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EP0313518
European procedure
Extract from the Register of European Patents
EP About this file: EP0313518
| EP0313518 - Method for electrooptical distance measurement [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 12.11.1994 Database last updated on 11.04.2026 | Most recent event Tooltip | 12.11.1994 | No opposition filed within time limit | published on 04.01.1995 [1995/01] | Applicant(s) | For all designated states Leica AG 9435 Heerbrugg / CH | [N/P] |
| Former [1994/01] | For all designated states Leica AG CH-9435 Heerbrugg / CH | ||
| Former [1991/12] | For all designated states Leica Aarau AG Schachenallee 25 CH-5000 Aarau / CH | ||
| Former [1989/17] | For all designated states KERN & CO. AG CH-5001 Aarau / CH | Inventor(s) | 01 /
Meier, Dietrich Leimenstrasse 682 CH-5015 Niedererlinsbach / CH | [1989/17] | Representative(s) | (deleted) | [1994/07] |
| Former [1994/01] | Stamer, Harald, Dipl.-Phys. c/o Leica Industrieverwaltung GmbH, Konzernstelle Patente + Marken, Postfach 20 20 D-35530 Wetzlar / DE | ||
| Former [1991/12] | (deleted) | ||
| Former [1989/17] | Seeger, Jan c/o Bucher-Guyer AG CH-8166 Niederweningen / CH | Application number, filing date | 88810712.5 | 19.10.1988 | [1989/17] | Priority number, date | CH19870004163 | 23.10.1987 Original published format: CH 416387 | [1989/17] | Filing language | DE | Procedural language | DE | Publication | Type: | A2 Application without search report | No.: | EP0313518 | Date: | 26.04.1989 | Language: | DE | [1989/17] | Type: | A3 Search report | No.: | EP0313518 | Date: | 04.04.1990 | Language: | DE | [1990/14] | Type: | B1 Patent specification | No.: | EP0313518 | Date: | 12.01.1994 | Language: | DE | [1994/02] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 13.02.1990 | Classification | IPC: | G01S17/08, G01S7/48, G01S17/32 | [1990/10] | CPC: |
G01S17/08 (EP,US);
G01S7/4812 (EP,US);
G01S7/499 (EP,US)
|
| Former IPC [1989/17] | G01S17/08, G01S7/48 | Designated contracting states | DE, FR, GB, IT, SE [1989/17] | Title | German: | Verfahren zur elektrooptischen Distanzmessung | [1989/17] | English: | Method for electrooptical distance measurement | [1989/17] | French: | Méthode de mesure électro-optique de distances | [1989/17] | Examination procedure | 05.11.1990 | Examination requested [1991/01] | 25.11.1992 | Despatch of a communication from the examining division (Time limit: M04) | 26.03.1993 | Reply to a communication from the examining division | 11.05.1993 | Despatch of communication of intention to grant (Approval: No) | 26.05.1993 | Despatch of communication of intention to grant (Approval: later approval) | 04.06.1993 | Communication of intention to grant the patent | 31.08.1993 | Fee for grant paid | 31.08.1993 | Fee for publishing/printing paid | Opposition(s) | 13.10.1994 | No opposition filed within time limit [1995/01] | Fees paid | Renewal fee | 17.09.1990 | Renewal fee patent year 03 | 16.09.1991 | Renewal fee patent year 04 | 16.09.1992 | Renewal fee patent year 05 | 11.09.1993 | Renewal fee patent year 06 | Penalty fee | Penalty fee Rule 85b EPC 1973 | 30.10.1990 | M01 Fee paid on 05.11.1990 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A] JP60238776 | [A] PATENT ABSTRACTS OF JAPAN, Band 10, Nr. 106 (P-449)[2163], 22. April 1986; & JP-A-60 238 776 (TOSHIBA K.K.) 27-11-1985 [A] |