blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0435195

EP0435195 - Electron microscope [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  08.08.1995
Database last updated on 24.08.2024
Most recent event   Tooltip08.08.1995Application deemed to be withdrawnpublished on 27.09.1995 [1995/39]
Applicant(s)For all designated states
Hitachi, Ltd.
6, Kanda Surugadai 4-chome
Chiyoda-ku
Tokyo / JP
[N/P]
Former [1991/27]For all designated states
HITACHI, LTD.
6, Kanda Surugadai 4-chome
Chiyoda-ku, Tokyo 100 / JP
Inventor(s)01 / Kobayashi, Hiroyuki
2-35, Kamimito-1-chome
Mito-shi / JP
02 / Kanaya, Koichi
5-23, Jindaiji-3-chome
Mitaka-shi / JP
03 / Baba, Norio
17-20-202, Nakane-2-chome
Meguro-ku, Tokyo / JP
04 / Ogasawara, Mitsuo
Hitachi Wing 615 11-1, Aobacho
Katsuta-shi / JP
[1991/27]
Representative(s)Strehl Schübel-Hopf & Partner
Maximilianstrasse 54
80538 München / DE
[N/P]
Former [1991/27]Strehl Schübel-Hopf Groening & Partner
Maximilianstrasse 54
D-80538 München / DE
Application number, filing date90125100.921.12.1990
[1991/27]
Priority number, dateJP1989033275325.12.1989         Original published format: JP 33275389
[1991/27]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0435195
Date:03.07.1991
Language:EN
[1991/27]
Type: A3 Search report 
No.:EP0435195
Date:04.12.1991
Language:EN
[1991/49]
Search report(s)(Supplementary) European search report - dispatched on:EP14.10.1991
ClassificationIPC:H01J37/22, H01J37/26, H01J37/28, H01J37/153
[1991/49]
CPC:
H01J37/222 (EP,US); H01J37/28 (EP,US)
Former IPC [1991/27]H01J37/22, H01J37/26, H01J37/28
Designated contracting statesDE,   NL [1991/27]
TitleGerman:Elektronenmikroskop[1991/27]
English:Electron microscope[1991/27]
French:Microscope électronique[1991/27]
File destroyed:03.03.2001
Examination procedure21.12.1990Examination requested  [1991/27]
23.11.1994Despatch of a communication from the examining division (Time limit: M04)
04.04.1995Application deemed to be withdrawn, date of legal effect  [1995/39]
08.05.1995Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [1995/39]
Fees paidRenewal fee
21.12.1992Renewal fee patent year 03
23.12.1993Renewal fee patent year 04
Penalty fee
Additional fee for renewal fee
31.12.199405   M06   Not yet paid
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]JP61237354  ;
 [Y]GB2123582  (NAT RES DEV);
 [A]US4803358  (KATO MAKOTO [JP], et al);
 [A]EP0332140  (HITACHI LTD [JP], et al)
 [YD]  - SCANNING MICROSCOPY vol. 1, no. 4, 1987, CHICAGO IL 60666 USA pages 1507 - 1514; NORIO BABA ET AL: 'An algorithm for online digital image processing for assisting automatic & astigmatism correction in electron microscopy '
 [A]  - PATENT ABSTRACTS OF JAPAN vol. 11, no. 83 (E-489)(2530) March 13, 1987 & JP-A-61 237 354 (FUJI PHOTO FILM CO LTD. ) October 22, 1986, & JP61237354 A 00000000
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.