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Extract from the Register of European Patents

EP About this file: EP0359157

EP0359157 - Symmetric two-way device to measure lengths with an interferometer [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  13.10.1994
Database last updated on 31.08.2024
Most recent event   Tooltip30.11.2007Lapse of the patent in a contracting state
Updated state(s): FR
published on 02.01.2008  [2008/01]
Applicant(s)For all designated states
Spindler & Hoyer GmbH & Co.
Königsallee 23
D-37081 Göttingen / DE
[1990/12]
Inventor(s)01 / Meiser, Hans-Peter, Dipl.-Phys.
Untere Karspüle 12a
D-3400 Göttingen / DE
02 / Ohlenbusch, Jens, Dipl.-Phys.
Jüdenstrasse 13
D-3400 Göttingen / DE
[1990/12]
Representative(s)Rehberg, Elmar
Rehberg Hüppe + Partner Postfach 31 62
37021 Göttingen / DE
[N/P]
Former [1990/12]Rehberg, Elmar, Dipl.-Ing.
Patentanwalt Postfach 31 62
D-37021 Göttingen / DE
Application number, filing date89116716.509.09.1989
[1990/12]
Priority number, dateDE1988383096212.09.1988         Original published format: DE 3830962
[1990/12]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP0359157
Date:21.03.1990
Language:DE
[1990/12]
Type: A3 Search report 
No.:EP0359157
Date:09.01.1991
Language:DE
[1991/02]
Type: B1 Patent specification 
No.:EP0359157
Date:08.12.1993
Language:DE
[1993/49]
Search report(s)(Supplementary) European search report - dispatched on:EP22.11.1990
ClassificationIPC:G01B9/02
[1990/12]
CPC:
G01B9/02027 (EP); G01B2290/70 (EP)
Designated contracting statesAT,   BE,   CH,   DE,   ES,   FR,   GB,   GR,   IT,   LI,   LU,   NL,   SE [1990/12]
TitleGerman:Symmetrische zweiarmige Einrichtung zum Messen von Längen mit einem Interferometer[1990/12]
English:Symmetric two-way device to measure lengths with an interferometer[1990/12]
French:Dispositif interférométrique symétrique à deux voies pour la mesure de longueurs[1990/12]
Examination procedure19.12.1990Examination requested  [1991/09]
30.01.1992Despatch of a communication from the examining division (Time limit: M06)
10.06.1992Reply to a communication from the examining division
10.07.1992Despatch of a communication from the examining division (Time limit: M04)
09.11.1992Reply to a communication from the examining division
24.11.1992Despatch of a communication from the examining division (Time limit: M02)
27.11.1992Reply to a communication from the examining division
23.12.1992Despatch of communication of intention to grant (Approval: No)
08.03.1993Despatch of communication of intention to grant (Approval: later approval)
15.03.1993Communication of intention to grant the patent
20.04.1993Fee for grant paid
20.04.1993Fee for publishing/printing paid
Opposition(s)09.09.1994No opposition filed within time limit [1994/48]
Fees paidRenewal fee
24.07.1991Renewal fee patent year 03
22.07.1992Renewal fee patent year 04
16.09.1993Renewal fee patent year 05
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Lapses during opposition  TooltipBE08.12.1993
ES08.12.1993
FR08.12.1993
GR08.12.1993
IT08.12.1993
NL08.12.1993
SE08.12.1993
[2006/14]
Former [2002/24]BE08.12.1993
ES08.12.1993
GR08.12.1993
IT08.12.1993
NL08.12.1993
SE08.12.1993
FR29.04.1994
Former [2000/04]BE08.12.1993
GR08.12.1993
IT08.12.1993
NL08.12.1993
SE08.12.1993
FR29.04.1994
Former [1999/42]BE08.12.1993
IT08.12.1993
NL08.12.1993
SE08.12.1993
FR29.04.1994
Former [1996/14]BE08.12.1993
NL08.12.1993
SE08.12.1993
FR29.04.1994
Former [1995/44]BE08.12.1993
NL08.12.1993
SE08.12.1993
FR29.04.1994
Former [1995/03]BE08.12.1993
NL08.12.1993
SE08.12.1993
FR29.04.1994
Former [1994/48]BE08.12.1993
NL08.12.1993
SE08.12.1993
Former [1994/43]NL08.12.1993
SE08.12.1993
Former [1994/39]NL08.12.1993
Documents cited:Search[YD]DE3124357  (DAIMLER BENZ AG [DE]);
 [X]EP0249564  (ZYGO CORP [US])
 [Y]  - JOURNAL OF PHYSICS E/SCIENTIFIC INSTRUMENTS, Band 20, Nr. 7, Juli 1987, Seiten 887-891, IOP Publishing Ltd, Bristol, GB; MASAHIRO OKAJI et al.: "A high-temperature dilatometer using optical heterodyne interferometry"
ExaminationEP0281385
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.