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EP0297669
European procedure
Extract from the Register of European Patents
EP About this file: EP0297669
| EP0297669 - Method for measuring a reflected optical radiation [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 11.11.1995 Database last updated on 02.11.2024 | Most recent event Tooltip | 11.11.1995 | No opposition filed within time limit | published on 03.01.1996 [1996/01] | Applicant(s) | For:DE
Philips Corporate Intellectual Property GmbH Habsburgerallee 11 52064 Aachen / DE | For:FR
GB
IT
SE
Koninklijke Philips Electronics N.V. Groenewoudseweg 1 5621 BA Eindhoven / NL | [N/P] |
| Former [1989/01] | For:DE
Philips Patentverwaltung GmbH Röntgenstrasse 24 D-22335 Hamburg / DE | ||
| For:FR
GB
IT
SE
Philips Electronics N.V. Groenewoudseweg 1 NL-5621 BA Eindhoven / NL | Inventor(s) | 01 /
Esser, Hildegard Birresbornerstrasse 55 D-5000 Köln 41 / DE | 02 /
Grzesik, Ulrich, Dr. Dipl.-Phys. August Kierspel-Strasse 161 D-5060 Bergisch Gladbach 2 / DE | [1989/01] | Representative(s) | Hartmann, Heinrich, et al Philips Corporate Intellectual Property GmbH, Habsburgerallee 11 52064 Aachen / DE | [N/P] |
| Former [1995/14] | Hartmann, Heinrich, Dipl.-Ing., et al Philips Patentverwaltung GmbH, Röntgenstrasse 24 D-22335 Hamburg / DE | ||
| Former [1989/01] | Koch, Ingo, Dr.-Ing. Philips Patentverwaltung GmbH, Wendenstrasse 35c D-20097 Hamburg / DE | Application number, filing date | 88201323.8 | 27.06.1988 | [1989/01] | Priority number, date | DE19873721823 | 02.07.1987 Original published format: DE 3721823 | [1989/01] | Filing language | DE | Procedural language | DE | Publication | Type: | A2 Application without search report | No.: | EP0297669 | Date: | 04.01.1989 | Language: | DE | [1989/01] | Type: | A3 Search report | No.: | EP0297669 | Date: | 06.02.1991 | Language: | DE | [1991/06] | Type: | B1 Patent specification | No.: | EP0297669 | Date: | 11.01.1995 | Language: | DE | [1995/02] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 17.12.1990 | Classification | IPC: | G01N21/47, G01M11/00 | [1990/52] | CPC: |
G01M11/3145 (EP,US)
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| Former IPC [1989/01] | G01N21/47 | Designated contracting states | DE, FR, GB, IT, SE [1989/01] | Title | German: | Verfahren zur Messung der von einer Reflexionsstelle reflektierten optischen Strahlung | [1989/01] | English: | Method for measuring a reflected optical radiation | [1989/01] | French: | Procédé pour mesurer un rayonnement optique réfléchi | [1989/01] | Examination procedure | 01.08.1991 | Examination requested [1991/39] | 11.03.1993 | Despatch of a communication from the examining division (Time limit: M04) | 28.04.1993 | Reply to a communication from the examining division | 22.03.1994 | Despatch of communication of intention to grant (Approval: Yes) | 30.06.1994 | Communication of intention to grant the patent | 03.10.1994 | Fee for grant paid | 03.10.1994 | Fee for publishing/printing paid | Opposition(s) | 12.10.1995 | No opposition filed within time limit [1996/01] | Fees paid | Renewal fee | 26.06.1990 | Renewal fee patent year 03 | 27.06.1991 | Renewal fee patent year 04 | 29.06.1992 | Renewal fee patent year 05 | 28.06.1993 | Renewal fee patent year 06 | 28.06.1994 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]EP0210341 (CSELT CENTRO STUDI LAB TELECOM [IT]) | [Y] - NACHRICHTENTECHNISCHE BERICHTE Heft 3, Dezember 1986, Seiten 61-72; W.E. FREYHARDT et al.: "Prinzipien und Anwendungsbeispiele der optischen Messtechnik" | [Y] - ELEKTRONIK Band 35, Nr. 21, Oktober 1986, Seiten 121,122,125-128; H.-P. SIEBERT: "Messungen und Prüfungen an LWL-Bauelementen" | [A] - J.E.E. JOURNAL OF ELECTRONIC ENGINEERING Band 23, Nr. 236, August 1986, Seiten 62-65, Tokyo, JP; K. KITAGAWA: "OTDR Makes Breakthrough In Accuracy and Dynamic Range" |