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EP0355378

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EP About this file: EP0355378

EP0355378 - Test clip for SMD circuits and its method of fabrication [Right-click to bookmark this link]
Former [1990/09]	Test clip for SMD circuits
	[1996/11]
Status	No opposition filed within time limit Status updated on 17.01.1997 Database last updated on 20.09.2024
Most recent event Tooltip	17.02.2006	Change - lapse in a contracting state Updated state(s): FR	published on 05.04.2006 [2006/14]
Applicant(s)	For all designated states AP PRODUCTS GMBH Postfach 1158 71089 Weil im Schönbuch / DE
	[N/P]
Former [1990/09]	For all designated states AP PRODUCTS GMBH Postfach 1158 D-71089 Weil im Schönbuch / DE
Inventor(s)	01 / Moll, Horst E. Ulmenweg 7 D-7039 Weil im Schönbuch / DE
	02 / Moll, Carsten Marderweg 27 D-7268 Gechingen / DE
	[1990/09]
Representative(s)	Thul, Stephan, et al Manitz, Finsterwald & Partner GbR Postfach 31 02 20 80102 München / DE
	[N/P]
Former [1995/35]	Thul, Stephan, et al MANITZ, FINSTERWALD & ROTERMUND Postfach 22 16 11 D-80506 München / DE
Former [1990/09]	Thul, Leo, Dipl.-Phys. Patentanwalt Hoffmannstrasse 26 D-70825 Korntal-Münchingen / DE
Application number, filing date	89112907.4	13.07.1989
	[1990/09]
Priority number, date	DE19883828148	19.08.1988 Original published format: DE 3828148
	[1990/09]
Filing language	DE
Procedural language	DE
Publication	Type:	A2 Application without search report
	No.:	EP0355378
	Date:	28.02.1990
	Language:	DE
	[1990/09]
	Type:	A3 Search report
	No.:	EP0355378
	Date:	20.03.1991
	Language:	DE
	[1991/12]
	Type:	B1 Patent specification
	No.:	EP0355378
	Date:	13.03.1996
	Language:	DE
	[1996/11]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	30.01.1991
Classification	IPC:	H01R11/24	[1990/09]
	CPC:	H01R11/24 (EP)
Designated contracting states	AT, BE, CH, DE, ES, FR, GB, GR, IT, LI, LU, NL, SE [1990/09]
Title	German:	Prüfstecker für Schaltungen in SMD-Technik und dessen Herstellungsverfahren.	[1996/11]
	English:	Test clip for SMD circuits and its method of fabrication	[1996/11]
	French:	Clip pour tester des circuits SMD et sa méthode de fabrication.	[1996/11]
	Former [1990/09]	Testclip für Schaltungen in SMD-Technik
	Former [1990/09]	Test clip for SMD circuits
	Former [1990/09]	Clip pour tester des circuits SMD
Examination procedure	03.05.1991	Examination requested [1991/27]
	16.06.1992	Despatch of a communication from the examining division (Time limit: M06)
	14.12.1992	Reply to a communication from the examining division
	04.05.1993	Despatch of a communication from the examining division (Time limit: M06)
	11.11.1993	Reply to a communication from the examining division
	27.05.1994	Despatch of a communication from the examining division (Time limit: M04)
	27.09.1994	Reply to a communication from the examining division
	05.12.1994	Despatch of communication of intention to grant (Approval: No)
	17.08.1995	Despatch of communication of intention to grant (Approval: later approval)
	22.08.1995	Communication of intention to grant the patent
	01.12.1995	Fee for grant paid
	01.12.1995	Fee for publishing/printing paid
Opposition(s)	14.12.1996	No opposition filed within time limit [1997/10]
Fees paid	Renewal fee
	30.07.1991	Renewal fee patent year 03
	17.06.1992	Renewal fee patent year 04
	12.07.1993	Renewal fee patent year 05
	22.06.1994	Renewal fee patent year 06
	12.07.1995	Renewal fee patent year 07
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition Tooltip	FR	13.03.1996
	GR	13.03.1996
	AT	13.07.1996
	GB	13.07.1996
	SE	14.07.1996
	ES	15.07.1996
	BE	31.07.1996
	CH	31.07.1996
	LI	31.07.1996
	LU	31.07.1996
	[2006/14]
Former [2004/37]	GR	13.03.1996
	AT	13.07.1996
	GB	13.07.1996
	SE	14.07.1996
	ES	15.07.1996
	BE	31.07.1996
	CH	31.07.1996
	LI	31.07.1996
	LU	31.07.1996
	FR	09.08.1996
Former [2000/04]	GR	13.03.1996
	AT	13.07.1996
	GB	13.07.1996
	SE	14.07.1996
	BE	31.07.1996
	CH	31.07.1996
	LI	31.07.1996
	LU	31.07.1996
	FR	09.08.1996
Former [1998/04]	AT	13.07.1996
	GB	13.07.1996
	SE	14.07.1996
	BE	31.07.1996
	CH	31.07.1996
	LI	31.07.1996
	FR	09.08.1996
Former [1998/02]	AT	13.07.1996
	GB	13.07.1996
	SE	14.07.1996
	BE	31.07.1996
	FR	09.08.1996
Former [1997/30]	GB	13.07.1996
	SE	14.07.1996
	BE	31.07.1996
	FR	09.08.1996
Former [1997/29]	SE	14.07.1996
	BE	31.07.1996
	FR	09.08.1996
Former [1997/18]	SE	14.07.1996
	FR	09.08.1996
Former [1997/12]	FR	09.08.1996
Documents cited:	Search	[A]US3506949 (VENALECK JOHN T, et al);
		[A]US4618208 (IGARASHI OSAMU [JP])

The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.

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