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Extract from the Register of European Patents

EP About this file: EP0400178

EP0400178 - Semiconductor device with a passivation layer [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  03.06.1995
Database last updated on 13.09.2024
Most recent event   Tooltip03.06.1995No opposition filed within time limitpublished on 26.07.1995 [1995/30]
Applicant(s)For all designated states
SIEMENS AKTIENGESELLSCHAFT
Werner-von-Siemens-Str. 1
DE-80333 München / DE
[N/P]
Former [1990/49]For all designated states
SIEMENS AKTIENGESELLSCHAFT
Wittelsbacherplatz 2
D-80333 München / DE
Inventor(s)01 / Schmidt, Gerhard, Dr. Dipl.-Phys.
Karl-Bröger-Strasse 28
D-8550 Forchheim / DE
[1990/49]
Application number, filing date89109837.831.05.1989
[1990/49]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0400178
Date:05.12.1990
Language:DE
[1990/49]
Type: B1 Patent specification 
No.:EP0400178
Date:03.08.1994
Language:DE
[1994/31]
Search report(s)(Supplementary) European search report - dispatched on:EP21.02.1990
ClassificationIPC:H01L23/29
[1990/49]
CPC:
H01L23/298 (EP); H01L2924/0002 (EP)
C-Set:
H01L2924/0002, H01L2924/00 (EP)
Designated contracting statesCH,   DE,   LI,   SE [1990/49]
TitleGerman:Halbleiterbauelement mit Passivierungsschicht[1990/49]
English:Semiconductor device with a passivation layer[1990/49]
French:Dispositif semi-conducteur comprenant une couche de passivation[1990/49]
Examination procedure01.06.1990Loss of particular rights, legal effect: designated state(s)
13.08.1990Despatch of communication of loss of particular rights: designated state(s) AT, BE, ES, FR, GB, GR, IT, LU, NL
20.12.1990Examination requested  [1991/09]
28.12.1992Despatch of a communication from the examining division (Time limit: M04)
27.04.1993Reply to a communication from the examining division
10.11.1993Despatch of communication of intention to grant (Approval: Yes)
02.12.1993Communication of intention to grant the patent
16.02.1994Fee for grant paid
16.02.1994Fee for publishing/printing paid
Opposition(s)04.05.1995No opposition filed within time limit [1995/30]
Fees paidRenewal fee
20.12.1990Renewal fee patent year 03
21.05.1992Renewal fee patent year 04
19.05.1993Renewal fee patent year 05
19.05.1994Renewal fee patent year 06
Penalty fee
Penalty fee Rule 85a EPC 1973
14.06.1990AT   M01   Not yet paid
14.06.1990BE   M01   Not yet paid
14.06.1990ES   M01   Not yet paid
14.06.1990FR   M01   Not yet paid
14.06.1990GB   M01   Not yet paid
14.06.1990GR   M01   Not yet paid
14.06.1990IT   M01   Not yet paid
14.06.1990LU   M01   Not yet paid
14.06.1990NL   M01   Not yet paid
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Documents cited:Search[A]GB1566072  ;
 [A]EP0008406  ;
 [A]EP0019887  ;
 [A]EP0075892
 [A]  - IEEE TRANSACTIONS ON ELECTRON DEVICES, Band ED-26, Nr. 11, November 1979, Seiten 1728-1734, IEEE, New York, US; M.L. TARNG et al.: 'Passivation of p-n junction in crystalline silicon by amorphous silicon'
Examination   - APPLIED PHYSICS LETTERS 44(1984) June, no. 11, New York USA, pages 1092-1094: "High performance hydrogenated amorphous Si solar cells with graded boron-doped intrinsic layers prepared from disilane at high deposition rates", T. Matsushita et al.
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.