Extract from the Register of European Patents

EP About this file: EP0283278

EP0283278 - Compound semiconductor device having nonalloyed ohmic contacts [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  23.04.1994
Database last updated on 11.04.2026
Most recent event   Tooltip23.04.1994No opposition filed within time limitpublished on 15.06.1994 [1994/24]
Applicant(s)For all designated states
FUJITSU LIMITED
1015, Kamikodanaka, Nakahara-ku Kawasaki-shi
Kanagawa 211 / JP
[N/P]
Former [1988/38]For all designated states
FUJITSU LIMITED
1015, Kamikodanaka, Nakahara-ku
Kawasaki-shi, Kanagawa 211 / JP
Inventor(s)01 / Kuroda, Shigeru
4-5-9-903, Sagamioono
Sagamihara-shi Kanagawa 228 / JP
02 / Mimura, Takashi
1-10-42, Higashitamagawagakuen
Machida-shi Tokyo 194 / JP
03 / Notomi, Seishi
67-2, Shimotsuruma
Yamato-shi Kanagawa, 242 / JP
[1988/38]
Representative(s)Billington, Lawrence Emlyn, et al
Haseltine Lake LLP Lincoln House, 5th Floor 300 High Holborn
London WC1V 7JH / GB
[N/P]
Former [1988/38]Billington, Lawrence Emlyn, et al
HASELTINE LAKE & CO Hazlitt House 28 Southampton Buildings Chancery Lane
London WC2A 1AT / GB
Application number, filing date88302314.517.03.1988
[1988/38]
Priority number, dateJP1987006109718.03.1987         Original published format: JP 6109787
[1988/38]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0283278
Date:21.09.1988
Language:EN
[1988/38]
Type: A3 Search report 
No.:EP0283278
Date:06.09.1989
Language:EN
[1989/36]
Type: B1 Patent specification 
No.:EP0283278
Date:23.06.1993
Language:EN
[1993/25]
Search report(s)(Supplementary) European search report - dispatched on:EP20.07.1989
ClassificationIPC:H01L29/54
[1988/38]
CPC:
H10D30/4755 (EP,US); H10D84/00 (KR); H10D62/85 (EP,KR,US);
H10D30/67 (KR); H10D64/62 (EP,US)
Designated contracting statesDE,   FR,   GB [1988/38]
TitleGerman:Zusammengesetzte Halbleiteranordnung mit nicht-legierten ohmschen Kontakten[1988/38]
English:Compound semiconductor device having nonalloyed ohmic contacts[1988/38]
French:Composé semi-conducteur à contacts ohmiques sans alliage[1988/38]
Examination procedure21.02.1990Examination requested  [1990/17]
27.12.1991Despatch of a communication from the examining division (Time limit: M06)
06.07.1992Reply to a communication from the examining division
03.11.1992Despatch of communication of intention to grant (Approval: Yes)
15.12.1992Communication of intention to grant the patent
11.03.1993Fee for grant paid
11.03.1993Fee for publishing/printing paid
Opposition(s)24.03.1994No opposition filed within time limit [1994/24]
Fees paidRenewal fee
12.03.1990Renewal fee patent year 03
12.03.1991Renewal fee patent year 04
10.03.1992Renewal fee patent year 05
11.03.1993Renewal fee patent year 06
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Documents cited:Search[Y]   ELECTRONIC LETTERS, vol. 20, no. 15, July 1984, pages 615-618, Stevenage, Herts, GB; H. DMBKES et al.: "Optimisation of modulation-doped heterostructures for TEGFET operation at room temperature"
 [Y]   IEEE ELECTRON DEVICE LETTERS, vol. EDL-8, no. 1, January 1987, pages 24-26, IEEE, New York, US; C.K. PENG et al.: "Microwave performance of InA1As/InGaAs/InP MODFET's" [Y]
 [A]   ELECTRONICS LETTERS, vol. 17, no. 6, 19th March 1981, pages 215-216, London, GB; T. ISHIBASHI: "InP MESFET with In0.53Ga0.47As/InP heterostructure contacts" [A]
Examination  Gallium Arsenide, Ed. Howles & Morgan, 1985, pp. 202-203, Publ. John Wiley & Sons.
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