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EP0293177
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EP About this file: EP0293177
| EP0293177 - Apparatus for measuring the thickness of a thin film [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 06.12.1991 Database last updated on 31.08.2024 | Most recent event Tooltip | 31.07.2009 | Change - representative | published on 02.09.2009 [2009/36] | Applicant(s) | For all designated states Kurashiki Boseki Kabushiki Kaisha 7-1, Hommachi Kurashiki-shi Okayama 710 / JP | [N/P] |
| Former [1988/48] | For all designated states Kurashiki Boseki Kabushiki Kaisha 7-1, Hommachi Kurashiki-shi Okayama 710 / JP | Inventor(s) | 01 /
Koashi, Katsue C-25, 2-7, Shinsenri Higashi-machi Toyanaka-shi Osaka-fu / JP | 02 /
Eguchi, Yosuke 3-12-14, Miyanokawara Takatsuki-shi Osaka-fu / JP | [1988/48] | Representative(s) | Calderbank, Thomas Roger, et al Mewburn Ellis LLP City Tower 40 Basinghall Street London EC2V 5DE / GB | [N/P] |
| Former [2009/36] | Calderbank, Thomas Roger, et al Mewburn Ellis LLP 33 Gutter Lane London EC2V 8AS / GB | ||
| Former [1988/48] | Calderbank, Thomas Roger, et al MEWBURN ELLIS York House 23 Kingsway London WC2B 6HP / GB | Application number, filing date | 88304718.5 | 25.05.1988 | [1988/48] | Priority number, date | JP19870128962 | 25.05.1987 Original published format: JP 12896287 | JP19880124155 | 20.05.1988 Original published format: JP 12415588 | [1988/48] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0293177 | Date: | 30.11.1988 | Language: | EN | [1988/48] | Type: | A3 Search report | No.: | EP0293177 | Date: | 28.11.1990 | Language: | EN | [1990/48] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 09.10.1990 | Classification | IPC: | G01B11/06 | [1988/48] | CPC: |
G01B11/06 (EP,US);
G01B11/0675 (EP,US)
| Designated contracting states | DE, GB [1988/48] | Title | German: | Vorrichtung zur Dickenmessung einer dünnen Schicht | [1988/48] | English: | Apparatus for measuring the thickness of a thin film | [1988/48] | French: | Appareil pour la mesure d'épaisseur d'une couche mince | [1988/48] | File destroyed: | 12.03.1999 | Examination procedure | 02.09.1991 | Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time [1992/04] | 29.11.1991 | Application deemed to be withdrawn, date of legal effect [1992/04] | Fees paid | Renewal fee | 28.05.1990 | Renewal fee patent year 03 | Penalty fee | Penalty fee Rule 85b EPC 1973 | 05.07.1991 | M01 Not yet paid | Additional fee for renewal fee | 31.05.1991 | 04 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US3016464 (BAILEY EDWIN M); | [A]US3319515 (FLOURNOY PHILIP A); | [A]US4660980 (TAKABAYASHI HITOSHI [JP], et al); | [A]US3551056 (BURLINGTON JOHN R FAY, et al); | [A]US4518998 (WARNER ANDREW [US]) |