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Extract from the Register of European Patents

EP About this file: EP0450125

EP0450125 - Process of making microcrystalline cubic boron nitride coatings [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  26.08.1995
Database last updated on 20.09.2024
Most recent event   Tooltip26.08.1995No opposition filed within time limitpublished on 18.10.1995 [1995/42]
Applicant(s)For all designated states
SIEMENS AKTIENGESELLSCHAFT
Werner-von-Siemens-Str. 1
DE-80333 München / DE
[N/P]
Former [1991/41]For all designated states
SIEMENS AKTIENGESELLSCHAFT
Wittelsbacherplatz 2
D-80333 München / DE
Inventor(s)01 / Treichel, Helmut
Weldishoferstrasse 4
D-8900 Augsburg / DE
02 / Spindler, Oswald
Lortzingstrasse 16
D-8011 Vaterstetten / DE
03 / Braun, Rainer
Groschenweg 52
D-8000 München 82 / DE
04 / Neureither, Bernhard
Weidenerstrasse 5
D-8000 München 83 / DE
05 / Kruck, Thomas
Am Wachberg 9
D-5042 Erftstadt 18 / DE
[1991/41]
Application number, filing date90106584.706.04.1990
[1991/41]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0450125
Date:09.10.1991
Language:DE
[1991/41]
Type: B1 Patent specification 
No.:EP0450125
Date:26.10.1994
Language:DE
[1994/43]
Search report(s)(Supplementary) European search report - dispatched on:EP12.11.1990
ClassificationIPC:C23C16/34
[1991/41]
CPC:
C23C16/342 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT,   NL [1994/43]
Former [1991/41]AT,  BE,  CH,  DE,  DK,  ES,  FR,  GB,  GR,  IT,  LI,  LU,  NL,  SE 
TitleGerman:Verfahren zur Herstellung von mikrokristallin kubischen Bornitridschichten[1991/41]
English:Process of making microcrystalline cubic boron nitride coatings[1991/41]
French:Procédé de fabrication de couches en nitrure de bore cubique microcristallin[1991/41]
Examination procedure20.12.1990Examination requested  [1991/41]
23.07.1991Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, DK, ES, GR, LU, SE
23.09.1991Loss of particular rights, legal effect: designated state(s)
01.03.1993Despatch of a communication from the examining division (Time limit: M06)
14.10.1993Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
22.12.1993Reply to a communication from the examining division
15.02.1994Despatch of communication of intention to grant (Approval: Yes)
29.03.1994Communication of intention to grant the patent
20.06.1994Fee for grant paid
20.06.1994Fee for publishing/printing paid
Opposition(s)27.07.1995No opposition filed within time limit [1995/42]
Request for further processing for:22.12.1993Request for further processing filed
22.12.1993Full payment received (date of receipt of payment)
Request granted
18.01.1994Decision despatched
Fees paidRenewal fee
23.04.1992Renewal fee patent year 03
22.04.1993Renewal fee patent year 04
19.04.1994Renewal fee patent year 05
Penalty fee
Penalty fee Rule 85a EPC 1973
23.05.1991AT   M01   Not yet paid
23.05.1991BE   M01   Not yet paid
23.05.1991CH   M01   Not yet paid
23.05.1991DK   M01   Not yet paid
23.05.1991ES   M01   Not yet paid
23.05.1991GR   M01   Not yet paid
23.05.1991LU   M01   Not yet paid
23.05.1991SE   M01   Not yet paid
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Documents cited:Search[X]JP61153279  ;
 [X]JP01116078  ;
 [A]JP61149478  ;
 [A]US4440108  (LITTLE ROGER G [US], et al)
 [X]  - JOURNAL OF THE ELECTROCHEMICAL SOCIETY, Band 129, Nr. 11, November 1982, Seite 2636, Manchester, US; (W. SCHMOLLA et al.): "Low temperature double-plasma process for BN films on semiconductors"
 [X]  - PATENT ABSTRACTS OF JAPAN, Band 10, Nr. 355, 29. November 1986; & JP-A-61 153 279 (TOSHIBA TUNGALOY CO., LTD) 11-07-1986, & JP61153279 A 00000000
 [X]  - PATENT ABSTRACTS OF JAPAN, Band 13, Nr. 339 (C-624)[3687], 31. Juli 1989; & JP-A-01 116 078 (SHIN ETSU CHEM. CO., LTD) 09-05-1989, & JP01116078 A 00000000
 [X]  - JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Band 3, Nr. 6, November-Dezember 1985, Seiten 2141-2146, New York, US; (W. HALVERSON et al.): "Effects of charge neutralization on ion-beam-deposited boron nitride films"
 [XD]  - SOLID-STATE ELECTRONICS, Band 26, Nr. 931, 1983, Seiten 931-939, GB; (W. SCHMOLLA et al.): "Amorphous BN films produced in a double-plasma reactor for semiconductor applications"
 [A]  - PATENT ABSTRACTS OF JAPAN, Band 10, Nr. 350, 25. Dezember 1984; & JP-A-61 149 478 (FURUKAWA MINING CO., LTD) 08-07-1986, & JP61149478 A 00000000
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.