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Extract from the Register of European Patents

EP About this file: EP0407088

EP0407088 - Method of forming an amorphous semiconductor film [Right-click to bookmark this link]
Former [1991/02]Amorphous semiconductor film and process for its production
[1998/19]
StatusNo opposition filed within time limit
Status updated on  12.03.1999
Database last updated on 24.08.2024
Most recent event   Tooltip25.07.2008Change - representativepublished on 27.08.2008  [2008/35]
Applicant(s)For all designated states
Mitsui Chemicals, Inc.
2-5, Kasumigaseki 3-chome, Chiyoda-ku
Tokyo 100-6070 / JP
[N/P]
Former [1998/18]For all designated states
Mitsui Chemicals, Inc.
2-5, Kasumigaseki 3-chome, Chiyoda-ku
Tokyo 100-6070 / JP
Former [1992/23]For all designated states
MITSUI TOATSU CHEMICALS, Inc.
2-5 Kasumigaseki 3-chome
Chiyoda-Ku Tokyo 100 / JP
Former [1991/02]For all designated states
MITSUI TOATSU CHEMICALS, INCORPORATED
2-5, 3-chome, Kasumigaseki
Chiyoda-ku Tokyo / JP
Inventor(s)01 / Miyachi, Kenji
2882, Iijima-cho, Sakae-ku
Yokohama-shi, Kanagawa-ken / JP
02 / Fukuda, Nobuhiro
2882, Iijima-cho, Sakae-ku
Yokohama-shi, Kanagawa-ken / JP
03 / Ashida, Yoshinori
1541 Yabe-cho, Totsuka-ku
Yokohama-shi, Kanagawa-ken / JP
04 / Koyama, Masato
4-1-28 Hase
Kamakura-shi, Kanagawa-ken / JP
[1991/02]
Representative(s)Stuart, Ian Alexander, et al
Mewburn Ellis LLP
City Tower
40 Basinghall Street
London EC2V 5DE / GB
[N/P]
Former [2008/35]Stuart, Ian Alexander, et al
Mewburn Ellis LLP York House 23 Kingsway
London WC2B 6HP / GB
Former [1991/02]Stuart, Ian Alexander, et al
MEWBURN ELLIS York House 23 Kingsway
London WC2B 6HP / GB
Application number, filing date90307023.327.06.1990
[1991/02]
Priority number, dateJP1989016371028.06.1989         Original published format: JP 16371089
JP1989016540229.06.1989         Original published format: JP 16540289
JP1989016540329.06.1989         Original published format: JP 16540389
JP1989019925802.08.1989         Original published format: JP 19925889
JP1989019925902.08.1989         Original published format: JP 19925989
JP1989019926002.08.1989         Original published format: JP 19926089
JP1989020023403.08.1989         Original published format: JP 20023489
JP1990001180323.01.1990         Original published format: JP 1180390
[1991/02]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0407088
Date:09.01.1991
Language:EN
[1991/02]
Type: B1 Patent specification 
No.:EP0407088
Date:06.05.1998
Language:EN
[1998/19]
Search report(s)(Supplementary) European search report - dispatched on:EP26.09.1990
ClassificationIPC:H01L31/20, C23C16/22, C23C14/12
[1991/02]
CPC:
C23C14/0682 (EP,US); C23C14/58 (EP); C23C14/5826 (EP,US);
C23C14/5846 (EP); C23C16/56 (EP); H01L21/02381 (EP);
H01L21/0242 (EP); H01L21/02529 (EP); H01L21/02532 (EP);
H01L21/02535 (EP); H01L21/0262 (EP); H01L21/02631 (EP);
H01L21/3003 (EP); H01L31/202 (EP); H01L31/204 (EP);
Y02P70/50 (EP) (-)
Designated contracting statesDE,   FR [1998/16]
Former [1991/02]DE,  FR,  GB,  IT 
TitleGerman:Verfahren zur Herstellung einer amorphen Halbleiterschicht[1998/19]
English:Method of forming an amorphous semiconductor film[1998/19]
French:Méthode de production d'un film semiconducteur amorphe[1998/19]
Former [1991/02]Amorphe Halbleiterschicht und Verfahren zu deren Herstellung
