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EP0410464
European procedure
Extract from the Register of European Patents
EP About this file: EP0410464
| EP0410464 - Semiconductor memory device having diagnostic circuit for memory cells [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 29.07.1995 Database last updated on 02.11.2024 | Most recent event Tooltip | 29.07.1995 | No opposition filed within time limit | published on 20.09.1995 [1995/38] | Applicant(s) | For all designated states NEC Corporation 7-1, Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | [N/P] |
| Former [1991/05] | For all designated states NEC CORPORATION 7-1, Shiba 5-chome Minato-ku Tokyo / JP | Inventor(s) | 01 /
Sugibayashi, Tadahiko, C/o NEC Corporation 7-1 Shiba 5-chome, Minato-ku Tokyo / JP | [1991/05] | Representative(s) | Glawe, Delfs, Moll Partnerschaft mbB von Patent- und Rechtsanwälten Postfach 26 01 62 80058 München / DE | [N/P] |
| Former [1991/05] | Glawe, Delfs, Moll & Partner Patentanwälte Postfach 26 01 62 D-80058 München / DE | Application number, filing date | 90114389.1 | 26.07.1990 | [1991/05] | Priority number, date | JP19890195458 | 27.07.1989 Original published format: JP 19545889 | [1991/05] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0410464 | Date: | 30.01.1991 | Language: | EN | [1991/05] | Type: | A3 Search report | No.: | EP0410464 | Date: | 02.01.1992 | Language: | EN | [1992/01] | Type: | B1 Patent specification | No.: | EP0410464 | Date: | 28.09.1994 | Language: | EN | [1994/39] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 12.11.1991 | Classification | IPC: | G11C29/00, G11C11/409, G01R19/165 | [1994/39] | CPC: |
G11C29/34 (EP);
G11C29/50 (EP);
G11C11/401 (EP);
G11C2029/5004 (EP)
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| Former IPC [1991/05] | G11C29/00 | Designated contracting states | DE, FR, GB [1991/05] | Title | German: | Halbleiterspeichergerät mit Diagnoseschaltung für Speicherzellen | [1991/05] | English: | Semiconductor memory device having diagnostic circuit for memory cells | [1991/05] | French: | Dispositif de mémoire à semiconducteur comportant un circuit de diagnostic pour cellules de mémoire | [1991/05] | Examination procedure | 26.07.1990 | Examination requested [1991/05] | 07.01.1994 | Despatch of communication of intention to grant (Approval: Yes) | 25.02.1994 | Communication of intention to grant the patent | 27.05.1994 | Fee for grant paid | 27.05.1994 | Fee for publishing/printing paid | Opposition(s) | 29.06.1995 | No opposition filed within time limit [1995/38] | Fees paid | Renewal fee | 20.07.1992 | Renewal fee patent year 03 | 16.07.1993 | Renewal fee patent year 04 | 20.07.1994 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4393475 | [A] - JEE JOURNAL OF ELECTRONIC ENGINEERING vol. 26, no. 268, April 1989, TOKYO, JAPAN pages 71 - 74; TOSHIO TAKESHIMA ET AL: 'A 55nsec 16Mbit DRAM DEVELPOED BY NEC HAS A BUILT IN SELF-TEST FUNCTION' | [A] - IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT vol. 38, no. 3, June 1989, NEW YORK, USA pages 773 - 778; M. JACOMINO ET AL.: 'FAULT DETECTION IN CMOS CIRCUITS BY CONSUMPTION MEASURENENT' | [A] - 1986 INTERNATIONAL TEST CONFERENCE PROCEEDINGS 8 August 1986, WASHINGTON, USA pages 140 - 144; G.G. FREEMAN ET AL.: 'TWO CMOS METASTABILITY SENSORS' | [A] - ICCD 88 3 October 1988, NEW YORK, USA pages 454 - 457; D.B.I. FELTHAM ET AL: 'CURRENT SENSING FOR BUILT-IN TESTING OF CMOS CIRCUITS' |