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Extract from the Register of European Patents

EP About this file: EP0413982

EP0413982 - Impurity doping method with adsorbed diffusion source [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  20.03.1998
Database last updated on 03.09.2024
Most recent event   Tooltip20.03.1998No opposition filed within time limitpublished on 06.05.1998 [1998/19]
Applicant(s)For all designated states
NISHIZAWA, Junichi
6-16, Komegabukuro 1-chome Sendai-shi
Miyagi / JP
For all designated states
Seiko Instruments Inc.
31-1, Kameido 6-chome Koto-ku
Tokyo 136 / JP
[N/P]
Former [1991/09]For all designated states
Nishizawa, Junichi
6-16, Komegabukuro 1-chome
Sendai-shi Miyagi / JP
For all designated states
SEIKO INSTRUMENTS INC.
31-1, Kameido 6-chome Koto-ku
Tokyo 136 / JP
Inventor(s)01 / Nishizawa, Junichi
6-16 Komegabukuro 1-chome
Sendai-Shi, Miyagi, Tokyo / JP
02 / Aoki, Kenji, C/o Seiko Instruments Inc.
31-1 kameido 6-chome
Koto-ku, Tokyo / JP
[1991/09]
Representative(s)Fleuchaus, Leo, et al
Fleuchaus & Gallo Melchiorstrasse 42
81479 München / DE
[N/P]
Former [1991/09]Fleuchaus, Leo, Dipl.-Ing., et al
Melchiorstrasse 42
D-81479 München / DE
Application number, filing date90114184.624.07.1990
[1991/09]
Priority number, dateJP1989019468627.07.1989         Original published format: JP 19468689
[1991/09]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0413982
Date:27.02.1991
Language:EN
[1991/09]
Type: B1 Patent specification 
No.:EP0413982
Date:14.05.1997
Language:EN
[1997/20]
Search report(s)(Supplementary) European search report - dispatched on:EP09.10.1990
ClassificationIPC:H01L21/225, H01L21/223
[1991/09]
CPC:
H01L21/2254 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT,   NL [1991/09]
TitleGerman:Dotierungsverfahren mittels einer adsorbierten Diffusionquelle[1991/09]
English:Impurity doping method with adsorbed diffusion source[1991/09]
French:Méthode de dopage à l'aide d'une source de diffusion adsorbée[1991/09]
Examination procedure29.05.1991Examination requested  [1991/31]
14.04.1993Despatch of a communication from the examining division (Time limit: M06)
12.10.1993Reply to a communication from the examining division
24.08.1994Despatch of a communication from the examining division (Time limit: M06)
03.03.1995Reply to a communication from the examining division
01.07.1996Despatch of communication of intention to grant (Approval: Yes)
06.11.1996Communication of intention to grant the patent
10.01.1997Fee for grant paid
10.01.1997Fee for publishing/printing paid
Opposition(s)17.02.1998No opposition filed within time limit [1998/19]
Fees paidRenewal fee
23.07.1992Renewal fee patent year 03
27.07.1993Renewal fee patent year 04
01.08.1994Renewal fee patent year 05
11.07.1995Renewal fee patent year 06
11.07.1996Renewal fee patent year 07
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Documents cited:Search[X]JP63166220  ;
 [X]EP0322921  (FUJITSU LTD [JP]);
 [X]US4791074  (TSUNASHIMA YOSHITAKA [JP], et al);
 [AD]EP0259777  (JAPAN RES DEV CORP [JP], et al)
 [X]  - NIKKEI HIGH TECH REPORT, vol. 4, no. 7, 13th February 1989, page 10, Tokyo, JP; T. ITO: "UV epitaxy applied to make transistor"
 [X]  - PATENT ABSTRACTS OF JAPAN, vol. 12, no. 430 (E-682)[3277], 14th November 1988; & JP-A-63 166 220 (TOSHIBA CORP.) 09-07-1988, & JP63166220 A 00000000
 [A]  - JOURNAL OF APPLIED PHYSICS, vol. 59, no. 12, June 1986, pages 4032-4037, American Institute of Physics, Woodbury, New York, US; M.L. YU et al.: "Doping reaction of PH3 and B2H6 with Si(100)"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.