Former [1991/02]Amorphous semiconductor film and process for its production
Former [1991/02]Film semiconducteur amorphe et sa méthode de production
Examination procedure28.12.1990Examination requested  [1991/10]
02.06.1993Despatch of a communication from the examining division (Time limit: M06)
13.12.1993Reply to a communication from the examining division
21.01.1994Despatch of a communication from the examining division (Time limit: M06)
29.07.1994Reply to a communication from the examining division
30.08.1994Despatch of a communication from the examining division (Time limit: M06)
09.03.1995Reply to a communication from the examining division
30.01.1997Despatch of a communication from the examining division (Time limit: M02)
13.02.1997Reply to a communication from the examining division
28.07.1997Despatch of communication of intention to grant (Approval: No)
01.10.1997Despatch of communication of intention to grant (Approval: later approval)
08.10.1997Communication of intention to grant the patent
30.12.1997Fee for grant paid
30.12.1997Fee for publishing/printing paid
Opposition(s)09.02.1999No opposition filed within time limit [1999/17]
Fees paidRenewal fee
23.06.1992Renewal fee patent year 03
23.06.1993Renewal fee patent year 04
22.06.1994Renewal fee patent year 05
02.05.1995Renewal fee patent year 06
21.06.1996Renewal fee patent year 07
23.06.1997Renewal fee patent year 08
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Documents cited:Search[AD]JP63014420  ;
 [A]DE3208086  (DEUTSCHE FORSCH LUFT RAUMFAHRT [DE])
 [Y]  - JOURNAL OF APPLIED PHYSICS vol. 65, no. 6, 15 March 1989, pages 2439 - 2444, New York, US; A. ASANO et al.: "Preparation of highly photoconductive hydrogenated amorphous silicon carbide films with a multiplasme-zone apparatus"
 [Y]  - THIN SOLID FILMS vol. 171, no. 1, 1 April 1989, pages 217 - 233, Lausanne, CH; M. PINARBASI et al.: "Hydrogenated amorphous silicon films deposited by reactive sputtering: The electronic properties hydrogen bonding and microstructure"
 [AD]  - PATENT ABSTRACTS OF JAPAN vol. 12, no.217 (E-624), 21 June 1988; & JP-A-63 014 420 (HITACHI) 21.01.1988, & JP63014420 A 19880621
 [A]  - SOLAR & WIND TECHNOLOGY vol. 6, no. 3, 1989, pages 241 - 246, Den Haag, NL; Y. HAMAKAWA: "Physics and Technologies of Efficiency Improvements for Amorphous Silicon Solar Cells"
 [A]  - THIN SOLID FILMS vol. 147, no. 2, 2 March 1987, pages 213 - 222, Lausanne, CH; K.P. CHICK et al.: "A comparative study of the properties of evaporated a-Si films before and after hydrogenation"
 [A]  - SOLAR CELLS vol. 24, nos. 3/4, August 1988, pages 249 - 256, Lausanne, CH; Y.S. TSUO et al.: "Ion-beam hydrogenation of amorphous silicon"
 [A]  - SOLAR ENERGY MATERIALS vol. 17, no. 4, June 1988, pages 237 - 245, Amsterdam, NL; G. GANGULY et al.: "A study of the optoelectronic and structural properties of glow-discharge-deposited amorphous silicon thin films"
 [A]  - PHYSICAL REVIEW, B. CONDENSED MATTER vol. 31, no. 8, 15 April 1985, pages 5311 - 5321, New York, US; M. JANAI et al.: "Properties of fluorinated glow-discharge amorphous silicon"
 [A]  - SOLAR CELLS vol. 24, nos. 3/4, August 1988, pages 237 - 248, Lausanne, CH; R.S. CRANDALL: "Fundamental studies of amorphous silicon materials at the solar energy research institute"
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.