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EP0431368
European procedure
Extract from the Register of European Patents
EP About this file: EP0431368
| EP0431368 - System to reduce wave shift error in spectrophotometer caused by hot spots in the light source [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 01.06.1995 Database last updated on 12.07.2024 | Most recent event Tooltip | 07.08.2009 | Change - representative | published on 09.09.2009 [2009/37] | Applicant(s) | For all designated states NIRSYSTEMS INCORPORATED 2441 Linden Lane Silver Spring Maryland 20910 / US | [N/P] |
| Former [1991/24] | For all designated states NIRSYSTEMS INCORPORATED 2441 Linden Lane Silver Spring Maryland 20910 / US | Inventor(s) | 01 /
Honigs, David E. 7021 Mayfair Road Laurel, Maryland 20707 / US | [1991/24] | Representative(s) | Diehl & Partner Patentanwälte Königstrasse 28 22767 Hamburg / DE | [N/P] |
| Former [2009/37] | Diehl & Partner Patentanwälte Königstrasse 28 22767 Hamburg / DE | ||
| Former [1991/24] | DIEHL GLAESER HILTL & PARTNER Patentanwälte Königstrasse 28 D-22767 Hamburg / DE | Application number, filing date | 90121936.0 | 16.11.1990 | [1991/24] | Priority number, date | US19890446595 | 06.12.1989 Original published format: US 446595 | [1991/24] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0431368 | Date: | 12.06.1991 | Language: | EN | [1991/24] | Type: | A3 Search report | No.: | EP0431368 | Date: | 02.01.1992 | Language: | EN | [1992/01] | Type: | B1 Patent specification | No.: | EP0431368 | Date: | 27.07.1994 | Language: | EN | [1994/30] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 15.11.1991 | Classification | IPC: | G01J3/18 | [1991/24] | CPC: |
G01J3/02 (EP,US);
G01J3/0205 (EP,US)
| Designated contracting states | DE, FR, GB [1991/24] | Title | German: | System zur Reduktion des durch den Emissionsbereich der Lichtquelle bewirkten Wellenlängenfehlers bei Spektrometern | [1991/24] | English: | System to reduce wave shift error in spectrophotometer caused by hot spots in the light source | [1991/24] | French: | Système de reduction de l'erreur de déplacement de longueur d'ondes causé par superintensité lumineuse brusque de la source lumineuse | [1991/24] | Examination procedure | 04.06.1992 | Examination requested [1992/32] | 27.04.1993 | Despatch of a communication from the examining division (Time limit: M06) | 27.10.1993 | Reply to a communication from the examining division | 12.11.1993 | Despatch of a communication from the examining division (Time limit: M02) | 11.12.1993 | Reply to a communication from the examining division | 14.01.1994 | Despatch of communication of intention to grant (Approval: Yes) | 27.01.1994 | Communication of intention to grant the patent | 24.03.1994 | Fee for grant paid | 24.03.1994 | Fee for publishing/printing paid | Opposition(s) | 28.04.1995 | No opposition filed within time limit [1995/29] | Fees paid | Renewal fee | 30.10.1992 | Renewal fee patent year 03 | 02.11.1993 | Renewal fee patent year 04 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]DE2437310 (APPLIED RES LAB); | [A]US4696570 (JOLIOT A PIERRE [FR], et al); | [A]DE1018647 |