE
[1989/06]
Type: B1 Patent specification 
No.:EP0302165
Date:23.10.1991
Language:DE
[1991/43]
Search report(s)(Supplementary) European search report - dispatched on:EP15.12.1988
ClassificationIPC:H01L21/56, H01L23/29, H01L23/31
[1991/43]
CPC:
H01L21/56 (EP,US); H01L23/16 (EP,US); H01L23/3121 (EP,US);
H01L23/3135 (EP,US); H01L2224/48091 (EP,US); H01L2224/48227 (EP,US);
H01L2224/48465 (EP,US); H01L2224/48472 (EP,US); H01L24/48 (EP,US);
H01L2924/00014 (EP,US); H01L2924/0102 (EP,US); H01L2924/01046 (EP,US);
H01L2924/12042 (EP,US); H01L2924/14 (EP,US); H01L2924/15153 (EP,US);
H01L2924/1517 (EP,US); H01L2924/16152 (EP,US); Y10S228/904 (EP,US);
Y10T29/4913 (EP,US); Y10T29/49146 (EP,US); Y10T29/49162 (EP,US);
Y10T29/53178 (EP,US) (-)
C-Set:
H01L2224/48091, H01L2924/00014 (US,EP);
H01L2224/48465, H01L2224/48091, H01L2924/00 (US,EP);
H01L2224/48465, H01L2224/48227, H01L2924/00 (US,EP);
H01L2224/48472, H01L2224/48091, H01L2924/00 (US,EP);
H01L2224/48472, H01L2224/48227, H01L2924/00 (EP,US);
H01L2924/00014, H01L2224/45099 (EP,US);
H01L2924/12042, H01L2924/00 (EP,US);
H01L2924/14, H01L2924/00 (EP,US)
(-)
Former IPC [1989/06]H01L21/56, H01L23/30
Designated contracting statesDE,   FR,   GB,   IT [1989/06]
TitleGerman:Verfahren zum Einkapseln von mikroelektronischen Halbleiter- und Schichtschaltungen[1989/06]
English:Process for the encapsulation of both microelectronic semiconductor and thick or thin film circuits[1989/06]
French:Procédé d'encapsulation de circuit microélectroniques semi-conducteurs et de couches minces ou épaisses[1989/06]
Examination procedure18.01.1989Examination requested  [1989/12]
27.07.1990Despatch of a communication from the examining division (Time limit: M04)
06.09.1990Reply to a communication from the examining division
21.02.1991Despatch of communication of intention to grant (Approval: Yes)
18.04.1991Communication of intention to grant the patent
21.06.1991Fee for grant paid
21.06.1991Fee for publishing/printing paid
Opposition(s)24.07.1992No opposition filed within time limit [1992/42]
Fees paidRenewal fee
18.01.1990Renewal fee patent year 03
20.03.1991Renewal fee patent year 04
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Lapses during opposition  TooltipIT23.10.1991
[1999/42]
Documents cited:Search[AD]DE3442131  (MESSERSCHMITT BOELKOW BLOHM [DE]);
 [A]EP0122687  (MITSUBISHI ELECTRIC CORP [JP])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.