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EP0415440
European procedure
Extract from the Register of European Patents
EP About this file: EP0415440
| EP0415440 - Apparatus for measuring light output from semiconductor light emitting element [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 13.08.1994 Database last updated on 13.07.2024 | Most recent event Tooltip | 13.08.1994 | No opposition filed within time limit | published on 05.10.1994 [1994/40] | Applicant(s) | For all designated states Kabushiki Kaisha Toshiba 72, Horikawa-cho, Saiwai-ku Kawasaki-shi Kanagawa 212-8572 / JP | [N/P] |
| Former [1991/10] | For all designated states Kabushiki Kaisha Toshiba 72, Horikawa-cho Saiwai-ku Kawasaki-shi / JP | Inventor(s) | 01 /
Tanaka, Toshiaki, c/o Intellectual Property Div. Kabushiki Kaisha Toshiba, 1-1 Shibaura 1-chome Minato-ku, Tokyo 105 / JP | [1991/10] | Representative(s) | Lehn, Werner, et al Hoffmann Eitle, Patent- und Rechtsanwälte, Postfach 81 04 20 81904 München / DE | [N/P] |
| Former [1991/10] | Lehn, Werner, Dipl.-Ing., et al Hoffmann, Eitle & Partner, Patentanwälte, Postfach 81 04 20 D-81904 München / DE | Application number, filing date | 90116757.7 | 31.08.1990 | [1991/10] | Priority number, date | JP19890222957 | 31.08.1989 Original published format: JP 22295789 | [1991/10] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0415440 | Date: | 06.03.1991 | Language: | EN | [1991/10] | Type: | A3 Search report | No.: | EP0415440 | Date: | 18.09.1991 | Language: | EN | [1991/38] | Type: | B1 Patent specification | No.: | EP0415440 | Date: | 13.10.1993 | Language: | EN | [1993/41] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 30.07.1991 | Classification | IPC: | G01J1/42 | [1991/10] | CPC: |
G01J1/42 (EP,US);
G01J3/42 (KR);
G01J2001/4252 (EP,US);
G01J2001/446 (EP,US)
| Designated contracting states | DE, FR, GB [1991/10] | Title | German: | Gerät zum Messen der Lichtleistung eines lichtemittierenden Halbleiterelements | [1991/10] | English: | Apparatus for measuring light output from semiconductor light emitting element | [1991/10] | French: | Appareil pour mesurer le flux lumineux d'un élément semi-conducteur émittant de la lumière | [1991/10] | Examination procedure | 31.08.1990 | Examination requested [1991/10] | 11.12.1992 | Despatch of communication of intention to grant (Approval: Yes) | 26.03.1993 | Communication of intention to grant the patent | 23.06.1993 | Fee for grant paid | 23.06.1993 | Fee for publishing/printing paid | Opposition(s) | 14.07.1994 | No opposition filed within time limit [1994/40] | Fees paid | Renewal fee | 10.08.1992 | Renewal fee patent year 03 | 11.08.1993 | Renewal fee patent year 04 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]JP62278423 ; | [X]DD118942 ; | [A]DE3328899 (NUKEM GMBH [DE]) | [A] - PATENT ABSTRACTS OF JAPAN vol. 12, no. 163 (P-703)(3010), 18 May 1988; & JP - A - 62278423 (MITSUBISHI) 03.12.1987, & JP62278423 A 19880518 |