EP0359157 - Symmetric two-way device to measure lengths with an interferometer [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 13.10.1994 Database last updated on 31.08.2024 | Most recent event Tooltip | 30.11.2007 | Lapse of the patent in a contracting state Updated state(s): FR | published on 02.01.2008 [2008/01] | Applicant(s) | For all designated states Spindler & Hoyer GmbH & Co. Königsallee 23 D-37081 Göttingen / DE | [1990/12] | Inventor(s) | 01 /
Meiser, Hans-Peter, Dipl.-Phys. Untere Karspüle 12a D-3400 Göttingen / DE | 02 /
Ohlenbusch, Jens, Dipl.-Phys. Jüdenstrasse 13 D-3400 Göttingen / DE | [1990/12] | Representative(s) | Rehberg, Elmar Rehberg Hüppe + Partner Postfach 31 62 37021 Göttingen / DE | [N/P] |
Former [1990/12] | Rehberg, Elmar, Dipl.-Ing. Patentanwalt Postfach 31 62 D-37021 Göttingen / DE | Application number, filing date | 89116716.5 | 09.09.1989 | [1990/12] | Priority number, date | DE19883830962 | 12.09.1988 Original published format: DE 3830962 | [1990/12] | Filing language | DE | Procedural language | DE | Publication | Type: | A2 Application without search report | No.: | EP0359157 | Date: | 21.03.1990 | Language: | DE | [1990/12] | Type: | A3 Search report | No.: | EP0359157 | Date: | 09.01.1991 | Language: | DE | [1991/02] | Type: | B1 Patent specification | No.: | EP0359157 | Date: | 08.12.1993 | Language: | DE | [1993/49] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 22.11.1990 | Classification | IPC: | G01B9/02 | [1990/12] | CPC: |
G01B9/02027 (EP);
G01B2290/70 (EP)
| Designated contracting states | AT, BE, CH, DE, ES, FR, GB, GR, IT, LI, LU, NL, SE [1990/12] | Title | German: | Symmetrische zweiarmige Einrichtung zum Messen von Längen mit einem Interferometer | [1990/12] | English: | Symmetric two-way device to measure lengths with an interferometer | [1990/12] | French: | Dispositif interférométrique symétrique à deux voies pour la mesure de longueurs | [1990/12] | Examination procedure | 19.12.1990 | Examination requested [1991/09] | 30.01.1992 | Despatch of a communication from the examining division (Time limit: M06) | 10.06.1992 | Reply to a communication from the examining division | 10.07.1992 | Despatch of a communication from the examining division (Time limit: M04) | 09.11.1992 | Reply to a communication from the examining division | 24.11.1992 | Despatch of a communication from the examining division (Time limit: M02) | 27.11.1992 | Reply to a communication from the examining division | 23.12.1992 | Despatch of communication of intention to grant (Approval: No) | 08.03.1993 | Despatch of communication of intention to grant (Approval: later approval) | 15.03.1993 | Communication of intention to grant the patent | 20.04.1993 | Fee for grant paid | 20.04.1993 | Fee for publishing/printing paid | Opposition(s) | 09.09.1994 | No opposition filed within time limit [1994/48] | Fees paid | Renewal fee | 24.07.1991 | Renewal fee patent year 03 | 22.07.1992 | Renewal fee patent year 04 | 16.09.1993 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | BE | 08.12.1993 | ES | 08.12.1993 | FR | 08.12.1993 | GR | 08.12.1993 | IT | 08.12.1993 | NL | 08.12.1993 | SE | 08.12.1993 | [2006/14] |
Former [2002/24] | BE | 08.12.1993 | |
ES | 08.12.1993 | ||
GR | 08.12.1993 | ||
IT | 08.12.1993 | ||
NL | 08.12.1993 | ||
SE | 08.12.1993 | ||
FR | 29.04.1994 | ||
Former [2000/04] | BE | 08.12.1993 | |
GR | 08.12.1993 | ||
IT | 08.12.1993 | ||
NL | 08.12.1993 | ||
SE | 08.12.1993 | ||
FR | 29.04.1994 | ||
Former [1999/42] | BE | 08.12.1993 | |
IT | 08.12.1993 | ||
NL | 08.12.1993 | ||
SE | 08.12.1993 | ||
FR | 29.04.1994 | ||
Former [1996/14] | BE | 08.12.1993 | |
NL | 08.12.1993 | ||
SE | 08.12.1993 | ||
FR | 29.04.1994 | ||
Former [1995/44] | BE | 08.12.1993 | |
NL | 08.12.1993 | ||
SE | 08.12.1993 | ||
FR | 29.04.1994 | ||
Former [1995/03] | BE | 08.12.1993 | |
NL | 08.12.1993 | ||
SE | 08.12.1993 | ||
FR | 29.04.1994 | ||
Former [1994/48] | BE | 08.12.1993 | |
NL | 08.12.1993 | ||
SE | 08.12.1993 | ||
Former [1994/43] | NL | 08.12.1993 | |
SE | 08.12.1993 | ||
Former [1994/39] | NL | 08.12.1993 | Documents cited: | Search | [YD]DE3124357 (DAIMLER BENZ AG [DE]); | [X]EP0249564 (ZYGO CORP [US]) | [Y] - JOURNAL OF PHYSICS E/SCIENTIFIC INSTRUMENTS, Band 20, Nr. 7, Juli 1987, Seiten 887-891, IOP Publishing Ltd, Bristol, GB; MASAHIRO OKAJI et al.: "A high-temperature dilatometer using optical heterodyne interferometry" | Examination | EP0281385 |