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Extract from the Register of European Patents

EP About this file: EP0377084

EP0377084 - Field effect transistor on an insulator and method of manufacturing same [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  24.04.1995
Database last updated on 03.09.2024
Most recent event   Tooltip24.04.1995No opposition filed within time limitpublished on 14.06.1995 [1995/24]
Applicant(s)For all designated states
Kabushiki Kaisha Toshiba
72, Horikawa-cho, Saiwai-ku Kawasaki-shi
Kanagawa-ken 210-8572 / JP
[N/P]
Former [1990/28]For all designated states
KABUSHIKI KAISHA TOSHIBA
72, Horikawa-cho, Saiwai-ku
Kawasaki-shi, Kanagawa-ken 210, Tokyo / JP
Inventor(s)01 / Takahashi, Minoru
Toshibaisogo-dairyo 2-9-3 Shiomidai
Isogo-ku Yokohama-shi Kanagawa-ken / JP
02 / Yoshimi, Makoto
1-24-1 Shinmachi
Setagaya-ku Tokyo / JP
03 / Shigyo, Naoyuki
Haitsushibamoto B-203 4-18-5 Seya Seya-ku
Yokohama-shi Kanagawa-ken / JP
[1990/28]
Representative(s)Lehn, Werner, et al
Hoffmann Eitle, Patent- und Rechtsanwälte, Postfach 81 04 20
81904 München / DE
[N/P]
Former [1990/28]Lehn, Werner, Dipl.-Ing., et al
Hoffmann, Eitle & Partner, Patentanwälte, Postfach 81 04 20
D-81904 München / DE
Application number, filing date89118307.103.10.1989
[1990/28]
Priority number, dateJP1988024938203.10.1988         Original published format: JP 24938288
JP1989003440614.02.1989         Original published format: JP 3440689
JP1989010031021.04.1989         Original published format: JP 10031089
[1990/28]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0377084
Date:11.07.1990
Language:EN
[1990/28]
Type: B1 Patent specification 
No.:EP0377084
Date:22.06.1994
Language:EN
[1994/25]
Search report(s)(Supplementary) European search report - dispatched on:EP22.05.1990
ClassificationIPC:H01L29/784, H01L29/10, H01L21/84
[1990/28]
CPC:
H01L29/66772 (EP); H01L29/78696 (EP)
Designated contracting statesDE,   FR [1990/28]
TitleGerman:Feldeffekttransistor auf einem Isolator und Verfahren zu seiner Herstellung[1990/28]
English:Field effect transistor on an insulator and method of manufacturing same[1990/28]
French:Transistor à effet de champ sur isolant et sa méthode de fabrication[1990/28]
Examination procedure03.10.1989Examination requested  [1990/28]
08.07.1992Despatch of a communication from the examining division (Time limit: M06)
11.01.1993Reply to a communication from the examining division
26.01.1993Despatch of a communication from the examining division (Time limit: M02)
26.03.1993Reply to a communication from the examining division
06.08.1993Despatch of communication of intention to grant (Approval: Yes)
22.12.1993Communication of intention to grant the patent
18.03.1994Fee for grant paid
18.03.1994Fee for publishing/printing paid
Opposition(s)23.03.1995No opposition filed within time limit [1995/24]
Fees paidRenewal fee
10.10.1991Renewal fee patent year 03
09.10.1992Renewal fee patent year 04
11.10.1993Renewal fee patent year 05
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Documents cited:Search[X]EP0129037  ;
 [Y]GB2118365
 [X]  - JAPANESE JOURNAL OF APPLIED PHYSICS; SUPPLEMENTS, 20th - 22nd August 1986, pages 81-84, Tokyo, JP; T. UEDA et al.: "Electrical characteristics of submicron poly si MOSFET"
 [X]  - I.E.E.E. ELECTRON DEVICE LETTERS, vol. EDL-7, no. 4, April 1986, pages 244-246, IEEE, New York, NY, US; J.-P. COLINGE: "Subthreshold slope of thin-film SOI MOSFET's"
 [X]  - I.E.E.E. TRANSACTIONS ON ELECTRON DEVICES, vol. ED-34, no. 10, October 1987, pages 2173-2177, IEEE, New York, NY, US; J.-P. COLINGE: "Hot-electron effects in silicon-on-insulator n-channel MOSFET's"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.